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1. 发明授权

US11415529B2 X-ray phase imaging apparatus and X-ray phase contrast image generation method 有权
公开(公告)号：US11415529B2
公开(公告)日：2022-08-16
申请号：US16834694
申请日：2020-03-30
申请人： Shimadzu Corporation
发明人： Takahiro Doki , Kenji Kimura , Taro Shirai , Satoshi Sano , Akira Horiba , Naoki Morimoto
IPC分类号： G01N23/041 , G06T5/00
摘要： The X-ray phase imaging apparatus includes an imaging system, a position switching mechanism for switching between a retracted position and an imaging position, a control unit for controlling switching between the retracted position and the imaging position, and an image processing unit for generating an X-ray phase contrast image based on the first image and the second image. The control unit is configured to control sequentially imaging at the retracted position and imaging at the imaging position.

2. 发明授权

US11382574B2 Stationary in-vivo grating-enabled micro-CT architecture (sigma) 有权
公开(公告)号：US11382574B2
公开(公告)日：2022-07-12
申请号：US16761543
申请日：2018-11-06
申请人： RENSSELAER POLYTECHNIC INSTITUTE
发明人： Ge Wang , Wenxiang Cong , Qingsong Yang , Guang Li
IPC分类号： A61B6/03 , A61B6/00 , G01N23/041
摘要： A stationary in-vivo grating-enabled micro-CT (computed tomography) architecture (SIGMA) system includes CT scanner control circuitry and a number of imaging chains. Each imaging chain includes an x-ray source array, a phase grating, an analyzer grating and a detector array. Each imaging chain is stationary and each x-ray source array includes a plurality of x-ray source elements. Each imaging chain has a centerline, the centerlines of the number of imaging chains intersect at a center point and a first angle between the centerlines of a first adjacent pair of imaging chains equals a second angle between the centerlines of a second adjacent pair of imaging chains. A plurality of selected x-ray source elements of a first x-ray source array is configured to emit a plurality of x-ray beams in a multiplexing fashion.

3. 发明授权

US11311260B2 X-ray phase imaging apparatus 有权
公开(公告)号：US11311260B2
公开(公告)日：2022-04-26
申请号：US16834883
申请日：2020-03-30
申请人： Shimadzu Corporation
发明人： Satoshi Sano , Koichi Tanabe , Yukihisa Wada , Satoshi Tokuda , Akira Horiba , Naoki Morimoto
IPC分类号： A61B6/00 , G01N23/041 , A61B6/04 , G21K1/06
摘要： In this X-ray phase imaging apparatus, at least one of a plurality of gratings is composed of a plurality of grating portions arranged along a third direction perpendicular to a first direction along which a subject or an imaging system is moved by a moving mechanism and a second direction along which an X-ray source, a detection unit, and a plurality of grating portions are arranged. The plurality of grating portions are arranged such that adjacent grating portions overlap each other when viewed in the first direction.

4. 发明授权

US11231378B2 X-ray imaging reference scan 有权
公开(公告)号：US11231378B2
公开(公告)日：2022-01-25
申请号：US16650220
申请日：2018-09-21
申请人： KONINKLIJKE PHILIPS N.V.
发明人： Andriy Yaroshenko , Thomas Koehler , Peter Benjamin Theodor Nöel , Fabio De Marco , Lukas Benedict Gromann , Konstantin Willer
IPC分类号： G01N23/041 , A61B6/00
摘要： The present invention relates to acquiring reference scan data for X-ray phase-contrast imaging and/or X-ray dark-field imaging. Therefore an X-ray detector (26) is arranged opposite an X-ray source (12) across an examination region (30) with a grating arrangement (18) arranged between the X-ray source (12) and the X-ray detector (26). During an imaging operation without an object in the examination region (30) the grating arrangement (18) is moved in a scanning motion to a number of different positions (a) relative to the X-ray detector (26) whilst the X-ray detector (26) remains stationary relative to the examination region (30) such that in the scanning motion a series of fringe patterns is detected by the X-ray detector (26). The scanning motion is repeated for a different series of fringe patterns. This allows acquiring reference scan data required for calibration of an X-ray imaging device (10′″) with less scanning motions.

5. 发明授权

US11057536B2 System for analyzing a document and corresponding method 有权
公开(公告)号：US11057536B2
公开(公告)日：2021-07-06
申请号：US16793858
申请日：2020-02-18
申请人： Fraunhofer-Gesellschaft zur Foerderung der angewandten Forschung e.V.
发明人： Tobias Schoen , Wolfgang Holub , Daniel Stromer , Andreas Maier , Gisela Anton , Michel Thilo , Martin Vossiek , Jan Schuer
IPC分类号： H04N1/203 , G01N21/3586 , G01N23/083 , G01N23/041 , G01N23/046 , G01T1/17
摘要： The invention refers to a system for analyzing a document. Each of two measurement arrangements includes two components being a radiation source and a radiation detector, respectively. The two measurement arrangements provide measurement data and differ from each other with regard to a measurement principle, a kind of radiation source, a kind of radiation detector, a kind of relative movement between the document and a component, a kind of relative arrangement of the two components to each other, a kind of emitted radiation, a kind of received radiation or a kind of processing information about radiation emitted by the respective radiation source and/or about radiation received by the respective radiation detector. An evaluator provides data based on the measurement data. The invention also refers to a corresponding method.

6. 发明授权

US10859512B2 X-ray phase contrast imaging apparatus 有权
公开(公告)号：US10859512B2
公开(公告)日：2020-12-08
申请号：US16309820
申请日：2017-03-15
申请人： Shimadzu Corporation
发明人： Koichi Tanabe , Toshinori Yoshimuta , Kenji Kimura , Hiroyuki Kishihara , Yukihisa Wada , Takuro Izumi , Taro Shirai , Takahiro Doki , Satoshi Sano , Akira Horiba
IPC分类号： G01N23/041 , A61B6/00 , G01N23/046 , G01N23/044
摘要： Provided is a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject. According to the present invention, it is possible to provide a radiation imaging apparatus capable of performing precise imaging without performing pre-imaging in the absence of a subject immediately before. That is, the apparatus of the present invention is provided with a phase grating 5 provided with a subject area and a reference area. Both areas each have a predetermined pattern that absorbs radiation, but the patterns are different from each other. In this area, an image of the phase grating 5 is observed in a moire pattern of a long period. This moire image of a long period changes in the positions due to the minute change in the relative position between the phase grating 5 and the absorption grating 6, so it becomes possible to detect the minute change of the relative position between the radiation source, the phase grating 5, and the absorption grating 6 from the image of the reference area.

7. 发明授权

US10739280B2 Radiation phase contrast imaging apparatus 有权
公开(公告)号：US10739280B2
公开(公告)日：2020-08-11
申请号：US16115875
申请日：2018-08-29
申请人： Shimadzu Corporation
发明人： Takahiro Doki , Kenji Kimura , Taro Shirai , Satoshi Sano , Akira Horiba , Naoki Morimoto
IPC分类号： G01N23/041 , A61B6/00 , A61B6/04
摘要： The radiation phase contrast imaging apparatus includes an X-ray source, a first grating, a second grating arranged between the X-ray source and the first grating, and a moving mechanism for moving an object stage for holding an object. The moving mechanism is configured to more the object stage to an X-ray source side of the first grating and a second grating side of the first grating opposite to the source side of the first grating.

8. 发明授权

US10653376B2 X-ray imaging system 有权
公开(公告)号：US10653376B2
公开(公告)日：2020-05-19
申请号：US16402887
申请日：2019-05-03
申请人： Sigray, Inc.
发明人： Wenbing Yun , Sylvia Jia Yun Lewis , Janos Kirz , Alan Francis Lyon
IPC分类号： A61B6/00 , A61B6/03 , H01J35/08 , H01J35/12 , G01N23/046 , G01N23/041 , A61B6/04
摘要： An x-ray imaging system includes an x-ray source, a beam-splitting grating having a plurality of structures arranged in a two-dimensional periodic array, a stage configured to hold an object to be imaged, and an x-ray detector having a two-dimensional array of x-ray detecting elements and positioned to detect x-rays diffracted by the beam-splitting grating and perturbed by the object to be imaged.

9. 发明授权

US10598611B2 X-ray phase imaging apparatus and method of detecting defect of material containing fibers 有权
公开(公告)号：US10598611B2
公开(公告)日：2020-03-24
申请号：US16033739
申请日：2018-07-12
申请人： Shimadzu Corporation
发明人： Satoshi Sano , Taro Shirai , Takahiro Doki , Akira Horiba , Naoki Morimoto
IPC分类号： G01N23/041 , A61B6/00
摘要： This X-ray phase imaging apparatus is provided with a control unit that acquires information on a defect of a material based on a dark field image of the material.

10. 发明授权

US10559393B2 X-ray detector for phase contrast and/or dark-field imaging 有权
公开(公告)号：US10559393B2
公开(公告)日：2020-02-11
申请号：US15745234
申请日：2016-07-20
申请人： KONINKLIJKE PHILIPS N.V.
发明人： Roland Proksa
IPC分类号： G01T1/20 , G21K1/06 , A61B6/00 , G01N23/041 , G01T7/00
摘要： The present invention relates to X-ray imaging. In order to reduce X-ray dose exposure during X-ray image acquisition, an X-ray detector is provided that is suitable for phase contrast and/or dark-field imaging. The X-ray detector comprises a scintillator layer (12) and a photodiode layer (14). The scintillator layer is configured to convert incident X-ray radiation (16) modulated by a phase grating structure (18) into light to be detected by the photodiode layer. The scintillator layer comprises an array of scintillator channels (20) periodically arranged with a pitch (22) forming an analyzer grating structure. The scintillator layer and the photodiode layer form a first detector layer (24) comprising a matrix of pixels (26). Each pixel comprises an array of photodiodes (28), each photodiode forming a sub-pixel (30). Adjacent sub-pixels during operation receive signals having mutually shifted phases. The sub-pixels that during operation receive signals having mutually identical phase form a phase group per pixel. The signals received by the sub-pixels within the same phase group per pixel during operation are combined to provide one phase group signal (32). The phase group signals of different phase groups during operation are obtained in one image acquisition. In an example, the pitch of the scintillator channels is detuned by applying a correcting factor c to a fringe period (Pfringe) of a periodic interference pattern (35) created by the phase grating structure, wherein 0

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