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1. 发明申请

US20230122803A1 ON-CHIP OSCILLOSCOPE 有权
公开(公告)号：US20230122803A1
公开(公告)日：2023-04-20
申请号：US18069813
申请日：2022-12-21
申请人： TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD.
发明人： Chung-Peng HSIEH , Chih-Chiang CHANG , Chung-Chieh YANG
IPC分类号： G01R13/00 , G01R13/02 , G01R31/28
摘要： A device includes a control circuit, a scope circuit, a first logic gate and a second logic gate. The control circuit is configured to generate a first control signal according to a voltage signal and a delayed signal. The scope circuit is configured to generate a first current signal in response to the first control signal and the voltage signal. The first logic gate is configured to perform a first logical operation on the voltage signal and one of the voltage signal and the delayed signal to generate a second control signal. The second logical gate configured to perform a second logical operation on the second control signal and a test control signal to generate a second current signal.

2. 发明授权

US11624649B2 Display device and inertial measurement system 有权
公开(公告)号：US11624649B2
公开(公告)日：2023-04-11
申请号：US17238268
申请日：2021-04-23
申请人： Seiko Epson Corporation
发明人： Kenta Sato
IPC分类号： G01H11/06 , G01R13/02
摘要： An inertial measurement system includes three acceleration sensors detecting along three orthogonal axes, a display having several display areas, and a processor programed to perform a process. The processor calculates frequencies and spectral intensities of vibrations based on detected time series accelerations by three acceleration sensors and obtains relationship values between the calculated frequencies and the calculated spectral intensities. The processor causes the display to successively display an N-th value, intermediate values, and an (N+1)-th value of the relationship values at one display area in time series.

3. 发明授权

US11614468B2 Oscilloscope noise floor de-embedding for high speed toggle signal measurement 有权
公开(公告)号：US11614468B2
公开(公告)日：2023-03-28
申请号：US16912612
申请日：2020-06-25
申请人： Intel Corporation
发明人： Liwei Zhao , Andrew Martwick , Michael W. Altmann , Michael Mirmak , Kamel Ahmad , Andrew Holland
IPC分类号： G01R13/02
摘要： A scheme for noise floor de-embedding by identifying a link or relationship between noise floor from an oscilloscope and phase jitter impact on a toggling signal. The scheme uses phase or electrical spectrum and phase detection for noise floor recognition. The scheme de-embeds the impact from random noise and also removes deterministic noise or jitter from the oscilloscope. The scheme provides accurate jitter analysis for a circuit (e.g., clock data recovery circuit) after de-embedding noise floor for the oscilloscope.

4. 发明申请

US20230077447A1 TEST AND MEASUREMENT INSTRUMENT WITH REMOVABLE BATTERY PACK 有权
公开(公告)号：US20230077447A1
公开(公告)日：2023-03-16
申请号：US17944924
申请日：2022-09-14
申请人： Tektronix, Inc.
发明人： Chris A. Valentine , Prashanth Thota , Steve U. Reinhold , Jonathan D. Clem , Timothy Keil
IPC分类号： G01R13/02 , G01R31/3835
摘要： A test system includes a test and measurement instrument having one or more inputs for receiving one or more signals to be measured or tested, a display for outputting measurement results or test results, one or more processors for operating the instrument, a chassis housing the instrument, a power connection to receive power for powering the one or more processors from a wall connection. The test system further includes an external battery pack separate from the test and measurement instrument and structured to mechanically and electrically couple to and decouple from the test and measurement instrument, the external battery pack including a DC power source for powering the one or more processors. The test and measurement instrument includes no batteries or other power storage device for powering the one or more processors within the chassis of the instrument.

5. 发明申请

US20230047259A1 MEASUREMENT DEVICE AND MEASUREMENT METHOD 有权
公开(公告)号：US20230047259A1
公开(公告)日：2023-02-16
申请号：US17648893
申请日：2022-01-25
申请人： YOKOGAWA ELECTRIC CORPORATION , Yokogawa Test & Measurement Corporation
发明人： Etsuro Nakayama
IPC分类号： G01R13/02
摘要： A measurement device (10) includes a first processor (12a) that performs first pipeline processing on a first input signal according to a first sample timing, a second processor (12b) that performs second pipeline processing on a second input signal according to a second sample timing with a sampling period longer than the first sample timing, an adjustment unit that adjusts an output timing of the first input signal on which the first pipeline processing was performed to match an output timing of the second input signal on which the second pipeline processing was performed, and a creation unit (17) that sequentially creates a waveform of the first input signal on which the first pipeline processing was performed and for which the output timing was adjusted by the adjustment unit, and a waveform of the second input signal on which the second pipeline processing was performed.

6. 发明申请

US20220308090A1 TEST AND MEASUREMENT INSTRUMENT HAVING PROGRAMMABLE ACQUISITION HISTORY 有权
公开(公告)号：US20220308090A1
公开(公告)日：2022-09-29
申请号：US17701658
申请日：2022-03-22
申请人： Tektronix, Inc.
发明人： Gary J. Waldo
IPC分类号： G01R13/02
摘要： A test and measurement instrument includes an input configured to receive a signal for testing, an acquisition processor configured to generate an acquisition from the received signal and store the acquisition in an acquisition memory, and copy the acquisition to a data store, and an acquisition evaluator configured to compare the selected acquisition in the data store against one or more criteria, and identify whether the acquisition meets the one or more criteria. When the acquisition meets the one or more criteria, the acquisition may be stored in a secondary memory of the instrument as a curated or selected history of measurements, on which measurements or other analysis may be made.

7. 发明授权

US11372025B2 Systems and methods for synchronizing multiple test and measurement instruments 有权
公开(公告)号：US11372025B2
公开(公告)日：2022-06-28
申请号：US17317841
申请日：2021-05-11
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
IPC分类号： G01R13/02 , H03K5/00 , H03L7/08 , G01R31/319
摘要： A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.

8. 发明申请

US20210405091A1 TEST AND MEASUREMENT INSTRUMENT AND METHOD OF ANALYZING AN INPUT SIGNAL 有权
公开(公告)号：US20210405091A1
公开(公告)日：2021-12-30
申请号：US16915018
申请日：2020-06-29
申请人： Rohde & Schwarz GmbH & Co. KG
发明人： Thomas Guenther
IPC分类号： G01R13/02
摘要： The disclosure relates to a test and measurement instrument. The test and measurement instrument comprises a digitizer for digitizing an analog input signal, thereby generating a digitized input signal. The test and measurement instrument also has a digital trigger for detecting a trigger event in the digitized input signal. The test and measurement instrument also comprises an acquisition memory for acquiring the digitized input signal at least segmentally upon a first trigger event detected by the digital trigger. The acquisition memory is configured to acquire a first signal segment prior to the first trigger event. The acquisition memory is further configured to acquire a second signal segment starting at the first trigger event. The length of the second signal segment is dynamically adjustable. Moreover, a method of analyzing an input signal by a test and measurement instrument is described.

9. 发明申请

US20210333147A1 Display Device and Inertial Measurement System 有权
公开(公告)号：US20210333147A1
公开(公告)日：2021-10-28
申请号：US17238268
申请日：2021-04-23
申请人： Seiko Epson Corporation
发明人： Kenta SATO
IPC分类号： G01H11/06 , G01R13/02
摘要： A display device includes a display unit displaying a first two-dimensional display showing a frequency and a spectral intensity of a vibration at the frequency. In the first two-dimensional display, at least one measurement value of a first measurement value in a first direction, a second measurement value in a second direction orthogonal to the first direction, and a third measurement value in a third direction orthogonal to the first direction and the second direction, and a composite value of the first measurement value, the second measurement value, and the third measurement value, are displayed as superimposed on each other. As each of the at least one measurement value and the composite value, an N-th measurement value corresponding to an N-th time, an (N+1)th measurement value corresponding to an (N+1)th time, and m-1 intermediate values generated between the N-th measurement value and the (N+1)th measurement value by dividing a period between the N-th time and the (N+1)th time into m parts, are successively displayed in order of the N-th measurement value, the intermediate value, and the (N+1)th measurement value.

10. 发明申请

US20210325437A1 Cached Peak Graphical Display for Spectrum Analyzers 有权
公开(公告)号：US20210325437A1
公开(公告)日：2021-10-21
申请号：US16852535
申请日：2020-04-19
申请人： Research Electronics International, LLC
发明人： Thomas H. Jones
IPC分类号： G01R29/08 , G01R13/02
摘要： A spectrum analyzing device and method include sweeping a first frequency range at least once at a first resolution and performing a Fast Fourier Transform (FFT) on data from the sweeping of the first frequency range to produce first peak hold trace data. A second frequency range is swept at least once at a second resolution and an FFT applied to produce second peak hold trace data based on the sweeping of the second frequency range. The resolution for the sweeps is selected based on a bandwidth of the frequency range to be swept. A composite graphical display is produced based upon the first and second peak hold trace data. By caching the peak hold trace data, the spectrum analyzer preserves detected signal information when zooming from a coarser to a finer frequency resolution while minimizing the processing requirements of the spectrum analysis.

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