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1. 发明授权

US11372025B2 Systems and methods for synchronizing multiple test and measurement instruments 有权
公开(公告)号：US11372025B2
公开(公告)日：2022-06-28
申请号：US17317841
申请日：2021-05-11
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Barton T. Hickman , Joshua J. O'Brien
IPC分类号： G01R13/02 , H03K5/00 , H03L7/08 , G01R31/319
摘要： A system includes a plurality of oscilloscopes, each oscilloscope having an output port and an input port, a cable connecting the output port of an initial oscilloscope of the plurality of oscilloscopes to the input port of a second oscilloscope of the plurality of oscilloscopes, the initial oscilloscope having a processing element to generate a master run clock, the second oscilloscope having a processing element including a phase-locked loop to lock a slave run clock to the master run clock, wherein the processing element of one of the oscilloscopes executes code to cause the processing element to manipulate one of the run clocks to pass trigger information to another of the plurality of oscilloscopes. A method of synchronizing at least two oscilloscopes including a master oscilloscope and at least one slave oscilloscope includes connecting the at least two oscilloscopes together using output ports and input ports of the at least two oscilloscopes and at least one cable; sending a master run clock from the master oscilloscope to at least one slave oscilloscope; synchronizing a run clock of the at least one slave oscilloscope to the master run clock; recognizing a trigger event at a first oscilloscope of the at least two oscilloscopes; altering the run clock at the first oscilloscope to encode a trigger indication; and receiving the altered run clock at a second oscilloscope of the at least two oscilloscopes, wherein the trigger indication causes the second oscilloscope to recognize the trigger event.

2. 发明申请

US20210148951A1 FREQUENCY CONVERTER ACCESSORY FOR A TEST AND MEASUREMENT INSTRUMENT 有权
公开(公告)号：US20210148951A1
公开(公告)日：2021-05-20
申请号：US17099701
申请日：2020-11-16
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Josiah A. Bartlett , Amr Haj-Omar , Donald J. Dalebroux , Barton T. Hickman , Alexander Krauska
IPC分类号： G01R13/02 , G01R13/22
摘要： An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

3. 发明申请

US20200212922A1 Linear and Non-Linear Calibration for Time Interleaved Digital-to-Analog Converter 审中-公开
公开(公告)号：US20200212922A1
公开(公告)日：2020-07-02
申请号：US16526875
申请日：2019-07-30
申请人： Tektronix, Inc.
发明人： Karen Hovakimyan , Gregory A. Martin , Daniel G. Knierim
IPC分类号： H03M1/10 , H03M1/84
摘要： A time-interleaved digital-to-analog converter system, comprising a digital pre-distorter configured to receive an input digital signal and an error signal and output a distorted digital signal based on the input digital signal and the error signal; a time-interleaved digital-to-analog converter having a first sample rate, the time-interleaved digital-to-analog converter configured to convert the distorted digital signal to an analog signal; and a calibration system. The calibration system includes an analog-to-digital converter having a second sample rate equal to or lower than the first sample rate, the analog-to-digital converter configured to receive the analog signal and covert the analog signal to a down-sampled digital signal, a discrete-time linear model configured to receive the input digital signal and the error signal and output a model signal, and a combiner to subtract the down-sampled digital signal from the model signal to generate the error signal.

4. 发明申请

US20170227581A1 TRIGGER ON FINAL OCCURRENCE 审中-公开
公开(公告)号：US20170227581A1
公开(公告)日：2017-08-10
申请号：US15395593
申请日：2016-12-30
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , David L. Kelly , Patrick A. Smith
IPC分类号： G01R13/02
CPC分类号： G01R13/0254 , G01R13/0245
摘要： This disclosure relates generally to test and measurement instruments structured to detect that a series of events occurred, and structured to generate a trigger signal in response to detecting that a final event in the series of events occurred. The trigger may be generated based on a timeout signal, or based on another event, trigger, or signal. Stored data in the acquisition memory may be marked relative to the detection of the final event. An external forced timeout signal may control which in a series of events is marked as a final event. The triggering on final event may be enabled after another trigger is satisfied, and may be used as one of many different types of triggers.

5. 发明申请

US20170201239A1 Event Activity Trigger 审中-公开
公开(公告)号：US20170201239A1
公开(公告)日：2017-07-13
申请号：US14995008
申请日：2016-01-13
申请人： Tektronix, Inc.
发明人： Patrick A. Smith , Daniel G. Knierim
IPC分类号： H03K3/037 , H03K19/20
摘要： Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.

6. 发明申请

US20160077128A1 AUTOMATIC PROBE GROUND CONNECTION CHECKING TECHNIQUES 审中-公开
标题翻译：自动探头接地检查技术
公开(公告)号：US20160077128A1
公开(公告)日：2016-03-17
申请号：US14949562
申请日：2015-11-23
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
IPC分类号： G01R1/067 , G01R31/02
CPC分类号： G01R1/06788 , G01R1/06766 , G01R1/06794 , G01R31/024 , G01R31/026
摘要： A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.
摘要翻译：测试系统可以包括适于耦合在测试测量设备和被测设备（DUT）之间的探头。探头可以包括用于从DUT接收有效信号的信号输入和用于向测试测量装置提供有源信号的信号输出。探头还可以包括一个连接到DUT地的输入接地和一个连接到测试测量设备地的输出地。探头接地连接检查装置可以自动确定探头接地与DUT接地和测试测量设备接地是否牢固。

7. 发明申请

US20160033455A1 TRI-MODE PROBE WITH AUTOMATIC SKEW ADJUSTMENT 审中-公开
标题翻译：具有自动调整的三角形探头
公开(公告)号：US20160033455A1
公开(公告)日：2016-02-04
申请号：US14745757
申请日：2015-06-22
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Christopher R. Muggli , Martin Rockwell , Ira G. Pollock
IPC分类号： G01N29/30 , G01N29/24
CPC分类号： G01N29/30 , G01N29/24 , G01R1/06766 , G01R1/06772 , G01R31/31706
摘要： A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.
摘要翻译：探头，包括被配置为接收第一输入信号的第一输入，被配置为接收第二输入信号的第二输入，连接到第一输入的第一电缆，连接到第二输入的第二电缆，连接到所述第一电缆，所述电子可调节延迟被配置为延迟所述第一输入信号以去除所述第一输入信号和所述第二输入信号之间的偏斜;以及放大器，被配置为从所述电子可调延迟接收所述第一输入信号，以及第二输入信号。

8. 发明授权

US09172362B2 Multifunction word recognizer element 有权
标题翻译：多功能字识别器元件
公开(公告)号：US09172362B2
公开(公告)日：2015-10-27
申请号：US13922125
申请日：2013-06-19
申请人： Tektronix, Inc.
发明人： John F. Stoops , Daniel G. Knierim
IPC分类号： H03K5/22 , H03K5/24 , G01R31/3177 , G01R13/02
CPC分类号： H03K5/2481 , G01R13/0254 , G01R31/3177
摘要： A circuit includes a load; a first differential pair coupled to the load and responsive to input data; a second differential pair coupled to the load and responsive to the input data; a third differential pair coupled to the first differential pair and the second differential pair and responsive to a first control signal and a second control signal; a bias circuit configured to pull a node coupled to both the first differential pair and the second differential pair to a predetermined state; and a current source coupled to the third differential pair and the bias circuit.
摘要翻译：电路包括负载; 耦合到所述负载并响应于输入数据的第一差分对; 耦合到所述负载并响应于所述输入数据的第二差分对; 耦合到所述第一差分对和所述第二差分对并响应于第一控制信号和第二控制信号的第三差分对; 偏置电路，被配置为将耦合到所述第一差分对和所述第二差分对的节点拉到预定状态; 以及耦合到第三差分对和偏置电路的电流源。

9. 发明申请

US20150084660A1 TIME-DOMAIN REFLECTOMETER DE-EMBED PROBE 审中-公开
标题翻译：时域反射仪DE-EMBED PROBE
公开(公告)号：US20150084660A1
公开(公告)日：2015-03-26
申请号：US14317389
申请日：2014-06-27
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Barton T. Hickman
IPC分类号： G01R1/067 , G01R19/00
CPC分类号： G01R31/31908 , G01R1/06772 , G01R27/28 , G01R31/2839 , G01R35/002
摘要： A de-embed probe including an input configured to connect to a device under test, a memory, a signal generator connected to the input, the signal generator configured to generate a test signal, and a controller connected to the signal generator and configured to control the signal generator. The de-embed probe may be used in a test and measurement system. The test and measurement system also includes a test and measurement instrument including a processor connected to the controller of the de-embed probe, the processor configured to provide instructions to the controller, and a test and measurement input to receive an output from the de-embed probe.
摘要翻译：一种解嵌入探针，包括被配置为连接到被测器件的输入，存储器，连接到输入的信号发生器，被配置为产生测试信号的信号发生器，以及连接到信号发生器并被配置为控制信号发生器。解嵌式探头可用于测试和测量系统。所述测试和测量系统还包括测试和测量仪器，包括连接到所述解嵌入探针的控制器的处理器，所述处理器被配置为向所述控制器提供指令，以及测试和测量输入以接收所述解嵌入探测器的输出，嵌入探针。

10. 发明申请

US20140225591A1 TEST AND MEASUREMENT INSTRUMENT INCLUDING ASYNCHRONOUS TIME-INTERLEAVED DIGITIZER USING HARMONIC MIXING 有权
公开(公告)号：US20140225591A1
公开(公告)日：2014-08-14
申请号：US14254373
申请日：2014-04-16
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , James S. Lamb
IPC分类号： G01R23/14
CPC分类号： H03M1/121 , G01R13/0272
摘要： A test and measurement instrument including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal; a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal; and a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from an effective sample rate of at least one of the digitizers.

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