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1. 发明申请

US20230082223A1 SYSTEMS AND METHODS FOR STRUCTURED ILLUMINATION MICROSCOPY 有权
公开(公告)号：US20230082223A1
公开(公告)日：2023-03-16
申请号：US17990958
申请日：2022-11-21
申请人： Illumina, Inc.
发明人： Bo Lu , Robert Ezra Langlois , Andrew James Young , Andrew Dodge Heiberg
IPC分类号： G02B21/00 , G02B27/60 , G01N21/64 , G06T3/40 , G02B21/14 , G06T5/50
摘要： The technology disclosed relates to structured illumination microscopy (SIM). In particular, the technology disclosed relates to capturing and processing, in real time, numerous image tiles across a large image plane, dividing them into subtiles, efficiently processing the subtiles, and producing enhanced resolution images from the subtiles. The enhanced resolution images can be combined into enhanced images and can be used in subsequent analysis steps.

2. 发明授权

US10951793B2 Imaging device, imaging method, and image processing device generating a complex sensor image 有权
公开(公告)号：US10951793B2
公开(公告)日：2021-03-16
申请号：US16278857
申请日：2019-02-19
申请人： HITACHI, LTD.
发明人： Yusuke Nakamura , Kazuyuki Tajima , Keita Yamaguchi
IPC分类号： H04N5/217 , G02B27/60 , H04N5/232
摘要： An imaging device includes: a modulator configured to modulate the intensity of light, based on a grating pattern; an image sensor configured to convert light passing through the modulator to electrical signals to generate a sensor image; a complex sensor image processing unit configured to generate, from the sensor image, a complex sensor image comprising a complex number; and a data transmission unit configured to transmit the complex sensor image.

3. 发明授权

US10520162B2 Illumination device 有权
公开(公告)号：US10520162B2
公开(公告)日：2019-12-31
申请号：US15950494
申请日：2018-04-11
申请人： FUJIFILM Corporation
发明人： Samito Nakamura , Hiromi Takenoshita , Daisaku Abiru
IPC分类号： F21S43/14 , F21S43/20 , F21V5/04 , F21V5/00 , G02B3/00 , G02B5/02 , F21Y115/10 , G02B27/60 , H01L33/58 , G02B19/00
摘要： Provided is a high-decorativeness illumination device that utilizes lenticular lens sheets. An illumination device includes first to third lenticular lens sheets, an LED light source, and a casing. The first and second lenticular lens sheets are laminated such that an angle formed by plano-convex cylindrical lenses falls within a first angle range which is greater than 0 degrees and is less than 30 degrees. Accordingly, moire fringes appear in illumination light rays. The third lenticular lens sheet is laminated on the first and second lenticular lens sheets such that angles formed by plano-convex cylindrical lenses fall within a second angle range which is equal to or greater than 30 degrees and is equal to or less than 90 degrees.

4. 发明授权

US10397529B2 Transparent optical coupler active matrix array 有权
公开(公告)号：US10397529B2
公开(公告)日：2019-08-27
申请号：US15582296
申请日：2017-04-28
申请人： PALO ALTO RESEARCH CENTER INCORPORATED
发明人： Jengping Lu , Patrick Y. Maeda , Sourobh Raychaudhuri , David K. Biegelsen , Eugene M. Chow
IPC分类号： H01L27/12 , H04N5/33 , H04N9/04 , H01L31/112 , G02B27/14 , G01N21/88 , G02B27/60
摘要： A backplane has an array of output terminals arranged on an output surface of the backplane, and an array of solid state optical switches, each optical switch corresponding to one of the output terminals, wherein the solid state optical switches are responsive to light of a control wavelength and are transparent to light of a sensing wavelength, wherein the backplane is of a material transparent to light of a sensing wavelength different from the control wavelength. An optical system includes a backplane having an array of optocouplers, a projector to generate light of a control wavelength to which the optocouplers are responsive, optics to direct the control light onto the array of optocouplers on a backplane, an imaging system responsive to light of a sensing wavelength, wherein the backplane is at least partially transparent to the sensing wavelength.

5. 发明申请

US20180157058A1 SUBWAVELENGTH STRUCTURED LENS, USE AND METHODS OF MAKING THE SAME 审中-公开
公开(公告)号：US20180157058A1
公开(公告)日：2018-06-07
申请号：US15579166
申请日：2016-06-06
申请人： Stephen Y. CHOU , Fei DING , Wei DING
发明人： Stephen Y. CHOU , Fei DING , Wei DING
IPC分类号： G02B27/60 , G02B3/00 , G02B5/18 , G02B19/00
CPC分类号： G02B27/60 , G02B3/0087 , G02B5/1809 , G02B5/1857 , G02B5/1861 , G02B19/0014 , G02B19/0061 , G02B27/4205
摘要： The present inventions is related to the optical lenses that use subwavelength structures to perform an optical function, the applications of such lenses, and the methods of making the same. Particularly, the present invention provide an optical lens(es), termed “subwavelength Moiré index lens” or “SMIL” for manipulating light. The SMIL comprises a thin material layer having an effective optical index that has a Moiré pattern of two or more periodic structures. The SMIL allows a lens to be ultrathin, flat, numerical aperture nearly one, scalable to large area, and manufacturable at low cost. The present invention also provides the systems based on SMIL, such lens systems, LEDs and photodetectors, and the fabrication methods of the SMIL.

6. 发明申请

US20170307367A1 MEASUREMENT DEVICE, IMPRINT APPARATUS, METHOD FOR MANUFACTURING PRODUCT, LIGHT AMOUNT DETERMINATION METHOD, AND LIGHT AMOUNT ADJUSTMENT METHOD 审中-公开
公开(公告)号：US20170307367A1
公开(公告)日：2017-10-26
申请号：US15491723
申请日：2017-04-19
申请人： CANON KABUSHIKI KAISHA
发明人： Kenji Yaegashi , Toshiki Iwai , Takamitsu Komaki
IPC分类号： G01B11/27 , G02B27/60 , G03F9/00
CPC分类号： G01B11/272 , G02B27/32 , G02B27/60 , G03F9/7042 , G03F9/7088
摘要： A measurement device for measuring a relative position between alignment marks includes an illumination unit capable of illuminating the alignment marks at a plurality of wavelengths, a detection unit that detects light from the alignment marks, a processing unit that obtain the relative position between the alignment marks, and an adjustment unit that adjusts a relative amount between light amounts of the plurality of wavelengths so that a relative value between detection light amounts of light from the alignment marks falls within a predetermined range.

7. 发明授权

US09772484B2 Light modulating device 有权
公开(公告)号：US09772484B2
公开(公告)日：2017-09-26
申请号：US14647403
申请日：2013-11-05
申请人： CITIZEN WATCH CO., LTD.
发明人： Kenji Matsumoto , Nobuyuki Hashimoto , Makoto Kurihara , Masafumi Yokoyama , Ayano Tanabe
IPC分类号： G02B21/36 , G02B27/42 , G02F1/1333 , G02B21/08 , G02B5/18 , G02F1/1343 , G02F1/1335 , G02F1/13363 , G02F1/1347 , G02B27/28 , G02B27/58 , G02B26/06 , G02B27/10 , G02B27/60
CPC分类号： G02B21/361 , G02B5/1871 , G02B21/082 , G02B26/06 , G02B27/1086 , G02B27/286 , G02B27/4205 , G02B27/425 , G02B27/58 , G02B27/60 , G02F1/1333 , G02F1/1335 , G02F1/13363 , G02F1/134309 , G02F1/1347 , G02F2203/50
摘要： A light modulating device 103 includes: a selective diffraction device (10, 10′) which generates diffracted light beams of a plurality of orders by diffracting illumination light into one of a plurality of directions, the illumination light being linearly polarized light having a polarization plane oriented in a first polarization direction, and which causes a phase difference between the diffracted light beams of the plurality of orders; and a polarization plane rotating device 14 which rotates the polarization plane of the diffracted light beam of each order so as to be oriented in a direction perpendicular to a direction radiating from an optical axis.

8. 发明申请

US20170038552A1 SUBMICRON WAFER ALIGNMENT 有权
标题翻译：子波形对准
公开(公告)号：US20170038552A1
公开(公告)日：2017-02-09
申请号：US15188635
申请日：2016-06-21
申请人： QUALCOMM Incorporated
发明人： Todor Georgiev Georgiev
IPC分类号： G02B7/00 , G02B21/00 , G06T7/00 , G02B21/36 , G02B27/10 , H04N5/225 , G02B13/00 , G02B27/60
CPC分类号： G02B7/003 , G01M11/00 , G02B13/0085 , G02B21/0016 , G02B21/365 , G02B27/1073 , G02B27/144 , G02B27/60 , G02B27/62 , G06T7/0004 , G06T7/70 , G06T7/73 , G06T2207/30148 , H04N5/2254
摘要： Certain aspects relate to systems and techniques for submicron alignment in wafer optics. One disclosed method of alignment between wafers to produce an integrated lens stack employs a beam splitter (that is, a 50% transparent mirror) that reflects the alignment mark of the top wafer when the microscope objective is focused on the alignment mark of the bottom wafer. Another disclosed method of alignment between wafers to produce an integrated lens stack implements complementary patterns that can produce a Moiré effect when misaligned in order to aid in visually determining proper alignment between the wafers. In some embodiments, the methods can be combined to increase precision.
摘要翻译：某些方面涉及晶片光学器件中亚微米对准的系统和技术。一种公开的在晶片之间进行对准以产生集成透镜堆叠的方法采用当显微镜物镜聚焦在底部晶片的对准标记上时反射顶部晶片的对准标记的分束器（即，50％透明反射镜）。在晶片之间进行对准以产生集成透镜叠层的另一公开的方法实现了互补图案，当未对准时可产生莫尔效应，以便有助于在视觉上确定晶片之间的正确对准。在一些实施例中，可以组合这些方法以提高精度。

9. 发明授权

US09341859B2 3D image based alignment method 有权
标题翻译：基于3D图像的对准方法
公开(公告)号：US09341859B2
公开(公告)日：2016-05-17
申请号：US13543356
申请日：2012-07-06
申请人： Naoki Sumi , Satoru Takahashi
发明人： Naoki Sumi , Satoru Takahashi
IPC分类号： G01B11/25 , G01B11/255 , G02B27/60 , H04N13/04 , G02B27/22
CPC分类号： G02B27/60 , G02B27/2214 , H04N13/31 , H04N13/327
摘要： An alignment method applied to a barrier-type 3D display includes providing a 3D alignment device at least comprising an image capture tool and an alignment shift analysis software; disposing a display panel with a barrier laminated thereon in the 3D alignment device; presenting a display and a barrier alignment check patterns on the display panel and the barrier; the image capture tool capturing an image of a moiré pattern generated by the display and the barrier alignment check patterns; analyzing the image of the moiré pattern by the alignment shift analysis software, and determining at least three measurement points of the image of the moiré pattern; calculating position shift for each measurement point and rotation angle between display panel and barrier by the alignment shift analysis software; and adjusting corresponding position between display panel and barrier if the calculation results exceed predetermined alignment errors.
摘要翻译：应用于障壁型3D显示器的对准方法包括提供至少包括图像捕获工具和对准移位分析软件的3D对准装置; 在3D对准装置中设置层叠有阻挡层的显示面板; 在显示面板和屏障上呈现显示和屏障对准检查图案; 图像捕获工具捕获由显示器产生的莫尔图案和屏障对准检查图案; 通过对准偏移分析软件分析莫尔图案的图像，以及确定莫尔图案的图像的至少三个测量点; 通过对准移位分析软件计算每个测量点的位移和显示面板与屏障之间的旋转角度; 并且如果计算结果超过预定的对准误差，则调整显示面板与屏障之间的对应位置。

10. 发明授权

US09057697B2 Optical device with propagating and localized surface plasmons and detection apparatus 有权
标题翻译：具有传播和局部表面等离子体的光学装置和检测装置
公开(公告)号：US09057697B2
公开(公告)日：2015-06-16
申请号：US13651791
申请日：2012-10-15
申请人： Seiko Epson Corporation
发明人： Jun Amako , Mamoru Sugimoto , Hideaki Koike
IPC分类号： G01N21/552 , G02B27/60 , G01J3/26 , G01J3/12
CPC分类号： G01N21/554 , G01J3/12 , G01J3/26 , G02B27/60
摘要： An optical device includes a first protrusion group in which protrusions protruding from a conductor surface of a substrate are arranged in a first direction with a first period, a dielectric layer that covers the conductor surface and the first protrusion group, and a second protrusion group in which metal nanoparticles are arranged on the dielectric layer in the first direction with a second period different from the first period. When one of the first period and the second period is defined as Px1, the other of the first period and the second period is defined as Px2, and the wavelength of irradiation light is defined as λ, λ>Px1>Px2 and 0
摘要翻译：光学装置包括：第一突起群，其中从基板的导体表面突出的突起以第一周期沿第一方向布置;覆盖导体表面的电介质层和第一突起组;以及第二突起组，哪个金属纳米颗粒以不同于第一周期的第二周期在第一方向上布置在电介质层上。当第一周期和第二周期中的一个被定义为Px1时，第一周期和第二周期中的另一个被定义为Px2，并且照射光的波长被定义为λ，λ> Px1> Px2和0

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