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    • 5. 发明授权
    • Removal of residues from metallic insert used in manufacture of
multi-layer ceramic substrate with cavity for microelectronic chip
    • 从用于微电子芯片空腔的多层陶瓷基板制造中使用的金属插件中除去残留物
    • US5643818A
    • 1997-07-01
    • US642238
    • 1996-05-02
    • Krishna G. SachdevThomas E. LombardiVincent P. Peterson
    • Krishna G. SachdevThomas E. LombardiVincent P. Peterson
    • H01L21/48H01L21/70
    • H01L21/4857H01L21/4864H01L2924/15153H01L2924/1517
    • After a metallic insert has been used precisely to define a cavity for a microelectronic chip in a laminated, multi-sheet, predominantly ceramic substrate having metallic features, any green sheet and metal-polymer composite paste residues are removed from the metallic insert by immersing the metallic insert in an ultrasonically agitated bath containing a first solvent having a relatively high boiling point for about five to fifteen minutes, replacing the first solvent with a second solvent having a relatively low boiling point, and drying the metallic insert in hot air or hot nitrogen to remove the second solvent. Preferably, the first solvent is an alkoxy alcohol, such as 1-methoxy-2-propanol or 3-methoxy-1-butanol, or a hydroxy ester, such as ethyl lactate, and the second solvent is a lower alkyl alcohol, such as isopropanol. Alternatively, the first solvent may be a ketone or an alkyl ester. The metallic insert is rinsed in the second solvent, preferably in an ultrasonically agitated bath, to replace the first solvent with the second solvent before the metallic insert is dried to remove the first solvent.
    • 在金属插入件被精确地用于在具有金属特征的层压,多片,主要为陶瓷的基底中限定用于微电子芯片的空腔的情况下,通过将任何生片和金属 - 聚合物复合糊料残留物从金属插入物中浸渍 金属插入物在包含具有较高沸点的第一溶剂的超声波搅拌浴中约5至15分钟,用具有相对低沸点的第二溶剂代替第一溶剂,并在热空气或热氮中干燥金属插入物 以除去第二溶剂。 优选地,第一溶剂是烷氧基醇,例如1-甲氧基-2-丙醇或3-甲氧基-1-丁醇,或羟基酯如乳酸乙酯,第二溶剂是低级烷基醇,例如 异丙醇 或者,第一溶剂可以是酮或烷基酯。 金属插入物在第二溶剂中,优选在超声波搅拌浴中漂洗,以在将金属插入物干燥以除去第一溶剂之前用第二溶剂替换第一溶剂。
    • 6. 发明授权
    • Ceramic probe card and method for reducing leakage current
    • 陶瓷探针卡和减少漏电流的方法
    • US5532608A
    • 1996-07-02
    • US417623
    • 1995-04-06
    • Abbas Behfar-RadCharles H. PerryKrishna G. Sachdev
    • Abbas Behfar-RadCharles H. PerryKrishna G. Sachdev
    • G01R31/26G01R1/073H05K3/28H05K9/00G01R15/12
    • G01R1/07307
    • An electrical probe card for parametric testing of microelectronics having reduced leakage current, includes a hydrophobic layer of a self curing silicone material coating the entire exposed surface of the ceramic card between exposed conductors. The hydrophobic layer has a thickness of less than 1 micrometer, preferably less than 0.1 micrometer and most preferably between 0.01 and 0.001 micrometers. The hydrophobic layer does not interfere with subsequent soldering to the contacts on the card, is inexpensive, solvent resistant and easily applied to new and pre-existing probe cards. The method of application involves applying an excess of the hydrophobic silicone material in its uncured state, followed by vigorously wiping excess material off to thin the layer, produce a good bond and clean the exposed conductors on the probe card.
    • 用于具有减小的漏电流的微电子学参数测试的电探针卡包括在裸露导体之间涂覆陶瓷卡的整个暴露表面的自固化硅氧烷材料的疏水层。 疏水层的厚度小于1微米,优选小于0.1微米,最优选为0.01至0.001微米。 疏水层不会干扰随后焊接到卡上的触点,价格低廉,耐溶剂性,并且易于应用于新的和预先存在的探针卡。 施用方法包括将过量的疏水性硅氧烷材料应用于其未固化状态,然后剧烈擦拭多余的材料以使层变薄,产生良好的粘结并清洁探针卡上的暴露的导体。