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    • 2. 发明申请
    • AUTOFOCUS METHODS AND DEVICES FOR LITHOGRAPHY
    • AUTOFOCUS方法和装置用于光刻
    • WO2006091482A2
    • 2006-08-31
    • PCT/US2006/005623
    • 2006-02-17
    • NIKON CORPORATIONSOGARD, Michael
    • SOGARD, Michael
    • G03F9/00
    • G03F9/7026G03F9/7049
    • Improved autofocusing ("AF") methods and devices for lithography are provided. Some embodiments of the invention provide an AF system that includes one or more interferometers for measuring a distance to a wafer surface or a reticle surface. The invention includes methods and devices for calibrating the interferometer(s) according to known distances to a target. According to some embodiments of the invention, a spatial filter reduces the amount of undesired signal coming from the wafer or reticle surface. In some such embodiments, higher orders of diffracted light from the wafer or reticle multilayer surfaces are eliminated with a pinhole filter oriented to reject light that is not vertically directed. Other embodiments include a spatial filtering system that passes a selected diffraction order, e.g., the first order of diffracted light, from the target. These spatial filters reduce variations in the signal and make further signal processing easier. By including a beam expander, the interferometer beam can sample a larger or smaller area on the wafer. In another embodiment a polarizer will help attenuate scattered or diffracted light received by the interferometer. In some embodiments, the wavelength of the light used by the AF system is selected to maximize the absorption or reflection of this light by part of the target, e.g., by the reticle multilayer or the absorber layer.
    • 提供了用于光刻的改进的自动聚焦(“AF”)方法和设备。 本发明的一些实施例提供了一种AF系统,其包括用于测量到晶片表面或标线表面的距离的一个或多个干涉仪。 本发明包括用于根据到目标的已知距离来校准干涉仪的方法和装置。 根据本发明的一些实施例,空间滤波器减少来自晶片或标线表面的不希望信号的量。 在一些这样的实施例中,来自晶片或标线片多层表面的衍射光的更高阶被消除,其中针孔过滤器被定向成拒绝不垂直定向的光。 其他实施例包括空间滤波系统,其从目标传递选定衍射级,例如衍射光的第一级。 这些空间滤波器可以减少信号的变化,并使信号处理更容易。 通过包含光束扩展器,干涉仪光束可以在晶圆上采样更大或更小的区域。 在另一个实施例中,偏振器将有助于衰减由干涉仪接收的散射或衍射光。 在一些实施例中,AF系统使用的光的波长被选择为使得部分目标(例如,通过标线片多层或吸收层)对该光的吸收或反射最大化。
    • 3. 发明申请
    • AIR GAUGES COMPRISING DUAL-RANGE DIFFERENTIAL PRESSURE SENSOR
    • 包含双范围差压传感器的空气压力表
    • WO2013063104A1
    • 2013-05-02
    • PCT/US2012/061675
    • 2012-10-24
    • NIKON CORPORATION
    • SOGARD, MichaelLEE, Sandy
    • G01B13/12G03F7/20
    • G03F9/7026G01B13/12G03F7/70641G03F9/7057
    • Position-sensing devices include first and second gas passageways connectable to a source of pressurized gas. A gas-releasing probe is connected to the first passageway. The probe is positionable relative to a surface and configured to release a first flow of the gas, flowing through the first passageway, toward the surface while a second flow of the gas flows through the second passageway. A differential-pressure (DP) sensing device is connected between the first and second passageways. The DP-sensing device has first and second DP sensors connected in parallel. The first DP sensor produces a gas-pressure measurement within a first dynamic -pressure range, and the second DP sensor produces a gas-pressure measurement in a second dynamic-pressure range. The resulting position measurement has greater dynamic range and higher resolution than would otherwise be produced with either the first DP sensor or the second DP sensor alone.
    • 位置检测装置包括可连接到加压气体源的第一和第二气体通道。 气体释放探针连接到第一通道。 探针可相对于表面定位并且构造成释放流过第一通道的气体的第一流向表面,同时气体的第二流动流过第二通道。 差压(DP)感测装置连接在第一和第二通道之间。 DP感测装置具有并联连接的第一和第二DP传感器。 第一DP传感器在第一动态压力范围内产生气体压力测量,第二DP传感器在第二动态压力范围内产生气体压力测量。 所产生的位置测量具有比用第一DP传感器或第二DP传感器单独产生的更大的动态范围和更高的分辨率。
    • 5. 发明申请
    • EXTREME ULTRAVIOLET RETICLE PROTECTION
    • 极端超紫外线防护
    • WO2006012462A1
    • 2006-02-02
    • PCT/US2005/025958
    • 2005-07-21
    • NIKON CORPORATIONSOGARD, Michael
    • SOGARD, Michael
    • G03B27/42
    • G03F7/70875G03F7/70916G03F7/70933
    • Methods and apparatus for using a flow of a relatively cool gas to establish a temperature gradient between a reticle (916) and a reticle shield (920) to reduce particle contamination on the reticle are disclosed. According to one aspect of the present invention, an apparatus that reduces particle contamination on a surface of an object (928) includes a plate (920) and a gas supply (954). The plate is positioned in proximity to the object such that the plate, which has a second temperature, and the object, which has a first temperature, are substantially separated by a space. The gas supply supplies a gas flow into the space. The gas has a third temperature that is lower than both the first temperature and the second temperature. The gas cooperates with the plate and the object to create a temperature gradient and, hence, a thermophoretic force that conveys particles in the space away from the object.
    • 公开了使用相对较冷气体的流动来建立掩模版(916)和掩模版屏蔽(920)之间的温度梯度以减少掩模版上的颗粒污染的方法和装置。 根据本发明的一个方面,减少物体表面上的颗粒污染的装置包括板(920)和气体供应(954)。 板被定位在物体附近,使得具有第二温度的板和具有第一温度的物体基本上被空间隔开。 气体供应气体供应到空间。 气体具有低于第一温度和第二温度的第三温度。 气体与板和物体配合以产生温度梯度,并因此产生将空间中的颗粒传送离开物体的热解压力。
    • 8. 发明申请
    • ENVIRONMENTAL SYSTEM INCLUDING VACCUM SCAVANGE FOR AN IMMERSION LITHOGRAPHY APPARATUS
    • 环境系统,包括用于浸没式光刻设备的真空SCAVANGE
    • WO2004090634A2
    • 2004-10-21
    • PCT/IB2004/002704
    • 2004-03-29
    • NIKON CORPORATIONHAZELTON, Andrew, J.SOGARD, Michael
    • HAZELTON, Andrew, J.SOGARD, Michael
    • G03F
    • G03F7/70875G03F7/2041G03F7/70341G03F7/70775G03F7/70816G03F7/70866G03F7/709
    • An environmental system (26) for controlling an environment in a gap (246) between an optical assembly (16) and a device (30) includes a fluid barrier (254) and an immersion fluid system (252). The fluid barrier (254) is positioned near the device (30). The immersion fluid system (252) delivers an immersion fluid (248) that fills the gap (246). The immersion fluid system (252) collects the immersion fluid (248) that is directly between the fluid barrier (254) and the device (30). The fluid barrier (254) can include a scavenge inlet (286) that is positioned near the device (30), and the immersion fluid system (252) can include a low pressure source (392A) that is in fluid communication with the scavenge inlet (286). The fluid barrier (254) confines any vapor (249) of the immersion fluid (248) and prevents it from perturbing a measurement system (22). Additionally, the environmental system (26) can include a bearing fluid source (290B) that directs a bearing fluid (290C) between the fluid barrier (254) and the device (30) to support the fluid barrier (254) relative to the device (30).
    • 用于控制光学组件(16)和装置(30)之间的间隙(246)中的环境的环境系统(26)包括流体屏障(254)和浸没流体系统(252)。 流体屏障(254)位于装置(30)附近。 浸没流体系统(252)输送填充间隙(246)的浸没流体(248)。 浸没流体系统(252)收集直接在流体屏障(254)和装置(30)之间的浸没流体(248)。 流体屏障(254)可以包括位于装置(30)附近的扫气入口(286),并且浸没流体系统(252)可包括低压源(392A),该低压源与扫气入口 (286)。 流体屏障(254)限制浸没流体(248)的任何蒸气(249)并防止其扰动测量系统(22)。 另外,环境系统(26)可以包括轴承流体源(290B),该轴承流体源引导在流体屏障(254)和装置(30)之间的轴承流体(290C)相对于装置支撑流体屏障(254) (30)。