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    • 7. 发明公开
    • INSPECTION PROBE
    • 检测探头
    • EP3290894A1
    • 2018-03-07
    • EP16187384.9
    • 2016-09-06
    • General Electric Technology GmbH
    • FISCHER, ReinhardLUMLEY, AndrewLOOSLI, Dominik
    • G01M13/02G01M13/04G01N27/90G01N29/22
    • G01N27/9046G01M13/023G01N27/87G01N27/9013G01N2291/2693G01R3/00G01R31/00
    • An inspection apparatus (300), including an extendable structure (302), an inspection probe (304), a drive (316), a sensor (530), and a processor (520). The extendable structure includes an end fixed to the inspection probe and insertable into a gap (110) defined between a first surface (102) and a second surface (104). The extendable structure is configured to maintain physical contact with the first surface as the end transitions across the first surface. The drive is configured to position the inspection probe. The current sensor is coupled to the drive and configured to measure a drive load over a period of time the inspection probe transitions across the first surface. The processor is coupled to the sensor and is configured to receive a signal associated with the drive load corresponding to movement of the inspection probe, and determine an operating condition of the extendable structure based on the drive load signal.
    • 包括可延伸结构(302),检查探针(304),驱动器(316),传感器(530)和处理器(520)的检查装置(300)。 可延伸结构包括固定到检查探针并可插入限定在第一表面(102)和第二表面(104)之间的间隙(110)中的端部。 可延伸结构被构造成当端部跨过第一表面时保持与第一表面的物理接触。 驱动器配置为定位检查探针。 电流传感器被耦合到驱动器并被配置为在检测探针在第一表面上转变的时间段内测量驱动负载。 处理器耦合到传感器并且被配置成接收与对应于检查探针的移动的驱动负载相关联的信号,并且基于驱动负载信号确定可伸展结构的操作状况。