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    • 2. 发明申请
    • Channel Doping Extension beyond Cell Boundaries
    • 频道兴奋扩展超出细胞边界
    • US20150118812A1
    • 2015-04-30
    • US14543991
    • 2014-11-18
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Kuo-Nan YangChou-Kun LinJerry Chang-Jui KaoYi-Chuin TsaiChien-Ju ChaoChung-Hsing Wang
    • H01L29/66H01L21/8234
    • H01L29/66545H01L21/823412H01L27/0207H01L27/0705H01L27/11807
    • An integrated circuit includes a first and a second standard cell. The first standard cell includes a first gate electrode, and a first channel region underlying the first gate electrode. The first channel region has a first channel doping concentration. The second standard cell includes a second gate electrode, and a second channel region underlying the second gate electrode. The second channel region has a second channel doping concentration. A dummy gate includes a first half and a second half in the first and the second standard cells, respectively. The first half and the second half are at the edges of the first and the second standard cells, respectively, and are abutted to each other. A dummy channel is overlapped by the dummy gate. The dummy channel has a third channel doping concentration substantially equal to a sum of the first channel doping concentration and the second channel doping concentration.
    • 集成电路包括第一和第二标准单元。 第一标准单元包括第一栅极电极和第一栅极电极下面的第一沟道区域。 第一通道区域具有第一通道掺杂浓度。 第二标准单元包括第二栅极电极和第二栅极电极下面的第二沟道区域。 第二沟道区具有第二沟道掺杂浓度。 虚拟栅极分别包括第一和第二标准单元中的前半部分和第二半部分。 第一半和第二半分别在第一标准单元和第二标准单元的边缘处并且彼此抵接。 虚拟通道由虚拟门重叠。 虚拟通道具有基本上等于第一通道掺杂浓度和第二通道掺杂浓度之和的第三通道掺杂浓度。
    • 7. 发明授权
    • Electromigration-aware layout generation
    • 电迁移感知布局生成
    • US09501602B2
    • 2016-11-22
    • US14255325
    • 2014-04-17
    • TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LTD.
    • Nitesh KattaJerry Chang-Jui KaoChin-Shen LinYi-Chuin TsaiChou-Kun LinKuo-Nan YangChung-Hsing Wang
    • G06F17/50
    • G06F17/5072G06F17/5036G06F2217/78G06F2217/82G06F2217/84
    • In some embodiments, in a method, placement of a design layout is performed. The design layout includes a power rail segment, several upper-level power lines and several cells. The upper-level power lines cross over and bound the power rail segment at where the upper-level power lines intersect with the power rail segment. The cells are powered through the power rail segment. For each cell, a respective current through the power rail segment during a respective SW of the cell is obtained. One or more groups of cells with overlapped SWs are determined. One or more EM usages of the power rail segment by the one or more groups of cells using the respective currents of each group of cells are obtained. The design layout is adjusted when any of the one or more EM usages of the power rail segment causes an EM susceptibility of the power rail segment.
    • 在一些实施例中,在一种方法中,执行设计布局的放置。 设计布局包括电力轨道段,几个上级电力线和几个电池。 上层电力线在电力轨道段上交叉并限制在上层电力线与电力轨道段相交的位置。 电池通过电源轨段供电。 对于每个电池,获得在电池的相应SW期间通过电力轨道段的相应电流。 确定具有重叠SW的一组或多组细胞。 获得使用每组单元的各自电流的一组或多组单元的电力轨道段的一个或多个EM用途。 当电力轨道段的一个或多个EM使用中的任何一个导致电力轨道段的EM敏感性时,调整设计布局。