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    • 7. 发明申请
    • Channel Doping Extension beyond Cell Boundaries
    • 频道兴奋扩展超出细胞边界
    • US20150118812A1
    • 2015-04-30
    • US14543991
    • 2014-11-18
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Kuo-Nan YangChou-Kun LinJerry Chang-Jui KaoYi-Chuin TsaiChien-Ju ChaoChung-Hsing Wang
    • H01L29/66H01L21/8234
    • H01L29/66545H01L21/823412H01L27/0207H01L27/0705H01L27/11807
    • An integrated circuit includes a first and a second standard cell. The first standard cell includes a first gate electrode, and a first channel region underlying the first gate electrode. The first channel region has a first channel doping concentration. The second standard cell includes a second gate electrode, and a second channel region underlying the second gate electrode. The second channel region has a second channel doping concentration. A dummy gate includes a first half and a second half in the first and the second standard cells, respectively. The first half and the second half are at the edges of the first and the second standard cells, respectively, and are abutted to each other. A dummy channel is overlapped by the dummy gate. The dummy channel has a third channel doping concentration substantially equal to a sum of the first channel doping concentration and the second channel doping concentration.
    • 集成电路包括第一和第二标准单元。 第一标准单元包括第一栅极电极和第一栅极电极下面的第一沟道区域。 第一通道区域具有第一通道掺杂浓度。 第二标准单元包括第二栅极电极和第二栅极电极下面的第二沟道区域。 第二沟道区具有第二沟道掺杂浓度。 虚拟栅极分别包括第一和第二标准单元中的前半部分和第二半部分。 第一半和第二半分别在第一标准单元和第二标准单元的边缘处并且彼此抵接。 虚拟通道由虚拟门重叠。 虚拟通道具有基本上等于第一通道掺杂浓度和第二通道掺杂浓度之和的第三通道掺杂浓度。
    • 10. 发明授权
    • Cell and macro placement on fin grid
    • 细胞和宏放置在鳍状网格上
    • US09047433B2
    • 2015-06-02
    • US13874027
    • 2013-04-30
    • Taiwan Semiconductor Manufacturing Company, Ltd.
    • Kuo-Nan YangChou-Kun LinJerry Chang-Jui KaoYi-Chuin TsaiChien-Ju ChaoChung-Hsing Wang
    • G06F17/50
    • G06F17/5072
    • A die includes at least one standard cell, which includes a first boundary and a second boundary opposite to the first boundary. The first boundary and the second boundary are parallel to a first direction. The at least one standard cell further includes a first plurality of FinFETs including first semiconductor fins parallel to the first direction. The die further includes at least one memory macro, which has a third boundary and a fourth boundary opposite to the third boundary. The third boundary and the fourth boundary are parallel to the first direction. The at least one memory macro includes a second plurality of FinFETs including second semiconductor fins parallel to the first direction. All semiconductor fins in the at least one standard cell and the at least one memory macro have pitches equal to integer times of a minimum pitch of the first and the second semiconductor fins.
    • 芯片包括至少一个标准单元,其包括与第一边界相对的第一边界和第二边界。 第一边界和第二边界平行于第一方向。 所述至少一个标准单元还包括第一多个FinFET,其包括平行于所述第一方向的第一半导体鳍片。 芯片还包括至少一个存储器宏,其具有与第三边界相反的第三边界和第四边界。 第三边界和第四边界与第一方向平行。 至少一个存储器宏包括第二多个FinFET,其包括平行于第一方向的第二半导体鳍片。 所述至少一个标准单元和所述至少一个存储器宏中的所有半导体鳍具有等于所述第一和第二半导体鳍的最小间距的整数倍的间距。