专利快速检索-快速检索全球专利，免费商用专利数据库-IPRDB

21. 发明申请

US20140049328A1 RING OSCILLATOR TIMER CIRCUIT 有权
标题翻译：环振荡器定时器电路
公开(公告)号：US20140049328A1
公开(公告)日：2014-02-20
申请号：US13928889
申请日：2013-06-27
申请人： Tektronix, Inc.
发明人： Patrick A. Smith , Daniel G. Knierim
IPC分类号： H03K3/03
CPC分类号： H03K3/0315 , H03K3/0322
摘要： A ring oscillator timer circuit can include a plurality of electrical components arranged in a cascaded combination of delay stages connected in a closed loop chain. The timer circuit can begin oscillation a programmable number of gate delays after receiving a start signal. In some examples, the number of gate delays can be programmed to fractional values. In further examples, the ring oscillator timer circuit can include a counter having an input electrically coupled to an output of a reset component.
摘要翻译：环形振荡器定时器电路可以包括以连接在闭环链中的延迟级的级联组合布置的多个电气部件。定时器电路可以在接收到启动信号之后开始振荡可编程的门延迟数量。在一些示例中，门延迟的数量可以编程为分数值。在另外的例子中，环形振荡器定时器电路可以包括具有电耦合到复位部件的输出的输入的计数器。

22. 发明申请

US20220349917A1 ISOLATED PROBE TIP 有权
公开(公告)号：US20220349917A1
公开(公告)日：2022-11-03
申请号：US17730096
申请日：2022-04-26
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Josiah A. Bartlett , Andrew W. Rusinek , David Thomas Engquist
IPC分类号： G01R1/067 , G01R31/28 , H05K9/00
摘要： A probe tip for an isolated probe having a triaxial cable has a conductive probe tip interface at one end of the cable, a signal conductor, the signal conductor traversing a length of the cable and electrically connected to the conductive probe tip interface, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor at least along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the probe tip, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor. A method of manufacturing a tip for an isolated probe having a triaxial cable includes accessing a shield conductor of the triaxial cable, inserting a high magnetic permeability material between the shield conductor and a reference conductor in the triaxial cable, electrically connecting the shield conductor to the reference conductor. A triaxial cable has a signal conductor, the signal conductor traversing a length of the cable, a reference conductor surrounding the signal conductor along the length of the cable, a shield conductor surrounding the reference conductor along the length of the cable, the shield conductor and the reference conductor electrically connected at ends of the cable, a first insulator between the signal conductor and the reference conductor along the length of the cable, a second insulator between the reference conductor and the shield conductor along the length of the cable, and high magnetic permeability material inside the shield conductor.

23. 发明授权

US11249111B2 Automatic probe ground connection checking techniques 有权
公开(公告)号：US11249111B2
公开(公告)日：2022-02-15
申请号：US16028236
申请日：2018-07-05
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
IPC分类号： G01R1/067 , G01R31/02 , G01R31/50 , G01R31/54
摘要： A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

24. 发明申请

US20210088553A1 Automatic Probe Ground Connection Checking Techniques 有权
公开(公告)号：US20210088553A1
公开(公告)日：2021-03-25
申请号：US17114468
申请日：2020-12-07
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
IPC分类号： G01R1/067 , G01R31/50
摘要： A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

25. 发明申请

US20200212923A1 DIGITAL SIGNAL PROCESSING WAVEFORM SYNTHESIS FOR FIXED SAMPLE RATE SIGNAL SOURCES 审中-公开
公开(公告)号：US20200212923A1
公开(公告)日：2020-07-02
申请号：US16554548
申请日：2019-08-28
申请人： Tektronix, Inc.
发明人： Gregory A. Martin , Patrick Satarzadeh , John J. Pickerd , Daniel G. Knierim
IPC分类号： H03M1/10 , H03M1/00 , H03M1/66
摘要： A test and measurement instrument including a digital-to-analog converter having an output sample rate configured to receive a digital sample waveform and a reference clock and output an analog waveform at the sample rate, a waveform synthesizer configured to receive an input waveform having a baud rate and output a digital sample waveform having a baud rate less than the sample rate of the digital-to-analog converter, and a port configured to output the analog waveform.

26. 发明授权

US10680588B2 Event activity trigger 有权
公开(公告)号：US10680588B2
公开(公告)日：2020-06-09
申请号：US14995008
申请日：2016-01-13
申请人： Tektronix, Inc.
发明人： Patrick A. Smith , Daniel G. Knierim
IPC分类号： H03K3/037 , G01R13/02 , H03K19/20
摘要： Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.

27. 发明申请

US20200027676A1 Electronic Rotary Switch 审中-公开
公开(公告)号：US20200027676A1
公开(公告)日：2020-01-23
申请号：US16042146
申请日：2018-07-23
申请人： Tektronix, Inc.
发明人： James D. Pileggi , Daniel G. Knierim
IPC分类号： H01H67/06 , H01H63/06 , H01H65/00 , H01H63/34 , H01H50/02
摘要： An electronic switch includes a substrate and a rotator assembly. The rotator assembly is configured to prevent rotation between a first rotational configuration and a second rotational configuration in a first translational position of the rotator assembly, while the rotator assembly is configured to rotate between the first rotational configuration and the second rotational configuration in a second translational position of the rotator assembly. The second translational position of the rotator assembly is translationally offset from the first translational position of the rotator assembly. An electrical contact of the rotator assembly is configured to electrically connect an electronic input path of the substrate to an electronic output path of the substrate in the first rotational configuration and first translational position of the rotator assembly, but not to electrically connect the electronic input path to the electronic output path in the second rotational configuration of the rotator assembly or in the second translational position of the rotator assembly.

28. 发明授权

US10145822B2 Tri-mode probe with automatic skew adjustment 有权
公开(公告)号：US10145822B2
公开(公告)日：2018-12-04
申请号：US14745757
申请日：2015-06-22
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , Christopher R. Muggli , Martin Rockwell , Ira G. Pollock
IPC分类号： G01N29/30 , G01N29/24 , G01R1/067 , G01R31/317
摘要： A probe, including a first input configured to receive a first input signal, a second input configured to receive a second input signal, a first cable connected to the first input, a second cable connected to the second input, an electronically adjustable delay connected to the first cable, the electronically adjustable delay configured to delay the first input signal to remove a skew between the first input signal and the second input signal, and an amplifier configured to receive the first input signal from the electronically adjustable delay and a second input signal.

29. 发明授权

US10041975B2 Automatic probe ground connection checking techniques 有权
公开(公告)号：US10041975B2
公开(公告)日：2018-08-07
申请号：US14949562
申请日：2015-11-23
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim , William A. Hagerup , Barton T. Hickman , Ira G. Pollock
IPC分类号： G01R1/067 , G01R31/02
摘要： A test system can include a probe suitable to be coupled between a test measurement device and a device under test (DUT). The probe can include a signal input to receive an active signal from the DUT and a signal output to provide the active signal to the test measurement device. The probe can also include an input ground to connect to the DUT ground and an output ground to connect to the test measurement device ground. A probe ground connection checking device can automatically determine whether the probe ground connections to the DUT ground and test measurement device ground are solid.

30. 发明授权

US09859908B2 Test and measurement instrument including asynchronous time-interleaved digitizer using harmonic mixing and a linear time-periodic filter 有权
公开(公告)号：US09859908B2
公开(公告)日：2018-01-02
申请号：US15347600
申请日：2016-11-09
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim
IPC分类号： H03M1/50 , H03M1/12 , G01R13/02 , G01R19/25
CPC分类号： H03M1/121 , G01R13/0236 , G01R13/0272 , G01R19/2506 , H03M1/1215
摘要： A test and measurement instrument, including a splitter configured to split an input signal having a particular bandwidth into a plurality of split signals, each split signal including substantially the entire bandwidth of the input signal, a plurality of harmonic mixers, each harmonic mixer configured to mix an associated split signal of the plurality of split signals with an associated harmonic signal to generate an associated mixed signal, a plurality of digitizers, each digitizer configured to digitize a mixed signal of an associated harmonic mixer of the plurality of harmonic mixers, and a linear time-periodic filter configured to receive the digitized mixed signal from each of the digitizers and output a time-interleaved signal. A first-order harmonic of at least one harmonic signal associated with the harmonic mixers is different from a sample rate of at least one of the digitizers.

你已经成功收藏专利！

检索式保存成功!

IPRDB

热门服务

关于我们

友情链接

联系方式