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    • 21. 发明授权
    • Fabrication of laser ablation masks by wet etching
    • 通过湿蚀刻制造激光烧蚀掩模
    • US5254202A
    • 1993-10-19
    • US864838
    • 1992-04-07
    • Leon H. Kaplan
    • Leon H. Kaplan
    • C04B41/53C04B41/91G03F1/54G03F1/80B44C1/22C03C15/00C03C25/06C23F1/00
    • C04B41/009C04B41/5353C04B41/91G03F1/54G03F1/80Y10T428/24331Y10T428/24917Y10T428/24926
    • Tantalum (or hafnium) oxide layers, alternated with silicon oxide layers in a dielectric stack reflector type mask for high power laser ablation, are wet etched at a high temperature with a highly caustic solution, preferably potassium hydroxide, to provide a much increased manufacturing yield in comparison with known processes such as ion milling. High feature density is achieved through the use of a resist which is built in two patterning steps. Preferably, a chromium layer is deposited and covered with an organic resist which is patterned by an optical or electron beam exposure. The chromium is then etched by means of the resist mask to form a resist for the caustic wet etch of the tantalum (or hafnium) oxide either separately or together with silicon oxide layers of the dielectric stack reflector mask to be used in the laser ablation process at high power.
    • 在用于大功率激光烧蚀的电介质堆叠反射器型掩模中与氧化硅层交替的钽(或铪)氧化物层在高温下用高苛性碱溶液(优选氢氧化钾)进行湿法蚀刻,以提供大大提高的制造成品率 与已知的方法如离子研磨相比。 通过使用内置于两个图案化步骤中的抗蚀剂来实现高特征密度。 优选地,沉积铬层并用有机抗蚀剂覆盖,该有机抗蚀剂通过光学或电子束曝光被图案化。 然后通过抗蚀剂掩模蚀刻铬,以形成用于钽(或铪)氧化物的苛性湿法蚀刻的抗蚀剂,分别或与电介质堆叠反射器掩模的氧化硅层一起用于激光烧蚀过程 在高功率。
    • 22. 发明授权
    • Plastic mold decapsuling apparatus
    • 塑胶模具拆封装置
    • US4826556A
    • 1989-05-02
    • US199708
    • 1988-05-27
    • Nobutoshi Kobayashi
    • Nobutoshi Kobayashi
    • H01L21/00B44C1/22B29C37/00C03C15/00C03C25/06
    • H01L21/67126
    • A plastic mold decapsuling apparatus for decapsuling a plastic mold by feeding an etchant to the plastic mold comprises an etchant bottle; an etchant tank; a decapsuling plastic mold holder; an etchant feeding pump; and, in particular, a bell-shaped cover cap for shielding a plastic mold to be decapsuled on the mold holder from outside air to maintain pressure of the etchant fed by the etchant feeding pump. Since the plastic mold is shielded, even if the plastic mold is decapsuled, it is possible to maintain the etchant feeding pressure at a constant level without introducing outside air into the etchant recirculating passage, thus permitting a stable decapsuling treatment.
    • 一种用于通过向塑料模具馈入蚀刻剂来对塑料模具进行封装的塑料模具拆封装置包括蚀刻剂瓶; 蚀刻槽; 一个解封塑料模架; 蚀刻剂进料泵; 特别是用于屏蔽塑料模具的钟形盖帽,以从外部空气中将模具保持器解封装,以保持由蚀刻剂供给泵供给的蚀刻剂的压力。 由于塑料模具被屏蔽,即使塑料模具被开封,也可以将蚀刻剂进料压力保持在恒定水平,而不会将外部空气引入到蚀刻剂再循环通道中,从而允许稳定的解封装处理。
    • 23. 发明授权
    • Process of making via holes in a double-layer insulation
    • 在双层绝缘中制作通孔的工艺
    • US4816115A
    • 1989-03-28
    • US172738
    • 1988-03-23
    • Eva HornerReinhold MuhlHans-Joachim Trumpp
    • Eva HornerReinhold MuhlHans-Joachim Trumpp
    • H01L21/302H01L21/3065H01L21/311H01L21/3213H01L21/768B44C1/22B29C37/00C03C15/00C03C25/06
    • H01L21/31138H01L21/76804
    • A method of making via holes in a double-layer insulation of nitride and polyimide. The via holes are made with one photomask only by applying a photoresist process with double exposure, and a multi-step dry etching process. The double exposure, which includes an image-wise exposure followed by blanket irradiation, achieves an edge angle in the photoresist between approx. 60.degree. and 70.degree., depending on the exposure time ratios. This angle is transferred into the polyimide layer in a dry etching process. In a first etching step with CF.sub.4 as etching gas the greater part of the polyimide is removed. For removing the residual polyimide in the via holes there now follows an etching step in O.sub.2. Etch bias is thus kept on a very low level. The nitride layer is then etched with CF.sub.4 as etching gas, with the etching process being executed in two steps, each followed by an etching step in O.sub.2 for laterally shifting the photoresist and the polyimide via the resist angle. By softening the step height a softer profile of the via holes is ensured, which permits very good covering by a second layer of metallurgy.
    • 在氮化物和聚酰亚胺的双层绝缘中制造通孔的方法。 通孔仅通过使用双曝光的光致抗蚀剂工艺和多步骤干蚀刻工艺由一个光掩模制成。 包括曝光后进行成像曝光的双重曝光在光致抗蚀剂中达到约 60°和70°,取决于曝光时间比。 该干燥蚀刻工艺将该角度转移到聚酰亚胺层中。 在用CF 4作为蚀刻气体的第一蚀刻步骤中,去除了大部分聚酰亚胺。 为了去除通孔中的残余聚酰亚胺,现在在O 2中进行蚀刻步骤。 因此,蚀刻偏压保持在非常低的水平。 然后用CF4作为蚀刻气体蚀刻氮化物层,蚀刻过程分两步进行,随后在O 2中进行蚀刻步骤,以通过抗蚀剂角横向移动光致抗蚀剂和聚酰亚胺。 通过软化台阶高度,确保通孔的较软的轮廓,这允许通过第二层冶金进行非常好的覆盖。