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    • 53. 发明申请
    • Method for analyzing the reliability of optoelectronic elements rapidly
    • 快速分析光电元件可靠性的方法
    • US20070268038A1
    • 2007-11-22
    • US11594844
    • 2006-11-09
    • Yu-Zung Chiou
    • Yu-Zung Chiou
    • G01R31/26
    • G01R31/2635
    • A method for analyzing the reliability of optoelectronic elements rapidly is described, which has a spectrum analyzer to test and measure NEP and peak of noise power spectrum of the optoelectronic elements at the low frequency. The optoelectronic elements are imposed with the appropriate forward bias and reverse bias to generate alternate variable cycles of positive and negative currents. After appropriate iteration cycles, cycle time and duty cycles, the spectrum analyzer tests and measures the optoelectronic elements after the electrical cycle test to determine whether the NEP and peak of noise power spectrum of the optoelectronic elements at the low frequency are higher than those of optoelectronic elements without the electrical cycle test. The NEP and peak of noise power spectrum of the optoelectronic elements are then compared with the statistic standard deviation to find out the optoelectronic elements having some problems of the reliability.
    • 描述了一种快速分析光电元件可靠性的方法,该方法具有频谱分析仪,用于测试和测量低频下光电子元件的NEP和噪声功率谱峰值。 用适当的正向偏置和反向偏压施加光电元件,以产生正和负电流的可变周期。 在适当的迭代周期,周期时间和占空比之后,频谱分析仪在电循环测试后对光电子元件进行测试和测量,以确定低频光电元件的噪声功率谱的NEP和峰值是否高于光电子 元件无电循环测试。 然后将光电元件的噪声功率谱的NEP和峰值与统计标准偏差进行比较,以找出具有可靠性问题的光电元件。