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    • 56. 发明授权
    • Method and optical device for super-resolution localization of a particle
    • 用于粒子超分辨率定位的方法和光学装置
    • US09507134B2
    • 2016-11-29
    • US14234038
    • 2012-07-10
    • Xavier LevecqJordi Andilla
    • Xavier LevecqJordi Andilla
    • G02B27/58G02B21/00G02B26/06G02B23/26
    • G02B21/0004G01N21/6458G02B26/06G02B27/58
    • A super-resolution microscopy method includes forming an image of an emitting particle in a detection plane of a detector by a microscopy imaging system and correcting, by a wavefront-modulating device, at least some of the optical defects present between the emitting particle and the detection plane. The method further includes introducing, via the wavefront-modulating device, a deformation of the wavefront emitted by the emitting particle, of variable amplitude, allowing a bijective relationship to be formed between the shape of the image of the emitting particle in the detection plane and the axial position of the emitting particle relative to an object plane that is optically conjugated with the detection plane by the microscopy imaging system. The method further includes controlling the amplitude of the deformation of the wavefront by controlling the wavefront-modulating device, as a function of the given range of values of the axial position of the particle.
    • 超分辨率显微镜方法包括通过显微镜成像系统在检测器的检测平面中形成发射粒子的图像,并且通过波前调制装置校正存在于发射粒子和发射粒子之间的至少一些光学缺陷 检测平面。 该方法还包括通过波前调制装置引入由发射粒子发射的具有可变幅度的波前的变形,允许在检测平面中的发射粒子的图像的形状和 发射颗粒相对于通过显微镜成像系统与检测平面光学共轭的物平面的轴向位置。 该方法还包括通过控制波前调制装置来控制波前变形的幅度,作为粒子的轴向位置的给定范围值的函数。