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    • 1. 发明申请
    • PRECISION TEMPERATURE MEASUREMENT DEVICES, SENSORS, AND METHODS
    • 精密温度测量装置,传感器和方法
    • US20140140364A1
    • 2014-05-22
    • US14080625
    • 2013-11-14
    • DUST NETWORKS, INC.
    • Gordon Alexander CHARLESMark Alan LEMKIN
    • G01K15/00G01K7/01
    • G01K15/005G01K7/01
    • A precision temperature sensing system includes a heater and a sensing element disposed on a semiconductor substrate. A power source drives the heater on a periodic basis according to a received clock signal. The sensing element senses the heat emitted by the heater and diffused through the semiconductor substrate. Processing circuitry coupled to the sensing element adjusts a phase of the periodic heater driving signal based on the heat sensed by the sensing element. The processing circuitry determines a temperature based on a thermal diffusivity (TD) of the semiconductor substrate, the adjusted value of the phase, and a known distance between the heater and the sensing element. A second temperature sensor can be disposed on the same substrate as the precision temperature sensing system, and calibrated based on temperature measurements obtained while applying a reference frequency signal to the precision sensing system.
    • 精密温度感测系统包括加热器和设置在半导体衬底上的感测元件。 电源根据接收到的时钟信号周期性地驱动加热器。 感测元件感测加热器发出的热量并通过半导体衬底扩散。 耦合到感测元件的处理电路基于感测元件感测的热量调节周期性加热器驱动信号的相位。 处理电路基于半导体衬底的热扩散率(TD),相位的调节值以及加热器和感测元件之间的已知距离来确定温度。 第二温度传感器可以设置在与精密温度感测系统相同的衬底上,并且基于在将参考频率信号施加到精密感测系统时获得的温度测量来校准。
    • 3. 发明授权
    • Phase noise tolerant sampling
    • 相位容差采样
    • US08558728B1
    • 2013-10-15
    • US13559909
    • 2012-07-27
    • Mark Alan LemkinThor Nelson Juneau
    • Mark Alan LemkinThor Nelson Juneau
    • H03M1/50
    • H03L7/08G01R31/31709H03L7/18
    • Phase noise in a first clock signal is measured using a time to digital converter (TDC) by determining variations in the phase delay between the first clock signal and a second clock signal. The TDC can include first and second series interconnections of delay elements, first and second sets of latches, and processing circuitry coupled to the latches and configured to determine the phase delay. The TDC can include a series interconnection of delay elements, latches, and circuitry configured to selectively adjust the control signal connected to the delay elements based on the output of the latches. The phase noise measurement can be used in a sampling circuit, so as to produce a second data signal from a first data signal based on the first clock signal and the measured phase noise.
    • 通过确定第一时钟信号和第二时钟信号之间的相位延迟的变化,使用时间数字转换器(TDC)测量第一时钟信号中的相位噪声。 TDC可以包括延迟元件的第一和第二串联互连,第一和第二锁存器组以及耦合到锁存器并被配置为确定相位延迟的处理电路。 TDC可以包括延迟元件,锁存器和配置为基于锁存器的输出选择性地调整连接到延迟元件的控制信号的电路的串联互连。 可以在采样电路中使用相位噪声测量,以便基于第一时钟信号和所测量的相位噪声从第一数据信号产生第二数据信号。
    • 8. 发明授权
    • Anti-aliasing sampling circuits and analog-to-digital converter
    • 抗混叠采样电路和模数转换器
    • US08823572B2
    • 2014-09-02
    • US13717377
    • 2012-12-17
    • Dust Networks, Inc.
    • Mark Alan Lemkin
    • H03M1/12
    • H03M1/124H03M1/1245H03M1/468
    • A sampling circuit, such as the sampling circuit of a successive approximation analog-to-digital converter (ADC), provides anti-aliasing filtering of a sampled input signal. The circuit samples the input signal using multiple capacitors, wherein each capacitor samples the input signal at a distinct time during a sampling time interval. The circuit combines the samples stored on different capacitors during a conversion time interval, and generates a digital output signal using the combined samples. In one example, a first bit of the output signal is generated using a sample stored on a first capacitor, and second bit of the output signal is generated using a sample stored on a second capacitor. In another example, the circuitry performs finite or infinite impulse response (FIR or IIR) filtering of the input signal, where a filter characteristic is determined by the relative sizes of the capacitors used for sampling.
    • 诸如逐次逼近模数转换器(ADC)的采样电路的采样电路为采样的输入信号提供抗混叠滤波。 该电路使用多个电容对输入信号进行采样,其中每个电容器在采样时间间隔期间的不同时间对输入信号进行采样。 该电路在转换时间间隔期间组合存储在不同电容器上的样本,并使用组合样本生成数字输出信号。 在一个示例中,使用存储在第一电容器上的样本来产生输出信号的第一位,并且使用存储在第二电容器上的样本产生输出信号的第二位。 在另一示例中,电路对输入信号执行有限或无限脉冲响应(FIR或IIR)滤波,其中滤波器特性由用于采样的电容器的相对尺寸确定。