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    • 4. 发明授权
    • Producing spike-timing dependent plasticity in an ultra-dense synapse cross-bar array
    • 在超密集突触交叉阵列中产生尖峰时序依赖性可塑性
    • US08527438B2
    • 2013-09-03
    • US12645479
    • 2009-12-22
    • Bryan Lawrence JacksonDharmendra Shantilal ModhaBipin Rajendran
    • Bryan Lawrence JacksonDharmendra Shantilal ModhaBipin Rajendran
    • G06E1/00G06E3/00G06F15/18G06G7/00
    • G06N3/049G06N3/0635
    • Embodiments of the invention relate to producing spike-timing dependent plasticity in an ultra-dense synapse cross-bar array for neuromorphic systems. An aspect of the invention includes when an electronic neuron spikes, an alert pulse is sent from the spiking electronic neuron to each electronic neuron connected to the spiking electronic neuron. When the spiking electronic neuron sends the alert pulse, a gate pulse is sent from the spiking electronic neuron to each electronic neuron connected to the spiking electronic neuron. When each electronic neuron receives the alert pulse, a response pulse is sent from each electronic neuron receiving the alert pulse to the spiking electronic neuron. The response pulse is a function of time since a last spiking of the electronic neuron receiving the alert pulse. In addition, the combination of the gate pulse and response pulse is capable increasing or decreasing conductance of a variable state resistor.
    • 本发明的实施方案涉及在用于神经形态系统的超密集突触交叉阵列中产生尖峰时间依赖性可塑性。 本发明的一个方面包括当电子神经元尖峰时,警报脉冲从尖峰电子神经元发送到连接到尖峰电子神经元的每个电子神经元。 当尖峰电子神经元发出警报脉冲时,门脉冲从尖峰电子神经元发送到连接到尖峰电子神经元的每个电子神经元。 当每个电子神经元接收到警报脉冲时,从接收警报脉冲的每个电子神经元发送响应脉冲到尖峰电子神经元。 响应脉冲是从接收警报脉冲的电子神经元的最后一次尖峰起的时间的函数。 此外,门脉冲和响应脉冲的组合能够增加或降低可变状态电阻器的电导。
    • 6. 发明申请
    • TERNARY CONTENT ADDRESSABLE MEMORY USING PHASE CHANGE DEVICES
    • 使用相位变更设备的内容可寻址存储器
    • US20120120701A1
    • 2012-05-17
    • US13350823
    • 2012-01-16
    • Brian L. JiChung H. LamRobert K. MontoyeBipin Rajendran
    • Brian L. JiChung H. LamRobert K. MontoyeBipin Rajendran
    • G11C15/00
    • G11C15/046G11C13/0004
    • A content addressable memory device with a plurality of memory cells storing ternary data values of high, low, and don't care. An aspect of the content addressable memory device is the use of first memory elements and second memory elements in the memory cells. The first and second memory elements are electrically coupled in parallel circuit to a match-line. The first memory elements are coupled to first word-lines and the second memory elements are coupled to second word-lines. The first memory elements are configured to store low resistance states if the ternary data value is low and high resistance states if the ternary data value is either high or don't care. The second memory elements are configured to store the low resistance states if the ternary data value is high and the high resistance states if the ternary data value is either low or don't care.
    • 一种具有多个存储单元的内容可寻址存储器件,其存储高,低和不关心的三进制数据值。 内容可寻址存储器件的一个方面是在存储器单元中使用第一存储器元件和第二存储器元件。 第一和第二存储器元件以并联电路电耦合到匹配线。 第一存储器元件耦合到第一字线,并且第二存储器元件耦合到第二字线。 如果三进制数据值低,则第一存储器元件被配置为存储低电阻状态,并且如果三进制数据值高或不在乎,则高电阻状态。 如果三进制数据值高,则第二存储器元件被配置为存储低电阻状态,并且如果三进制数据值为低或不关心,则存在高电阻状态。
    • 7. 发明授权
    • Phase change memory with finite annular conductive path
    • 具有有限环形导电路径的相变存储器
    • US07965537B2
    • 2011-06-21
    • US12491816
    • 2009-06-25
    • Matthew J. BreitwischChung H. LamBipin Rajendran
    • Matthew J. BreitwischChung H. LamBipin Rajendran
    • G11C11/00
    • G11C13/0004G11C13/0069G11C2013/0083H01L45/06H01L45/1233H01L45/144H01L45/16Y10T29/49002
    • A phase change memory device and a method for programming the same. The method includes determining a maximum possible resistance for the memory cells in the phase change memory device. The method includes determining a high resistance state for the memory cells in the phase change memory device. The method includes receiving a request to program a target memory cell in the phase change memory device to the high resistance state. The method also includes resetting the target memory cell in the phase change memory device to the high resistance state such that the high resistance state of the target memory cell is of less resistance than the maximum possible resistance. In one embodiment of the invention, the high resistance state for the memory cells in the phase change memory device is at least 10% less than the maximum possible resistance.
    • 相变存储器件及其编程方法。 该方法包括确定相变存储器件中的存储器单元的最大可能电阻。 该方法包括确定相变存储器件中存储单元的高电阻状态。 该方法包括接收将相变存储器件中的目标存储单元编程为高电阻状态的请求。 该方法还包括将相变存储器件中的目标存储单元重置为高电阻状态,使得目标存储单元的高电阻状态的阻抗比最大可能的电阻小。 在本发明的一个实施例中,相变存储器件中的存储单元的高电阻状态比最大可能电阻小至少10%。
    • 9. 发明申请
    • HARDWARE ANALOG-DIGITAL NEURAL NETWORKS
    • 硬件模拟数字神经网络
    • US20110119215A1
    • 2011-05-19
    • US12618101
    • 2009-11-13
    • Bruce G. ElmegreenRalph LinskerDennis M. NewnsBipin Rajendran
    • Bruce G. ElmegreenRalph LinskerDennis M. NewnsBipin Rajendran
    • G06N3/06
    • G06N3/0635G06N3/063
    • An analog-digital crosspoint-network includes a plurality of rows and columns, a plurality of synaptic nodes, each synaptic node of the plurality of synaptic nodes disposed at an intersection of a row and column of the plurality of rows and columns, wherein each synaptic node of the plurality of synaptic nodes includes a weight associated therewith, a column controller associated with each column of the plurality of columns, wherein each column controller is disposed to enable a weight change at a synaptic node in communication with said column controller, and a row controller associated with each row of the plurality of rows, wherein each row controller is disposed to control a weight change at a synaptic node in communication with said row controller.
    • 模拟数字交叉点网络包括多个行和列,多个突触节点,多个突触节点中的每个突触节点设置在多个行和列的行和列的交点处,其中每个突触 所述多个突触节点的节点包括与其相关联的权重,与所述多个列中的每列相关联的列控制器,其中每个列控制器被设置为使能与所述列控制器通信的突触节点处的权重变化,以及 与多个行的每一行相关联的行控制器,其中每个行控制器被设置为控制与所述行控制器通信的突触节点处的权重变化。