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    • 2. 发明授权
    • In system diagnostics through scan matrix
    • 通过扫描矩阵进行系统诊断
    • US07870448B2
    • 2011-01-11
    • US11958468
    • 2007-12-18
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • G01R31/3177G01R31/40
    • G06F11/267G01R31/318555
    • A method of in system diagnostics through scan matrix, and an integrated circuit chip in which the diagnostics are performed, are disclosed. The integrated circuit chip operable in a plurality of Boundary Scan test modes in which at least a part of the circuitry in the integrated circuit chip is tested, the integrated circuit chip comprises a scan matrix controller and an instruction register. The scan matrix controller is provided for partitioning said circuitry into multiple matrices, each of the matrices having a plurality of scan elements. The instruction register is provided for holding instructions for the scan matrix controller for partitioning the chip into said multiple matrices. The scan matrix controller is further arranged to test each of said matrices according to instructions in the instruction register by applying a test signal to the tested part of the circuitry.
    • 公开了一种通过扫描矩阵进行系统诊断的方法,以及执行诊断的集成电路芯片。 所述集成电路芯片可操作在多个边界扫描测试模式中,其中所述集成电路芯片中的至少一部分电路被测试,所述集成电路芯片包括扫描矩阵控制器和指令寄存器。 提供扫描矩阵控制器用于将所述电路划分成多个矩阵,每个矩阵具有多个扫描元件。 提供指令寄存器用于保持扫描矩阵控制器的指令,用于将芯片划分为所述多个矩阵。 扫描矩阵控制器还被布置为通过将测试信号施加到电路的测试部分来根据指令寄存器中的指令来测试每个所述矩阵。
    • 4. 发明申请
    • METHOD AND SYSTEM FOR AUTOMATICALLY ACCESSING INTERNAL SIGNALS OR PORTS IN A DESIGN HIERARCHY
    • 用于在设计层次上自动访问内部信号或端口的方法和系统
    • US20090158225A1
    • 2009-06-18
    • US11955689
    • 2007-12-13
    • Jayashri Arsikere BasappaSandeep Niranjan TippannanavarVenkatasreekanth Prudvi
    • Jayashri Arsikere BasappaSandeep Niranjan TippannanavarVenkatasreekanth Prudvi
    • G06F17/50
    • G06F17/5045
    • A method is disclosed that employs a hierarchical path database generator for accessing internal signal or port names in a design hierarchy of an integrated circuit design. The method comprises the steps of inputting design files into the hierarchical path database generator; and said hierarchical path database generator determining ports and signals in said design files, and storing the names of said ports and signals in a hierarchical database in a logical hierarchical order. The method comprises the further steps of providing a testcase to verify a defined aspect of the integrated circuit design; parsing the testcase to identify all signal and port names therein; and for each of the signal and port names identified in the testcase, inputting said each name into the hierarchical path database generator, and obtaining from that generator a hierarchical path associated with said each signal and port name.
    • 公开了一种采用分层路径数据库生成器来访问集成电路设计的设计层级中的内部信号或端口名称的方法。 该方法包括将设计文件输入到分层路径数据库生成器中的步骤; 并且所述分级路径数据库生成器确定所述设计文件中的端口和信号,并且以逻辑层级顺序将所述端口和信号的名称存储在分层数据库中。 该方法还包括提供测试用例以验证集成电路设计的定义方面的步骤; 解析测试用例以识别其中的所有信号和端口名称; 并且对于在测试用例中识别的每个信号和端口名称,将所述每个名称输入到分层路径数据库生成器中,并从该生成器获得与所述每个信号和端口名称相关联的分层路径。
    • 5. 发明申请
    • IN SYSTEM DIAGNOSTICS THROUGH SCAN MATRIX
    • 通过扫描矩阵进行系统诊断
    • US20090158105A1
    • 2009-06-18
    • US11958468
    • 2007-12-18
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • Baalaji Ramamoorthy KondaKenneth PichamuthuJayashri Arsikere BasappaAnil Pothireddy
    • G01R31/3185G06F11/26
    • G06F11/267G01R31/318555
    • A method of in system diagnostics through scan matrix, and an integrated circuit chip in which the diagnostics are performed, are disclosed. The integrated circuit chip operable in a plurality of Boundary Scan test modes in which at least a part of the circuitry in the integrated circuit chip is tested, the integrated circuit chip comprises a scan matrix controller and an instruction register. The scan matrix controller is provided for partitioning said circuitry into multiple matrices, each of the matrices having a plurality of scan elements. The instruction register is provided for holding instructions for the scan matrix controller for partitioning the chip into said multiple matrices. The scan matrix controller is further arranged to test each of said matrices according to instructions in the instruction register by applying a test signal to the tested part of the circuitry.
    • 公开了一种通过扫描矩阵进行系统诊断的方法,以及执行诊断的集成电路芯片。 所述集成电路芯片可操作在多个边界扫描测试模式中,其中所述集成电路芯片中的至少一部分电路被测试,所述集成电路芯片包括扫描矩阵控制器和指令寄存器。 提供扫描矩阵控制器用于将所述电路划分成多个矩阵,每个矩阵具有多个扫描元件。 提供指令寄存器用于保持扫描矩阵控制器的指令,用于将芯片划分为所述多个矩阵。 扫描矩阵控制器还被布置为通过将测试信号施加到电路的测试部分来根据指令寄存器中的指令来测试每个所述矩阵。
    • 6. 发明授权
    • Method and system for automatically accessing internal signals or ports in a design hierarchy
    • 自动访问设计层级结构内部信号或端口的方法和系统
    • US08001503B2
    • 2011-08-16
    • US11955689
    • 2007-12-13
    • Jayashri Arsikere BasappaSandeep Niranjan TippannanavarVenkatasreekanth Prudvi
    • Jayashri Arsikere BasappaSandeep Niranjan TippannanavarVenkatasreekanth Prudvi
    • G06F17/50
    • G06F17/5045
    • A method is disclosed that employs a hierarchical path database generator for accessing internal signal or port names in a design hierarchy of an integrated circuit design. The method comprises the steps of inputting design files into the hierarchical path database generator; and said hierarchical path database generator determining ports and signals in said design files, and storing the names of said ports and signals in a hierarchical database in a logical hierarchical order. The method comprises the further steps of providing a testcase to verify a defined aspect of the integrated circuit design; parsing the testcase to identify all signal and port names therein; and for each of the signal and port names identified in the testcase, inputting said each name into the hierarchical path database generator, and obtaining from that generator a hierarchical path associated with said each signal and port name.
    • 公开了一种采用分层路径数据库生成器来访问集成电路设计的设计层级中的内部信号或端口名称的方法。 该方法包括将设计文件输入到分层路径数据库生成器中的步骤; 并且所述分级路径数据库生成器确定所述设计文件中的端口和信号,并且以逻辑层级顺序将所述端口和信号的名称存储在分层数据库中。 该方法还包括提供测试用例以验证集成电路设计的定义方面的步骤; 解析测试用例以识别其中的所有信号和端口名称; 并且对于在测试用例中识别的每个信号和端口名称,将所述每个名称输入到分层路径数据库生成器中,并从该生成器获得与所述每个信号和端口名称相关联的分层路径。