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    • 1. 发明申请
    • DOUBLE-SIDED LIGHT-COLLECTING ORGANIC SOLAR CELL
    • 双面收集有机太阳能电池
    • US20120118366A1
    • 2012-05-17
    • US13387613
    • 2010-07-07
    • Jea-Gun ParkSu-Hwan LeeJi-Heon KimDal-Ho Kim
    • Jea-Gun ParkSu-Hwan LeeJi-Heon KimDal-Ho Kim
    • H01L51/44
    • H01L27/302
    • Disclosed is a double-sided light-collecting organic solar cell. The double-sided light-collecting organic solar cell comprises: a first light-transmitting electrode; a first photoactive layer disposed on the first light-transmitting electrode; a reflective electrode disposed on the first photoactive layer; a second photoactive layer disposed on the reflective electrode; and a second light-transmitting electrode disposed on the second photoactive layer. According to the present invention, photoactive layers are formed on both sides of a reflective electrode in the middle, and light-transmitting electrodes are formed to enable light to be absorbed at both sides of a cell, to increase the light absorption of the cell and enable the production of a highly efficient organic solar cell.
    • 公开了一种双面收光有机太阳能电池。 双面收集有机太阳能电池包括:第一透光电极; 设置在第一透光电极上的第一光敏层; 设置在所述第一光活性层上的反射电极; 设置在反射电极上的第二光敏层; 以及设置在所述第二光活性层上的第二透光电极。 根据本发明,在中间的反射电极的两侧形成光敏层,并且形成透光电极以使光能够在电池的两侧被吸收,以增加电池的光吸收, 能够生产高效的有机太阳能电池。
    • 3. 发明授权
    • Silicon wafers having controlled distribution of defects, and methods of preparing the same
    • 具有受控的缺陷分布的硅晶片及其制备方法
    • US06485807B1
    • 2002-11-26
    • US09702503
    • 2000-10-31
    • Jea-gun Park
    • Jea-gun Park
    • C30B2906
    • C30B15/206C30B15/14C30B15/203C30B29/06C30B33/00H01L21/3225Y10S117/911Y10T117/1068Y10T117/1072Y10T117/1088Y10T428/21
    • A silicon wafer is provided having controlled distribution of defects, in which denuded zones having a sufficient depth inward from the surface of the wafer are combined with a high gettering effect in a bulk region of the wafer. In the silicon wafer, oxygen precipitates, which act as intrinsic gettering sites, show vertical distribution. The oxygen precipitate concentration profile from the top to the bottom surfaces of the wafer includes first and second peaks at first and second predetermined depths from the top and bottom surfaces of the wafer, denuded zones between the top and bottom surfaces of the wafer and each of the first and second peaks, and a concave region between the first and second peaks, which corresponds to a bulk region of the wafer. For such an oxygen precipitate concentration profile, the wafer is exposed to a rapid thermal annealing process in a gas mixture atmosphere containing nitrogen (N2) and argon (Ar) or N2 and hydrogen (H2), in a donor killing step during a wafering process.
    • 提供了具有受控的缺陷分布的硅晶片,其中具有从晶片表面向内的足够深度的裸露区域在晶片的主体区域中与高吸杂效应组合。 在硅晶片中,作为固有吸气部位的氧析出物显示垂直分布。 从晶片的顶表面到底表面的氧沉淀浓度分布包括在晶片的顶表面和底表面的第一和第二预定深度处的第一和第二峰,在晶片的顶表面和底表面之间的裸露区域 第一和第二峰,以及在第一和第二峰之间的对应于晶片的体区的凹区。 对于这种氧沉淀物浓度分布,在晶片化过程中,在供体杀死步骤中,将晶片暴露于含氮(N 2)和氩(Ar)或N 2和氢(H 2)的气体混合气体中的快速热退火工艺 。