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    • 7. 发明授权
    • Assessment of patient support systems
    • 评估病人支援系统
    • US06220088B1
    • 2001-04-24
    • US08624522
    • 1996-06-06
    • John Tracey ScalesDuncan Shirreffs Bain
    • John Tracey ScalesDuncan Shirreffs Bain
    • G01N100
    • G01M99/00A47C31/123A47C31/126G01N3/40G01N2203/0246G09B23/32
    • A method and equipment for assessing the suitability of support surfaces such as mattresses and chairs is disclosed. The method comprises applying a load to each of two such support surfaces with a first indenter having a given profile and a substantially rigid form and measuring the interface pressure, applying the same load to each said surface with a second indenter having substantially the same profile as said first indenter, but having a viscoelastic form and measuring the interface pressure and deriving information as to the characteristics of the supporting surfaces by comparing said measurements. The invention also includes a human phantom for use in testing or comparing support surfaces which comprises a buttocks portion representing the human buttocks and comprising substantially rigid pelvic and femoral parts and a viscoelastic member covering said pelvic and femoral parts, said buttocks portion being pivotably linked to a torso and head portion and the phantom includes means to maintain the torso portion in a plurality of angular positions with respect to the pelvic and femoral parts while making interfacial pressure measurements.
    • 公开了一种用于评估诸如床垫和椅子之类的支撑表面的适用性的方法和设备。 该方法包括使用具有给定轮廓和基本上刚性形状的第一压头施加负载,并测量界面压力,并用第二压头施加与每个所述表面相同的载荷,所述第二压头具有与 所述第一压头,但是具有粘弹性形式并且通过比较所述测量值来测量界面压力并得出关于支撑表面的特性的信息。 本发明还包括用于测试或比较支撑表面的人体模型,其包括表示人类臀部的臀部部分,并且包括基本上刚性的骨盆和股骨部分以及覆盖所述骨盆和股骨部分的粘弹性部件,所述臀部部分可枢转地连接到 躯体和头部,并且体模包括在进行界面压力测量时将躯干部分相对于骨盆和股骨部分保持在多个角位置的装置。
    • 9. 发明申请
    • Structure and Method For Forming Laterally Extending Dielectric Layer in a Trench-Gate FET
    • 在沟槽栅FET中形成横向延伸介质层的结构和方法
    • US20110031551A1
    • 2011-02-10
    • US12907805
    • 2010-10-19
    • John Tracey Andrews
    • John Tracey Andrews
    • H01L29/78H01L21/28
    • H01L29/66734H01L29/407H01L29/42368H01L2924/0002H01L2924/00
    • A FET is formed as follows. A trench is formed in a silicon region. A shield electrode is formed in a bottom portion of the trench. The shield electrode is insulated from adjacent silicon region by a shield dielectric. A silicon nitride layer is formed over a surface of the silicon region adjacent the trench, along the trench sidewalls, and over the shield electrode and shield dielectric. A layer of LTO is formed over the silicon nitride layer such that those portions of the LTO layer extending over the surface of the silicon region adjacent the trench are thicker than the portion of the LTO layer extending over the shield electrode. The LTO layer is uniformly etched back such that a portion of the silicon nitride layer becomes exposed while portions of the silicon nitride layer remain covered.
    • 如下形成FET。 在硅区域形成沟槽。 屏蔽电极形成在沟槽的底部。 屏蔽电极通过屏蔽电介质与相邻硅区绝缘。 氮化硅层形成在与沟槽相邻的硅区域的表面上,沿着沟槽侧壁,以及屏蔽电极和屏蔽电介质之上。 在氮化硅层上形成一层LTO,使得在与沟槽相邻的硅区域的表面上延伸的LTO层的那些部分比在屏蔽电极上延伸的LTO层的部分更厚。 LTO层被均匀地回蚀,使得氮化硅层的一部分暴露,同时氮化硅层的一部分保持被覆盖。