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    • 1. 发明授权
    • Method for plasma etching of positively sloped structures
    • 正倾斜结构的等离子体蚀刻方法
    • US07829465B2
    • 2010-11-09
    • US11834127
    • 2007-08-06
    • Shouliang LaiKen MackenzieDavid Johnson
    • Shouliang LaiKen MackenzieDavid Johnson
    • H01L21/301H01L21/461
    • B81C1/00626B81C2201/0132H01L21/30655
    • The present invention provides a method of etching features in a substrate. The method comprising the steps of placing the substrate on a substrate support in a vacuum chamber. An alternatingly and repeating process is performed on the substrate until a predetermined trench depth and a predetermined sidewall angle are achieved. One part of the process is a deposition step which is carried out by introducing at least one polymer containing gas into the vacuum chamber. A plasma is ignited from the polymer containing gas which is then used to deposit a polymer on the substrate. The other part of the alternatingly and repeating process is an etching step which is carried out by introducing an etchant containing gas, a polymer containing gas and a scavenger containing gas into the vacuum chamber. A plasma is ignited from the etchant containing gas, the polymer containing gas and the scavenger containing gas which is then used to etch the substrate.
    • 本发明提供一种蚀刻衬底中的特征的方法。 该方法包括以下步骤:将基板放置在真空室中的基板支撑件上。 在基板上进行交替重复的处理,直到实现预定的沟槽深度和预定的侧壁角。 该方法的一部分是沉积步骤,其通过将至少一种含聚合物的气体引入真空室来进行。 等离子体从含聚合物的气体点燃,然后将其用于在基底上沉积聚合物。 交替重复工艺的另一部分是蚀刻步骤,其通过将含蚀刻剂的气体,含有气体的聚合物和含有气体的清除剂引入真空室来进行。 等离子体从含蚀刻剂的气体中点燃,含聚合物的气体和含有清除剂的气体,然后用于蚀刻衬底。
    • 2. 发明申请
    • Method for Plasma Etching of Positively Sloped Structures
    • 积极斜坡结构等离子体蚀刻方法
    • US20080061029A1
    • 2008-03-13
    • US11834127
    • 2007-08-06
    • Shouliang LaiKen MackenzieDavid Johnson
    • Shouliang LaiKen MackenzieDavid Johnson
    • B44C1/22
    • B81C1/00626B81C2201/0132H01L21/30655
    • The present invention provides a method of etching features in a substrate. The method comprising the steps of placing the substrate on a substrate support in a vacuum chamber. An alternatingly and repeating process is performed on the substrate until a predetermined trench depth and a predetermined sidewall angle are achieved. One part of the process is a deposition step which is carried out by introducing at least one polymer containing gas into the vacuum chamber. A plasma is ignited from the polymer containing gas which is then used to deposit a polymer on the substrate. The other part of the alternatingly and repeating process is an etching step which is carried out by introducing an etchant containing gas, a polymer containing gas and a scavenger containing gas into the vacuum chamber. A plasma is ignited from the etchant containing gas, the polymer containing gas and the scavenger containing gas which is then used to etch the substrate.
    • 本发明提供一种蚀刻衬底中的特征的方法。 该方法包括以下步骤:将基板放置在真空室中的基板支撑件上。 在基板上进行交替重复的处理,直到实现预定的沟槽深度和预定的侧壁角。 该方法的一部分是沉积步骤,其通过将至少一种含聚合物的气体引入真空室来进行。 等离子体从含聚合物的气体点燃,然后将其用于在基底上沉积聚合物。 交替重复工艺的另一部分是蚀刻步骤,其通过将含蚀刻剂的气体,含有气体的聚合物和含有气体的清除剂引入真空室来进行。 等离子体从含蚀刻剂的气体中点燃,含聚合物的气体和含有清除剂的气体,然后用于蚀刻衬底。