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    • 4. 发明申请
    • Integral metal structure with conductive post portions
    • 具有导电柱部分的整体金属结构
    • US20100187665A1
    • 2010-07-29
    • US12321833
    • 2009-01-26
    • Robert O. Conn
    • Robert O. Conn
    • H01L23/48H01L21/302H01L21/31
    • H01L23/50H01L2924/0002H01L2924/00
    • A plurality of FPGA dice is disposed upon a semiconductor substrate. In order to supply the immense power required by the plurality of FPGA dice, power is routed through the semiconductor substrate vertically from thick metal layers and large integral metal structures located on the other side of the semiconductor substrate. Because the semiconductor substrate has a different coefficient of thermal linear expansion than metal layers in contact with the substrate, delamination may occur when the structure is subject to changes in temperature. To prevent delamination of metal layers connected to the semiconductor substrate and in electrical contact with the integral metal structures, the integral metal structures are manufactured with an array of post portions. During changes in temperature, the post portions of the integral metal structures bend and slide relative to metal layers connected to the semiconductor substrate and prevent linear stresses that may otherwise cause delamination.
    • 多个FPGA管芯设置在半导体衬底上。 为了提供多个FPGA芯片所需的巨大功率,功率从位于半导体衬底另一侧的厚金属层和大的整体金属结构垂直地穿过半导体衬底。 由于半导体衬底与与衬底接触的金属层具有不同的热线性膨胀系数,所以当结构经受温度变化时,可能发生分层。 为了防止与半导体衬底连接并与整体金属结构电接触的金属层的分层,整体金属结构被制成具有一定数量的柱部分。 在温度变化期间,整体金属结构的后部相对于连接到半导体衬底的金属层弯曲和滑动,并且防止否则会引起分层的线性应力。
    • 8. 发明授权
    • Tuning programmable logic devices for low-power design implementation
    • 调整可编程逻辑器件,实现低功耗设计
    • US07549139B1
    • 2009-06-16
    • US10783216
    • 2004-02-20
    • Tim TuanJan L. deJongKameswara K. RaoRobert O. Conn
    • Tim TuanJan L. deJongKameswara K. RaoRobert O. Conn
    • G06F17/50H03K19/00
    • H03K19/17784G11C5/14H03K3/356173H03K19/0016H03K19/17792
    • A method of operating a programmable logic device includes the steps of using a full VDD supply voltage to operate a first set of active blocks of the programmable logic device, and using a reduced supply voltage (e.g., 0.9 VDD) to operate a second set of active blocks of the programmable logic device. A timing analysis is performed to determine the maximum available timing slack in each active block. Active blocks having a smaller timing slack are grouped in the first set, and are coupled to receive the full VDD supply voltage. Active blocks having a larger timing slack are grouped in the second set, and are coupled to receive the reduced VDD supply voltage. As a result, the active blocks in the second set exhibit reduced power consumption, without adversely affecting the overall speed of the programmable logic device.
    • 一种操作可编程逻辑器件的方法包括以下步骤:使用完整的VDD电源电压来操作可编程逻辑器件的第一组有源块,并使用降低的电源电压(例如,0.9Vd)来操作第二组 可编程逻辑器件的有源块。 执行时序分析以确定每个活动块中的最大可用时序松弛。 具有较小定时松弛的有源块被分组在第一组中,并且被耦合以接收完整的VDD电源电压。 具有较大定时松弛的有源块被分组在第二组中,并被耦合以接收降低的VDD电源电压。 结果,第二组中的活动块表现出降低的功耗,而不会对可编程逻辑器件的总速度产生不利影响。