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    • 1. 发明授权
    • USB device with secondary USB on-the-go function
    • 具有辅助USB即插即用功能的USB设备
    • US07413129B2
    • 2008-08-19
    • US10954777
    • 2004-09-30
    • Serge Fruhauf
    • Serge Fruhauf
    • G06K19/06
    • G06F13/385
    • A USB device includes first and second communications ports and a processor operable for configuring the first communications port for connecting to a USB host and configuring the second communications port as a USB master connecting to a USB slave device. The processor can be formed as a USB device controller operatively connected to the first communications port and USB On-The-Go device controller operatively connected to a second communications port for creating a point-to-point connection to the USB slave device.
    • USB设备包括第一和第二通信端口以及可操作用于配置用于连接到USB主机的第一通信端口并将第二通信端口配置为连接到USB从设备的USB主机的处理器。 处理器可以形成为可操作地连接到第一通信端口的USB设备控制器和可操作地连接到第二通信端口的USB On-The-Go设备控制器,用于创建到USB从设备的点对点连接。
    • 3. 发明授权
    • Universal serial bus (USB) smart card having enhanced testing features and related system, integrated circuit, and methods
    • 通用串行总线(USB)智能卡具有增强的测试功能和相关系统,集成电路和方法
    • US07181649B2
    • 2007-02-20
    • US10434820
    • 2003-05-09
    • Serge FruhaufTaylor J. LeamingAlain C. Pomet
    • Serge FruhaufTaylor J. LeamingAlain C. Pomet
    • G06F11/00
    • G06K7/10465G06K7/0008G06K7/0095G06K19/07G06K19/07733
    • An integrated circuit for a smart card may include a universal serial bus (USB) transceiver for communicating with a USB host device, and a microprocessor connected to the USB transceiver and operable in a test mode and a user mode. When in the test mode, the microprocessor may perform a test operation based upon receiving at least one test vendor specific request (VSR) from the USB host device via the at least one USB transceiver. By way of example, the test operation may include scan testing the microprocessor's control logic, detecting a status of at least one buffer and communicating the status to the USB host device, writing test data to at least one designated buffer and sending the test data from the at least one designated buffer to the USB host device, and/or operating with reduced power.
    • 用于智能卡的集成电路可以包括用于与USB主机设备通信的通用串行总线(USB)收发器和连接到USB收发器的微处理器,并且可以在测试模式和用户模式下操作。 当处于测试模式时,微处理器可以经由至少一个USB收发器从USB主机设备接收至少一个测试供应商特定请求(VSR)来执行测试操作。 作为示例,测试操作可以包括对微处理器的控制逻辑进行扫描测试,检测至少一个缓冲器的状态并将状态传送到USB主机设备,将测试数据写入至少一个指定的缓冲器,并将测试数据从 所述至少一个指定的缓冲器到达所述USB主机设备,和/或以降低的功率运行。
    • 7. 发明申请
    • METHOD AND APPARATUS FOR A USB AND CONTACTLESS SMART CARD DEVICE
    • USB和无连接智能卡设备的方法和装置
    • US20070175994A1
    • 2007-08-02
    • US11733528
    • 2007-04-10
    • Serge Fruhauf
    • Serge Fruhauf
    • G06K7/00G06K7/08
    • G06K19/07739G06K19/077G06K19/07733G06K19/07769
    • An apparatus for a Universal Serial Bus (USB) and wireless smart card is provided. The apparatus includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. Furthermore, an apparatus for a triple-mode smart card is also provided herein. The apparatus for the triple mode smart card includes a mode detection circuit, a switching block, a controller, an antenna, and a wired interface. The apparatus for the triple mode smart card operates in one of a wireless mode, a USB mode and an International Standards Organization 7816 mode or other wired mode. Furthermore, the apparatus for any of these smart cards could operate in both the wireless and wired mode(s) without conflict, and without switching power off and on to change configuration.
    • 提供了一种用于通用串行总线(USB)和无线智能卡的装置。 该装置包括模式检测电路,切换块,控制器,天线和有线接口。 此外,本文还提供了一种用于三模式智能卡的装置。 用于三重模式智能卡的装置包括模式检测电路,切换块,控制器,天线和有线接口。 用于三模式智能卡的装置以无线模式,USB模式和国际标准组织7816模式或其他有线模式中的一种操作。 此外,用于任何这些智能卡的装置可以在无冲突的情​​况下以无线和有线模式工作,并且不断开和断电以改变配置。
    • 8. 发明授权
    • Detector of fast variation in the supply of integrated circuits
    • 集成电路供应中快速变化的检测器
    • US5144515A
    • 1992-09-01
    • US624336
    • 1990-12-07
    • Serge FruhaufFreeric Breugnot
    • Serge FruhaufFreeric Breugnot
    • G01R19/12G06F11/00G06K19/073G11C5/14
    • G06K19/0701G01R19/12G06F11/00G06K19/073G11C5/143
    • Some integrated circuits need to be protected against malfunctioning due to the variations in the supply voltage Vcc. A detector of fast variations of the supply voltage is placed in the integrated circuit to interrupt or modify all or a part of the working of the general integrated circuit in the event of the occurrence of fast variation in Vcc. The detector includes a capacitor, a current limiter, a charging circuit, and a detection transistor. The current limiter is a transistor mounted as a diode. The charging circuit uses the supply voltage to charge the capacitor through the current limiter. The relatively stable voltage of the capacitor is applied to the gate of the detection transistor, which has a threshold voltage Vtp. The source of the detection transistor is connected to the voltage supply Vcc. If Vcc varies suddenly, the detector is made conductive. The assembly uses the difference between the threshold voltage Vtn of the current limiter and the threshold voltage Vtp of the detection transistor.
    • 由于电源电压Vcc的变化,需要保护某些集成电路免受故障的影响。 在Vcc发生快速变化的情况下,电源电压快速变化的检测器被放置在集成电路中以中断或修改通用集成电路的全部或一部分工作。 检测器包括电容器,限流器,充电电路和检测晶体管。 电流限制器是作为二极管安装的晶体管。 充电电路使用电源电压通过限流器对电容器充电。 电容器的相对稳定的电压被施加到具有阈值电压Vtp的检测晶体管的栅极。 检测晶体管的源极连接到电压源Vcc。 如果Vcc突然变化,则检测器导通。 组件使用限流器的阈值电压Vtn与检测晶体管的阈值电压Vtp之间的差。
    • 9. 发明授权
    • Electrically programmable non-volatile memory having sequentially
deactivated write circuits
    • 电可编程的非易失性存储器具有顺序取消写入电路
    • US4860258A
    • 1989-08-22
    • US110274
    • 1987-10-20
    • Serge FruhaufAlexis Marquot
    • Serge FruhaufAlexis Marquot
    • G11C17/00G11C16/10G11C16/26
    • G11C16/10G11C16/26
    • An electrically programmable non-volatile memory includes a matrix of memory cells accessible by rows and columns, write and read circuits which apply potentials, representing the programmed datum or representing the read command, to the rows and columns. The memory also includes a device which controls the interconnection of the write and read circuits with the memory cells, wherein N memory cells are programmed simultaneously, N being greater than 1, each memory cell setting up a current surge when it is programmed at "1". The memory also includes a device for deactivating, one by one, the write circuits corresponding to the N memory cells where there is a change-over from a programming mode to a read mode, and a structure to short-circuit the deactivation device at the change-over to the programming mode.
    • 电可编程非易失性存储器包括可由行和列访问的存储器单元的矩阵,写入和读取电路,其将表示编程的数据或表示读取命令的电位施加到行和列。 存储器还包括控制写入和读取电路与存储器单元的互连的装置,其中N个存储器单元被同时编程,N大于1,每个存储器单元在编程为“1”时设置电流浪涌 “。 存储器还包括用于逐个去激活对应于从编程模式到读取模式的转换的N个存储器单元的写入电路的装置,以及用于将停用装置短路的结构 切换到编程模式。
    • 10. 发明授权
    • MOS technology voltage switch-over circuit
    • MOS技术电压切换电路
    • US4835423A
    • 1989-05-30
    • US122445
    • 1987-11-19
    • Gerard S. de FerronSerge Fruhauf
    • Gerard S. de FerronSerge Fruhauf
    • G06F3/02H03K17/10H03K17/693
    • H03K17/102H03K17/693
    • A voltage switch-over circuit, depending on a switch-over signal, delivers either a first voltage Vpp or a second voltage Vcc at its output, the voltage Vpp being greater than the voltage Vcc. The said circuit consists of a first MOS transistor with one of its electrodes connected to the voltage Vcc and a set of two series-connected MOS transistors with one of their electrodes connected to the voltage Vpp and with their two gates connected together so as to create a floating node at the common point between the two MOS transistors, the other electrode of the first MOS transistor and the other electrode of the set of two MOS transistors being connected together, and the gates of the first MOS transistor and those of the set of two MOS transistors respectively receiving the switch-over signal and the reverse switch-over signal.
    • 根据切换信号的电压切换电路在其输出处提供第一电压Vpp或第二电压Vcc,电压Vpp大于电压Vcc。 所述电路包括一个第一MOS晶体管,其一个电极连接到电压Vcc,一组两个串联连接的MOS晶体管,其一个电极连接到电压Vpp,其两个栅极连接在一起,以产生 在两个MOS晶体管之间的公共点处的浮动节点,第一MOS晶体管的另一个电极和两个MOS晶体管的另一个电极连接在一起,并且第一MOS晶体管的栅极和 分别接收切换信号和反向切换信号的两个MOS晶体管。