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1. 发明授权

US08314468B2 Variable ring width SDD 有权
标题翻译：可变环宽SDD
公开(公告)号：US08314468B2
公开(公告)日：2012-11-20
申请号：US12617313
申请日：2009-11-12
申请人： Derek Hullinger , Hideharu Matsuura , Kazuo Taniguchi , Tadashi Utaka
发明人： Derek Hullinger , Hideharu Matsuura , Kazuo Taniguchi , Tadashi Utaka
IPC分类号： H01L31/115
CPC分类号： G01T1/2928 , H01L31/115
摘要： A silicon drift detector (SDD) comprising electrically isolated rings. The rings can be individually biased doped rings. One embodiment includes an SDD with a single doped ring. Some of the doped rings may not require a bias voltage. Some of the rings can be field plate rings. The field plate rings may all use the same biasing voltage as a single outer doped ring. The ring widths can vary such that the outermost ring is widest and the ring widths decrease with each subsequent ring towards the anode.
摘要翻译：包括电隔离环的硅漂移检测器（SDD）。环可以是单独偏置的掺杂环。一个实施例包括具有单个掺杂环的SDD。掺杂环中的一些可能不需要偏置电压。一些环可以是场板环。场板环可以使用与单个外掺杂环相同的偏置电压。环宽度可以变化，使得最外面的环是最宽的，并且环宽度随着每个随后的环朝向阳极而减小。

2. 发明申请

US20100314706A1 VARIABLE RING WIDTH SDD 有权
标题翻译：可变环宽度SDD
公开(公告)号：US20100314706A1
公开(公告)日：2010-12-16
申请号：US12617313
申请日：2009-11-12
申请人： Derek Hullinger , Hideharu Matsuura , Kazuo Taniguchi , Tadashi Utaka
发明人： Derek Hullinger , Hideharu Matsuura , Kazuo Taniguchi , Tadashi Utaka
IPC分类号： H01L31/02
CPC分类号： G01T1/2928 , H01L31/115
摘要： A silicon drift detector (SDD) comprising electrically isolated rings. The rings can be individually biased doped rings. One embodiment includes an SDD with a single doped ring. Some of the doped rings may not require a bias voltage. Some of the rings can be field plate rings. The field plate rings may all use the same biasing voltage as a single outer doped ring. The ring widths can vary such that the outermost ring is widest and the ring widths decrease with each subsequent ring towards the anode.
摘要翻译：包括电隔离环的硅漂移检测器（SDD）。环可以是单独偏置的掺杂环。一个实施例包括具有单个掺杂环的SDD。掺杂环中的一些可能不需要偏置电压。一些环可以是场板环。场板环可以使用与单个外掺杂环相同的偏置电压。环宽度可以变化，使得最外面的环是最宽的，并且环宽度随着每个随后的环朝向阳极而减小。

3. 发明授权

US4271353A X-ray spectroscope 失效
标题翻译： X光分光镜
公开(公告)号：US4271353A
公开(公告)日：1981-06-02
申请号：US52943
申请日：1979-06-27
申请人： Nobuo Ohtsuki , Eiji Yamada , Tadashi Utaka
发明人： Nobuo Ohtsuki , Eiji Yamada , Tadashi Utaka
IPC分类号： G01N23/22 , G01N23/207 , G21K1/06 , G01N23/20
CPC分类号： G01N23/2076
摘要： An X-ray Spectroscope comprising a pair of soller slits disposed such that one end of each faces an X-ray emitting portion of a sample, a pair of total reflection mirrors disposed such that one end of each face the other end of the respective soller slits and that the reflecting surfaces thereof face each other and make a predetermined angle with respect to X-rays passed through the respective soller slits and an X-ray detector disposed at a position, at which X-rays reflected by the total reflection mirrors intersect each other. If necessary, it further provides a pair of auxiliary soller slits between the X-ray detector and the total reflection mirrors and a filter capable of absorbing only characteristic X-rays from a particular substance.Such an X-ray spectroscope has an extremely improved efficiency of detection compared to the conventional spectroscope of this kind and can also permit size reduction of the entire device.
摘要翻译：一种X射线分光镜，包括一对soller狭缝，其设置成使得其一端面向样品的X射线发射部分，一对全反射镜设置成使得每个面的一端面对各个soller的另一端狭缝，并且其反射面相对于通过各个索勒狭缝的X射线形成预定角度，并且设置在由全反射镜反射的X射线相交的位置处的X射线检测器彼此。如果需要，它还在X射线检测器和全反射镜之间进一步提供一对辅助索勒狭缝，以及能够仅吸收特定物质的特征X射线的滤光器。与常规的这种分光镜相比，这种X射线分光仪具有极高的检测效率，并且还可以允许整个装置的尺寸减小。

4. 发明授权

US06442236B1 X-ray analysis 有权
标题翻译： X射线分析
公开(公告)号：US06442236B1
公开(公告)日：2002-08-27
申请号：US09704030
申请日：2000-11-01
申请人： Tadashi Utaka
发明人： Tadashi Utaka
IPC分类号： G01N2300
CPC分类号： G01N23/223 , G01N2223/076
摘要： X-ray focusing instrument is provided with an annular analyzing element and a collimator. The analyzing element has an inner periphery. The analyzing element analyzes and reflects X-ray beams incident on the inner periphery. The collimator has a surface and total reflects X-ray beams on the surface to irradiate parallel beams toward a specimen. The collimator is placed within an internal space defined by the inner periphery of the analyzing element. The analyzing element and the collimator are arranged such that the axis of the analyzing element is substantially coincident with the axis of the collimator.
摘要翻译： X射线聚焦仪具有环形分析元件和准直仪。分析元件具有内周边。分析元件分析和反映入射在内周的X射线束。准直器具有表面，并且总体反射表面上的X射线束以朝向样本照射平行光束。准直器放置在由分析元件的内周限定的内部空间内。分析元件和准直器被布置成使得分析元件的轴线基本上与准直器的轴线重合。

5. 发明授权

US5732120A Fluorescent X-ray analyzing apparatus 失效
标题翻译：荧光X射线分析仪
公开(公告)号：US5732120A
公开(公告)日：1998-03-24
申请号：US858892
申请日：1997-05-19
申请人： Takashi Shoji , Tadashi Utaka , Ayako Shimazaki , Kunihiro Miyazaki , Tsuyoshi Matsumura
发明人： Takashi Shoji , Tadashi Utaka , Ayako Shimazaki , Kunihiro Miyazaki , Tsuyoshi Matsumura
IPC分类号： G01N23/223 , G01N23/225
CPC分类号： G01N23/225 , G01N23/223 , G01N2223/076
摘要： A fluorescent X-ray analyzing apparatus includes a source of excitation (2) for irradiating a silicon-based sample (S) with primary X-rays (B2) to excite the silicon-based sample (S), a detector (4) for detecting fluorescent X-rays (B5) emitted from the silicon-based sample (S), and an analyzer (6) for analyzing elements contained in the silicon-based sample (S) based on a result of detection performed by the detector (4). The primary X-rays (B2) emitted from the source of excitation (2) have a wavelength higher than, but in the vicinity of a wavelength at an Si--K absorption edge so that generation of fluorescent X-rays (B5) of Si is suppressed to minimize a noise which would occur during detection of fluorescent X-rays (B5) of Na and Al to thereby accomplish an accurate analysis of a minute quantity of NA and Al contained in the sample (S).
摘要翻译：一种荧光X射线分析装置，包括用于向硅基样品（S）照射初级X射线（B2）以激发硅基样品（S）的激发源（2），用于检测从硅基样品（S）发射的荧光X射线（B5）;以及分析器（6），用于基于检测器（4）执行的检测结果来分析包含在硅基样品（S）中的元素）。从激发源（2）发射的初级X射线（B 2）具有比Si-K吸收边缘处的波长高的波长，但是在Si-K吸收边缘的波长附近，因此产生Si的荧光X射线（B5）被抑制以使在Na和Al的荧光X射线（B5）的检测期间将发生的噪声最小化，从而实现样品（S）中包含的微量的NA和Al的精确分析。

6. 发明授权

US5132997A X-ray spectroscopic analyzing apparatus 失效
标题翻译： X射线光谱分析装置
公开(公告)号：US5132997A
公开(公告)日：1992-07-21
申请号：US754908
申请日：1991-09-04
申请人： Shinjiro Kojima , Tadashi Utaka
发明人： Shinjiro Kojima , Tadashi Utaka
IPC分类号： G01N23/223 , G21K1/06 , G21K3/00
CPC分类号： G21K1/06 , G01N23/223 , G01N2223/076 , G21K2201/062
摘要： An X-ray spectroscopic analyzing apparatus which comprises a source of X-rays, a first analyzing crystal for diffracting the X-rays from the X-ray source, and a second analyzing crystal for diffracting the X-rays from the X-ray source and also for passing therethrough a diffracted X-ray component from the first analyzing crystal. The first and second analyzing crystals are so disposed and so positioned as to permit the diffracted X-ray components of different wavelengths to travel along a single path towards a sample to be analyzed. On an optical path extending between the X-ray source and the sample, a filtering means for cutting a portion of the X-rays which has a wavelength shorter than a predetermined wavelength.
摘要翻译：一种X射线光谱分析装置，其包括X射线源，用于衍射来自X射线源的X射线的第一分析晶体和用于衍射来自X射线源的X射线的第二分析晶体并且还用于从第一分析晶体穿过衍射的X射线成分。第一和第二分析晶体如此布置并且定位成允许不同波长的衍射的X射线分量沿着单个路径朝向要分析的样品行进。在X射线源和样品之间延伸的光路上，用于切割波长比预定波长短的X射线的一部分的滤光装置。

7. 发明授权

US4256961A X-ray spectroscope 失效
标题翻译： X光分光镜
公开(公告)号：US4256961A
公开(公告)日：1981-03-17
申请号：US52942
申请日：1979-06-27
申请人： Takashi Shoji , Tadashi Utaka
发明人： Takashi Shoji , Tadashi Utaka
IPC分类号： G01N23/22 , G01N23/207 , G21K1/06 , G01N23/20
CPC分类号： G01N23/2076
摘要： An X-ray spectroscope comprising a soller slit consisting of a number of parallel plates and disposed such that one end thereof faces an X-ray emitting portion of a sample to be analyzed and a plurality of analysing crystals or total reflection mirrors disposed parallel to one another and spaced apart from one another at a suitable interval. The analysing crystals or total reflection mirrors are orientated with their one ends directed to the other end of the soller slit and such that X-rays having passed through the soller slit are incident on them with a desired angle of incidence.Also, these analysing crystals or total reflection mirrors each have a convex back side defined by inclined surfaces respectively parallel with incident and reflected X-rays and facing the reflecting surface of the next adjacent analysing crystal or total reflection mirror.With this X-ray spectroscope it is possible to make effective use of X-rays and prevent divergence in directions normal to the diffracting surface, thus permitting analysis with high efficiency.
摘要翻译：一种X射线分光装置，包括由多个平行板组成的一个soller狭缝，并设置成使其一端面向要分析的样品的X射线发射部分，并且多个分析晶体或全反射镜平行于一个另一个并且以适当的间隔彼此间隔开。分析晶体或全反射镜的一端被定向到Soller狭缝的另一端，并且使得穿过soller狭缝的X射线以所需的入射角入射到它们上。此外，这些分析晶体或全反射镜各自具有由入射和反射的X射线平行的面对与下一个相邻分析晶体或全反射镜的反射表面相对的倾斜表面限定的凸背面。利用该X射线分光镜，能够有效地利用X射线，防止与衍射面垂直的方向发散，能够高效率地进行分析。

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