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1. 发明申请

US20110247108A1 Sample inspection apparatuses and sample inspection methods 审中-公开
标题翻译：样品检验仪器和样品检验方法
公开(公告)号：US20110247108A1
公开(公告)日：2011-10-06
申请号：US13064309
申请日：2011-03-17
申请人： Yonmook Park
发明人： Yonmook Park
IPC分类号： G01Q60/00
CPC分类号： G01Q60/30
摘要： Sample inspection apparatuses and sample inspection methods which may include scanning a sample at high speed while inducing electrostatic force due to an electric field generated between a probe tip and the sample and generating and displaying a surface topography of the sample from a vibration displacement variation of a cantilever due to the electrostatic force.
摘要翻译：样品检查装置和样品检查方法，其可以包括在由探针尖端和样品之间产生的电场引起静电力的同时高速扫描样品，并从样品的振动位移变化产生和显示样品的表面形貌悬臂由于静电力。

2. 发明申请

US20130033670A1 HEAT TREATMENT APPARATUS AND METHOD FOR LCD CELLS 有权
标题翻译：用于LCD电池的热处理装置和方法
公开(公告)号：US20130033670A1
公开(公告)日：2013-02-07
申请号：US13564845
申请日：2012-08-02
申请人： Seung Gun Byoun , Joong Young Ryu , Kyun Lae Kim , Yonmook Park , Youn Sil Choi , Kyung Gil Baek
发明人： Seung Gun Byoun , Joong Young Ryu , Kyun Lae Kim , Yonmook Park , Youn Sil Choi , Kyung Gil Baek
IPC分类号： G02F1/1333
CPC分类号： G02F1/133382 , G02F1/1303 , G02F1/1341
摘要： Disclosed herein are heat treatment apparatuses and methods for liquid crystal display (LCD) cells, which are capable of rapidly transferring heat to liquid crystals injected into an LCD cell, not only to reduce the time taken for the liquid crystals to be changed into a liquid phase, but also to physically promote diffusion of the liquid crystals, thereby achieving a more uniform distribution of the liquid crystals. The apparatus includes a liquid bath, in which a liquid is contained as a medium to transfer heat to the liquid crystals in the LCD cells, a loading device to load or unload the LCD cells into/from the liquid bath, a heater installed in the liquid bath, the heater heating the liquid contained in the liquid bath and transfer heat to the liquid crystals, and a sound wave transmitter installed in the liquid bath and transmitting sound waves to the liquid crystals.
摘要翻译：本发明公开了一种液晶显示（LCD）电池的热处理装置和方法，其能够将热量快速转移到注入到LCD电池中的液晶，不仅可以减少液晶变成液体所需的时间而且还能够物理促进液晶的扩散，从而实现液晶的更均匀分布。该装置包括液体，其中包含液体作为介质以将热传递到LCD单元中的液晶;负载装置，用于将LCD单元加载到液槽中或从液槽中卸载;加热器，其安装在液体加热器，加热包含在液槽中的液体并将热量传递到液晶;以及声波发射器，安装在液槽中并将声波传输到液晶。

3. 发明申请

US20120311848A1 SUBSTRATE FRAME SUCTION APPARATUS AND CONTROL METHOD FOR THE SAME 审中-公开
标题翻译：基板框架吸附装置及其控制方法
公开(公告)号：US20120311848A1
公开(公告)日：2012-12-13
申请号：US13488777
申请日：2012-06-05
申请人： Yonmook Park
发明人： Yonmook Park
IPC分类号： B25B11/00
CPC分类号： H01L21/6838 , Y10T29/49998
摘要： In one embodiment, a substrate frame suction apparatus includes a body having at least one top-side opened chamber, a suction plate to cover a top of the at least one chamber, and a pressure adjustment device connected to the at least one chamber and configured to adjust a pressure in the at least one chamber.
摘要翻译：在一个实施例中，基板框架抽吸装置包括具有至少一个顶侧开放室的主体，用于覆盖至少一个室的顶部的吸入板和连接到该至少一个室的压力调节装置，以调节至少一个室中的压力。

4. 发明授权

US08499360B2 Atomic force microscopes and methods of measuring specimens using the same 有权
标题翻译：原子力显微镜和使用其测量样品的方法
公开(公告)号：US08499360B2
公开(公告)日：2013-07-30
申请号：US12929674
申请日：2011-02-08
申请人： Yonmook Park
发明人： Yonmook Park
IPC分类号： G01Q10/04
CPC分类号： G01Q10/04 , G01Q60/38
摘要： Atomic force microscopes and methods of measuring specimens using the same. An atomic force microscope may precisely measure a 3D shape of a specimen using both a short-stroke scanner and a long-stroke scanner. The atomic force microscope may include a stage to transfer a specimen, at least one cantilever which includes a probe such that a driving displacement and a driving frequency are changed by attractive force and repulsive force in relation to atoms of the specimen, at least one short-stroke scanner which includes the cantilever so as to perform short-stroke scanning of the specimen, at least one long-stroke scanner which includes the short-stroke scanner so as to perform long-stroke scanning of the specimen, and at least one coarse approach system for transferring the short-stroke scanner and the long-stroke scanner to the specimen.
摘要翻译：原子力显微镜和使用其测量样品的方法。原子力显微镜可以使用短行程扫描仪和长行程扫描仪来精确地测量样本的3D形状。原子力显微镜可以包括传送试样的阶段，至少一个包括探针的悬臂，使得驱动位移和驱动频率相对于试样的原子的吸引力和排斥力而改变，至少一个短行程扫描器，其包括所述悬臂，以对所述样本进行短行程扫描;至少一个长行程扫描器，其包括所述短行程扫描器，以对所述样本进行长行程扫描;以及至少一个粗略扫描器将短行程扫描仪和长行程扫描仪转移到样本的接近系统。

5. 发明申请

US20110203020A1 Atomic force microscopes and methods of measuring specimens using the same 有权
标题翻译：原子力显微镜和使用其测量样品的方法
公开(公告)号：US20110203020A1
公开(公告)日：2011-08-18
申请号：US12929674
申请日：2011-02-08
申请人： Yonmook Park
发明人： Yonmook Park
IPC分类号： G01Q10/02 , G01Q10/00
CPC分类号： G01Q10/04 , G01Q60/38
摘要： Atomic force microscopes and methods of measuring specimens using the same. An atomic force microscope may precisely measure a 3D shape of a specimen using both a short-stroke scanner and a long-stroke scanner. The atomic force microscope may include a stage to transfer a specimen, at least one cantilever which includes a probe such that a driving displacement and a driving frequency are changed by attractive force and repulsive force in relation to atoms of the specimen, at least one short-stroke scanner which includes the cantilever so as to perform short-stroke scanning of the specimen, at least one long-stroke scanner which includes the short-stroke scanner so as to perform long-stroke scanning of the specimen, and at least one coarse approach system for transferring the short-stroke scanner and the long-stroke scanner to the specimen.
摘要翻译：原子力显微镜和使用其测量样品的方法。原子力显微镜可以使用短行程扫描仪和长行程扫描仪来精确地测量样本的3D形状。原子力显微镜可以包括传送试样的阶段，至少一个包括探针的悬臂，使得驱动位移和驱动频率相对于试样的原子的吸引力和排斥力而改变，至少一个短行程扫描器，其包括所述悬臂，以对所述样本进行短行程扫描;至少一个长行程扫描器，其包括所述短行程扫描器，以对所述样本执行长行程扫描;以及至少一个粗略扫描器将短行程扫描仪和长行程扫描仪转移到样本的接近系统。

6. 发明授权

US08928851B2 Heat treatment apparatus and method for LCD cells 有权
标题翻译： LCD电池的热处理装置及方法
公开(公告)号：US08928851B2
公开(公告)日：2015-01-06
申请号：US13564845
申请日：2012-08-02
申请人： Seung Gun Byoun , Joong Young Ryu , Kyun Lae Kim , Yonmook Park , Youn Sil Choi , Kyung Gil Baek
发明人： Seung Gun Byoun , Joong Young Ryu , Kyun Lae Kim , Yonmook Park , Youn Sil Choi , Kyung Gil Baek
IPC分类号： G02F1/1333 , G02F1/13 , G02F1/1341
CPC分类号： G02F1/133382 , G02F1/1303 , G02F1/1341
摘要： Disclosed herein are heat treatment apparatuses and methods for liquid crystal display (LCD) cells, which are capable of rapidly transferring heat to liquid crystals injected into an LCD cell, not only to reduce the time taken for the liquid crystals to be changed into a liquid phase, but also to physically promote diffusion of the liquid crystals, thereby achieving a more uniform distribution of the liquid crystals. The apparatus includes a liquid bath, in which a liquid is contained as a medium to transfer heat to the liquid crystals in the LCD cells, a loading device to load or unload the LCD cells into/from the liquid bath, a heater installed in the liquid bath, the heater heating the liquid contained in the liquid bath and transfer heat to the liquid crystals, and a sound wave transmitter installed in the liquid bath and transmitting sound waves to the liquid crystals.
摘要翻译：本发明公开了一种液晶显示（LCD）电池的热处理装置和方法，其能够将热量快速转移到注入到LCD电池中的液晶，不仅可以减少液晶变成液体所需的时间而且还能够物理促进液晶的扩散，从而实现液晶的更均匀分布。该装置包括液体，其中包含液体作为介质以将热传递到LCD单元中的液晶;负载装置，用于将LCD单元加载到液槽中或从液槽中卸载;加热器，其安装在液体加热器，加热包含在液槽中的液体并将热量传递到液晶;以及声波发射器，安装在液槽中并将声波传输到液晶。

7. 发明申请

US20110307980A1 HIGH-SPEED AND HIGH-RESOLUTION ATOMIC FORCE MICROSCOPE 审中-公开
标题翻译：高速和高分辨率原子力显微镜
公开(公告)号：US20110307980A1
公开(公告)日：2011-12-15
申请号：US13114642
申请日：2011-05-24
申请人： Yonmook Park , Dong Min Kim
发明人： Yonmook Park , Dong Min Kim
IPC分类号： G01Q60/24
CPC分类号： G01Q10/04
摘要： According to example embodiments, an atomic force microscope includes a probe tip, a cantilever including the probe tip, a displacement measurement device, and a movement device. A vibrating displacement of the cantilever changes according to a force between atoms of the probe tip and atoms of a surface of a sample. The displacement measurement device is configured to irradiate a beam emitted from a light source on the cantilever and to measure a displacement of the cantilever based on the beam reflected from the cantilever. The movement device is configured to move the cantilever and the displacement measurement device simultaneously when the sample is scanned.
摘要翻译：根据示例性实施例，原子力显微镜包括探针尖端，包括探针尖端的悬臂，位移测量装置和移动装置。悬臂的振动位移根据探针尖端的原子与样品表面的原子之间的力而变化。位移测量装置被配置为将从光源发射的光束照射在悬臂上，并且基于从悬臂反射的光束来测量悬臂的位移。移动装置被配置为当扫描样品时同时移动悬臂和位移测量装置。

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