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1. 发明授权

US10900998B1 Contactless screening of a qubit 有权
公开(公告)号：US10900998B1
公开(公告)日：2021-01-26
申请号：US16687143
申请日：2019-11-18
申请人： International Business Machines Corporation
发明人： Martin O. Sandberg , Vivekananda P. Adiga , Hanhee Paik , Jared Barney Hertzberg
IPC分类号： G06N10/00 , G01Q60/00
摘要： Systems, devices, computer-implemented methods, and computer program products to facilitate contactless screening of a qubit are provided. According to an embodiment, a system can comprise a memory that stores computer executable components and a processor that executes the computer executable components stored in the memory. The computer executable components can comprise a scanner component that establishes a direct microwave coupling of a scanning probe device to a qubit of a quantum device. The computer executable components can further comprise a parameter extraction component that determines qubit frequency of the qubit based on the direct microwave coupling.

2. 发明授权

US08898809B2 Method and apparatus for the combined analysis of a sample with objects to be analyzed 有权
标题翻译：用于将样品与要分析的物体组合分析的方法和装置
公开(公告)号：US08898809B2
公开(公告)日：2014-11-25
申请号：US12670570
申请日：2008-07-24
申请人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
发明人： Torsten Müller , Kathryn Anne Poole , Detlef Knebel , Torsten Jähnke
IPC分类号： G01Q60/00 , G01Q30/04 , G01Q30/02 , G01Q60/42 , B82Y35/00 , G01N21/64
CPC分类号： G01Q60/42 , B82Y35/00 , G01N21/6458 , G01N2021/6482 , G01Q30/02 , G01Q30/04
摘要： The invention relates to a method for the combined analysis of a sample with objects to be analyzed, in particular a sample with biological objects, in which measurement results for one or more of the objects to be analyzed in the sample are obtained by analyzing the one or more objects to be analyzed by an imaging method of measurement, probe-microscopic measurement results are obtained for the one or more objects to be analyzed by analyzing the one or more objects to be analyzed by a probe-microscopic method of measurement, and the measurement results and the probe-microscopic measurement results are assigned to one another, after optional prior intermediate processing. Furthermore, the invention relates to an apparatus for carrying out combined analysis of a sample with objects to be investigated, in particular a sample with biological objects.
摘要翻译：本发明涉及一种用于将样品与待分析物体，特别是具有生物物体的样品进行组合分析的方法，其中通过分析样品中的一种或多种待分析对象的测量结果，或更多的物体通过测量的成像方法进行分析，通过用探针微观测量方法分析一个或多个要分析的对象来获得待分析的一个或多个对象的探针显微测量结果，并且在可选的先前中间处理之后，测量结果和探针显微测量结果彼此分配。此外，本发明涉及一种用于对待研究对象，特别是具有生物体的样本进行组合分析的装置。

3. 发明授权

US08756711B2 Method for staging cancer progression by AFM 有权
标题翻译：通过AFM分期癌症进展的方法
公开(公告)号：US08756711B2
公开(公告)日：2014-06-17
申请号：US13992743
申请日：2011-12-12
申请人： Marija Plodinec , Roderick Lim , Marko Loparic
发明人： Marija Plodinec , Roderick Lim , Marko Loparic
IPC分类号： G01Q60/00
CPC分类号： G01N33/4833 , G01N2001/2873 , G01N2800/7028 , G01Q60/366 , G01Q60/38
摘要： The present invention relates to a method for classifying a tissue biopsy sample obtained from a tumor, comprising determining a plurality of stiffness values for said sample by measuring a plurality of points on the sample with a spatial resolution of at least 100 μm and assigning the sample to a probability of malignancy. A sample showing a unimodal stiffness distribution is assigned to a high probability of being non-malignant, and a sample showing an at least bimodal stiffness distribution is assigned to a high probability of being malignant, wherein said stiffness distribution is characterized by a first peak exhibiting an at least two-fold higher stiffness value than a second peak. The present invention further relates to a system for classifying a tumor tissue biopsy sample.
摘要翻译：本发明涉及一种用于分类从肿瘤获得的组织活检样品的方法，包括通过以至少100μm的空间分辨率测量样品上的多个点来确定所述样品的多个刚度值，并分配样品以恶性肿瘤的概率。显示单峰刚度分布的样本被赋予非恶性的高概率，并且显示至少双峰刚度分布的样本被赋予恶性的高概率，其中所述刚度分布的特征在于第一峰显示比第二个峰高至少两倍的刚度值。本发明还涉及用于分类肿瘤组织活组织检查样品的系统。

4. 发明申请

US20140082776A1 Fluid Delivery for Scanning Probe Microscopy 审中-公开
标题翻译：流体输送用于扫描探针显微镜
公开(公告)号：US20140082776A1
公开(公告)日：2014-03-20
申请号：US13904892
申请日：2013-05-29
申请人： Victor B. Kley
发明人： Victor B. Kley
IPC分类号： G01Q60/00
CPC分类号： G01Q60/00 , B82Y35/00 , B82Y99/00 , G01Q30/12 , G01Q30/14 , G01Q80/00 , Y10S977/849 , Y10S977/856 , Y10S977/902 , Y10T29/53
摘要： A gas (or fluid) is introduced around an SPM probe or nanotool™ to control chemical activity e.g., oxygen to promote oxidation, argon to inhibit oxidation or clean dry air (CDA) to inhibit moisture to control static charging due to the action of the probe or nanotools and to provide vacuum at and around the tip and substrate area. Electrical current can be produced for use with active electronic devices on, in or near the body of the device. In addition by use of a fluid like water, certain oils, and other liquids in conjunction with specific tip structure either electric discharge machining can be used at the tip area on the tip itself (in conjunction with a form structure on the work piece) or on a work piece beneath the tip to shape, polish and remove material at very small scales (10 microns to 1 nm or less).
摘要翻译：在SPM探针或nanotool™周围引入气体（或流体）以控制化学活性，例如氧气以促进氧化，氩气抑制氧化或清洁干燥空气（CDA）以抑制湿气以控制由于探针或纳米工具，并在尖端和基底区域周围提供真空。可以产生电流，用于与设备的主体中，外部或附近的有源电子设备一起使用。此外，通过使用像水一样的流体，某些油和其他液体结合特定的尖端结构，可以在尖端本身的尖端区域（结合工件上的形式结构）或在尖端下方的工件上以非常小的尺度（10微米至1纳米或更小）成型，抛光和去除材料。

5. 发明授权

US08286261B2 Scanning probe in pulsed-force mode, digital and in real time 有权
标题翻译：以脉冲力模式扫描探头，数字和实时
公开(公告)号：US08286261B2
公开(公告)日：2012-10-09
申请号：US12804110
申请日：2010-07-14
申请人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
发明人： Peter Spizig , Detief Sanchen , Jörg Förstner , Joachim Koenen , Othmar Marti , Gerhard Volswinkler
IPC分类号： G01Q60/00
CPC分类号： G01Q60/34 , G01Q10/06 , G01Q30/04 , G01Q60/32
摘要： A microscope, in particular a scanning probe microscope, comprising a programmable logic device.
摘要翻译：显微镜，特别是扫描探针显微镜，包括可编程逻辑器件。

6. 发明授权

US08276210B2 Tomographic atom probe comprising an electro-optical generator of high-voltage electrical pulses 有权
标题翻译：断层原子探针包括高电压电脉冲的电光发生器
公开(公告)号：US08276210B2
公开(公告)日：2012-09-25
申请号：US13130520
申请日：2009-10-13
申请人： François Vurpillot , Alain Bostel
发明人： François Vurpillot , Alain Bostel
IPC分类号： G01Q60/00
CPC分类号： H03K3/42 , H01J49/168 , H03K3/537
摘要： A tomographic atom probe uses electrical pulses applied to an electrode in order to carry out evaporation of the sample being analyzed. In order to produce these electrical pulses, the tomographic atom probe comprises a high-voltage generator connected to an electrode by an electrical connection comprising a chip of semiconductor material. The probe also comprises a light source which can be controlled in order to generate light pulses which are applied to the semiconductor chip. Throughout the illumination, the chip is rendered conductive, which puts the high-voltage generator and the electrode in electrical contact so that a potential step is applied to the latter. The probe also comprises means for applying a voltage step of opposite amplitude to the previous step at the end of a time interval Δt0, so that the electrode finally receives a voltage pulse of duration Δt0.
摘要翻译：断层原子探针使用施加到电极的电脉冲，以便进行正在分析的样品的蒸发。为了产生这些电脉冲，断层原子探针包括通过包括半导体材料芯片的电连接器连接到电极的高压发生器。探头还包括可以被控制以产生施加到半导体芯片的光脉冲的光源。在整个照明过程中，芯片导通，使高电压发生器和电极电接触，从而对其施加电势。该探头还包括用于在时间间隔＆Dgr; t0结束时向前一步骤施加相反幅度的电压步骤的装置，使得电极最终接收持续时间＆Dgr; t0的电压脉冲。

7. 发明申请

US20110207163A1 METHOD FOR AND MATERIAL OF A SHAPE STANDARD 审中-公开
标题翻译：形状标准方法和材料
公开(公告)号：US20110207163A1
公开(公告)日：2011-08-25
申请号：US12996517
申请日：2009-06-04
申请人： Dietmar Lerche
发明人： Dietmar Lerche
IPC分类号： C12Q1/02 , C12Q1/00 , G01Q60/00
CPC分类号： G01N15/1475 , G01N15/1012 , G01N15/1459 , G01N15/147 , G01N2001/2893 , G01N2015/0073 , G01N2015/008 , G01N2015/0084 , G01N2015/0092 , G01N2015/1018 , G01N2015/1477 , G01N2015/1497
摘要： A method is disclosed for the preparation of isomorphic and nonspherical shape standards as isometric as possible and their mixtures for validation of the measurement methods and analyzers for quantification of particle shapes and their characteristics especially in the microscale and nanoscale size range. Furthermore the shape standards also provide quality control and performance qualification can be used at the operator of the corresponding shape measurement devices.
摘要翻译：公开了一种用于制备尽可能等距的同形和非球形形状标准的方法，以及用于验证测量方法和分析器的混合物，用于量化粒子形状及其特征，特别是在微尺度和纳米级尺寸范围内。此外，形状标准还提供质量控制和性能鉴定，可在相应形状测量装置的操作者处使用。

8. 发明申请

US20100017923A1 PREAMPLIFYING CANTILEVER AND APPLICATIONS THEREOF 失效
标题翻译：预制CAN LE。。。。。。。。
公开(公告)号：US20100017923A1
公开(公告)日：2010-01-21
申请号：US12472183
申请日：2009-05-26
申请人： Bede Pittenger , Kumar Virwani , Benedikt Zeyen
发明人： Bede Pittenger , Kumar Virwani , Benedikt Zeyen
IPC分类号： G01Q60/00
CPC分类号： G01Q60/38 , G01Q60/32
摘要： Aspects of the invention are directed to piezoresponse force analysis of a material. A stimulus signal including a first frequency component is applied to a contact point on the material such that the stimulus signal actuates a portion of the material to experience a motion as a result of a piezoelectric effect. A resonant device is coupled to the contact point such that the resonant device experiences a resonant motion at the first frequency component in response to the motion of the material, the resonant motion having a greater displacement than a displacement of the motion of the material, and is substantially unaffected by mechanical properties of the material at the contact point. The resonant motion of the resonant device is detected and processed to produce a measurement representing the piezoresponse of the material at the contact point.
摘要翻译：本发明的方面涉及材料的压力响应力分析。包括第一频率分量的激励信号被施加到材料上的接触点，使得激励信号致动材料的一部分以经受作为压电效应的结果的运动。谐振装置耦合到接触点，使得谐振装置响应于材料的运动而在第一频率分量处经历谐振运动，谐振运动具有比材料运动的位移更大的位移，以及基本上不受材料在接触点的机械性能的影响。检测和处理谐振装置的谐振运动，以产生表示材料在接触点的压力响应的测量。

9. 发明申请

US20050283335A1 INTEGRATED CIRCUIT AND METHODS OF MEASUREMENT AND PREPARATION OF MEASUREMENT STRUCTURE 失效
标题翻译：集成电路及其测量方法和测量结构的准备
公开(公告)号：US20050283335A1
公开(公告)日：2005-12-22
申请号：US11160086
申请日：2005-06-08
申请人： G. Banke , Andrew Deering , Philip Kaszuba , Leon Moszkowicz , James Robert , James Slinkman
发明人： G. Banke , Andrew Deering , Philip Kaszuba , Leon Moszkowicz , James Robert , James Slinkman
IPC分类号： A61M1/00 , G01N1/32 , G01Q30/04 , G01Q30/20 , G01Q60/00 , G01R31/28 , G06F19/00 , H01L21/66
CPC分类号： A61M1/0058 , A61M1/0084 , G01N1/32 , G01R31/2898
摘要： A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.
摘要翻译：通过测量结构的印记来测量集成电路（IC）结构的方法，制备用于上述测量的测试部位的方法和如此形成的IC。用于制备测试部位的方法包括从衬底逐渐去除结构，以便在衬底的顶表面中露出结构的去除的底表面的印记。然后可以使用原子力显微镜（AFM）对印记进行成像。该图像可用于测量结构的底面。

10. 发明授权

US06978215B2 Method of determining of true nonlinearity of scan along a selected direction X or Y in scan microscope 失效
标题翻译：在扫描显微镜中沿选定方向X或Y扫描的真实非线性的确定方法
公开(公告)号：US06978215B2
公开(公告)日：2005-12-20
申请号：US09945527
申请日：2001-09-04
申请人： Arkady Nikitin
发明人： Arkady Nikitin
IPC分类号： G01Q40/02 , G01Q60/00 , G02B21/00 , H01J37/28 , G01D18/00
CPC分类号： H01J37/28 , G01Q40/00 , G02B21/002 , G02B21/004 , H01J2237/2816 , H01J2237/2826
摘要： This invention allows the scan nonlinearity of different type of scanning microscopes to be measured, including: optical, confocal, scanning electron and scanning probe microscopes. The scan nonlinearity of the scanning type measuring microscopes can be considerable source of errors in precise measurements of the Critical Dimension—CDs. The invention allows scanning measuring microscopes to be certified for scan nonlinearity; this invention can be used for the monitoring, adjustment and/or alignment of these type instruments. The high reliability of scan nonlinearity determination is achieved with the use of a pair of offset images of a calibration structure and consequent computer analysis of the signal differences. In addition to scan nonlinearity of a scanning measuring microscope being determined this proposed invention allows determination of heterogeneity of the pitch values intrinsic to any test-objects with periodic structure used as calibration references.
摘要翻译：本发明允许测量不同类型的扫描显微镜的扫描非线性，包括：光学，共焦，扫描电子和扫描探针显微镜。扫描型测量显微镜的扫描非线性可能是精确测量临界尺寸CD的重大错误来源。本发明允许扫描测量显微镜被认证为扫描非线性; 本发明可用于监测，调整和/或对准这些类型的仪器。通过使用校准结构的一对偏移图像和信号差异的计算机分析来实现扫描非线性确定的高可靠性。除了正在确定的扫描测量显微镜的扫描非线性之外，本发明允许确定用作校准参考的具有周期性结构的任何测试对象固有的间距值的异质性。

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