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    • 5. 发明申请
    • Resistive Devices and Methods of Operation Thereof
    • 电阻器件及其操作方法
    • US20150162079A1
    • 2015-06-11
    • US14599654
    • 2015-01-19
    • Adesto Technologies Corporation
    • Foroozan Sarah KoushanMichael A. Van Buskirk
    • G11C13/00
    • G11C13/003G11C13/0002G11C13/0004G11C13/0007G11C13/0009G11C13/0011G11C13/004G11C13/0069G11C2013/0071G11C2013/0092G11C2213/74G11C2213/79
    • In accordance with an embodiment of the present invention, a method of operating a resistive switching device includes applying a signal including a pulse on a first access terminal of an access device having the first access terminal and a second access terminal. The second access terminal is coupled to a first terminal of a two terminal resistive switching device. The resistive switching device has the first terminal and a second terminal. The resistive switching device has a first state and a second state. The pulse includes a first ramp from a first voltage to a second voltage over a first time period, a second ramp from the second voltage to a third voltage over a second time period, and a third ramp from the third voltage to a fourth voltage over a third time period. The second ramp and the third ramp have an opposite slope to the first ramp. The sum of the first time period and the second time period is less than the third time period.
    • 根据本发明的实施例,一种操作电阻式交换设备的方法包括:在具有第一接入终端的接入设备的第一接入终端和第二接入终端上应用包括脉冲的信号。 第二接入终端耦合到两端电阻式交换设备的第一终端。 电阻式开关装置具有第一端子和第二端子。 电阻式开关装置具有第一状态和第二状态。 脉冲包括在第一时间段内从第一电压到第二电压的第一斜坡,在第二时间段内从第二电压到第三电压的第二斜坡,以及从第三电压到第四电压的第三斜坡 第三个时期。 第二斜坡和第三斜坡与第一坡道具有相反的斜坡。 第一时间段和第二时间段的总和小于第三时间段。
    • 6. 发明授权
    • Pre-conditioning circuits and methods for programmable impedance elements in memory devices
    • 存储器件中可编程阻抗元件的预调节电路和方法
    • US09025396B1
    • 2015-05-05
    • US13763461
    • 2013-02-08
    • Adesto Technologies Corporation
    • Foroozan Sarah KoushanDeepak KamalanathanJuan Pablo Saenz EcheverryVenkatesh P. GopinathJanet Wang
    • G11C7/00G11C13/00
    • G11C13/0069G11C13/0011G11C2013/0073G11C2013/0083
    • A memory device can include a plurality of programmable impedance elements programmable between a low impedance state in response to a program voltage and a higher impedance state in response to an erase voltage having a different polarity than the program voltage; a programming circuit configured to apply the program and erase voltages to selected elements; and a pre-condition path configured to apply a pre-condition voltage only of the erase voltage polarity to fresh elements in a pre-condition operation; wherein fresh elements are elements that have not been subject to any programming voltages. The pre-condition electrical conditions can also include high voltage low current conditions that apply a greater magnitude voltage and smaller current than the first or second electrical conditions, or high voltage low current conditions that apply a greater magnitude voltage and greater current than the first or second electrical conditions.
    • 存储器件可以包括响应于具有与编程电压不同的极性的擦除电压而响应于编程电压和较高阻抗状态而在低阻抗状态之间可编程的多个可编程阻抗元件; 编程电路,被配置为将编程和擦除电压施加到所选择的元件; 以及预条件路径,被配置为仅在所述前置操作中将新的所述擦除电压极性的前提电压施加于新元件; 其中新鲜元件是未经过任何编程电压的元件。 预条件电气条件还可以包括施加比第一或第二电气条件更大的电压和更小的电流的高电压低电流条件,或者施加比第一或第二电气条件更大的电压和更大的电流的高压低电流条件 第二电气条件。