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    • 1. 发明授权
    • Hardware process trace facility
    • 硬件过程跟踪工具
    • US08140903B2
    • 2012-03-20
    • US12425075
    • 2009-04-16
    • Benjiman L. GoodmanSertac CakiciSamuel I. WardLinton B. Ward, Jr.
    • Benjiman L. GoodmanSertac CakiciSamuel I. WardLinton B. Ward, Jr.
    • G06F11/00
    • G06F11/349G06F2201/87
    • A method for tracing thread bus transactions in a multiprocessor system comprises decoding, by a processor, a first thread instruction of a thread, the thread comprising an ordered series of thread instructions. In the event the first thread instruction is a set bus trace enable bit (BTEB) instruction, the processor sets a bus trace enable bit corresponding to the thread. In the event the BTEB is set, the processor determines whether the first thread instruction is a trace-eligible instruction and, in the event the first thread instruction is a trace-eligible instruction, and the BTEB is set, the processor sets a snoop tag trace enable bit (STTEB). A hardware trace monitor (HTM) monitors bus transactions, each bus transaction comprising a STTE. In the event a monitored bus transaction comprises a set STTEB, the HTM stores the bus transaction as trace data. In the event a monitored bus transaction comprises a reset STTEB, the HTM does not store the bus transaction as trace data.
    • 用于在多处理器系统中跟踪线程总线事务的方法包括由处理器解码线程的第一线程指令,所述线程包括有序序列的线程指令。 在第一个线程指令是一个设置的总线跟踪使能位(BTEB)指令的情况下,处理器设置与线程相对应的总线跟踪使能位。 在设置BTEB的情况下,处理器确定第一个线程指令是否是符合条件的指令,并且在第一个线程指令是符合跟踪条件的指令的情况下,并且BTEB被设置,处理器设置一个窥探标记 跟踪使能位(STTEB)。 硬件跟踪监视器(HTM)监视总线事务,每个总线事务包括STTE。 在监控总线事务包括一组STTEB的情况下,HTM将总线事务存储为跟踪数据。 在监控总线事务包括复位STTEB的情况下,HTM不将总线事务存储为跟踪数据。
    • 3. 发明授权
    • System and method for power reduction through power aware latch weighting of complex sub-circuits
    • 通过复杂子电路的功率感知锁存器加权降低功耗的系统和方法
    • US07930610B2
    • 2011-04-19
    • US12206781
    • 2008-09-09
    • Samuel I. WardBenjiman L. GoodmanJoshua P. HernandezLinton B. Ward, Jr.
    • Samuel I. WardBenjiman L. GoodmanJoshua P. HernandezLinton B. Ward, Jr.
    • G01R31/28
    • G01R31/318536
    • A system comprises a circuit analysis module configured to analyze a device under test (DUT), the DUT comprising a plurality of latches coupled together in a scan chain. The circuit analysis module analyzes a DUT for sub-circuits within the DUT and identifies a logical description of identified sub-circuits. A don't-care analysis module couples to the circuit analysis module identifies absolute don't-care latches associated with the identified sub-circuits. A sub-circuit exception module couples to the circuit analysis module and selects weighted input values for an identified sub-circuit, based on the identified absolute don't-care latches and the logical description of the identified sub-circuit. The sub-circuit exception module stores the selected weighted input values for the sub-circuit and associates the selected weighted input values with the logical description.
    • 一种系统包括被配置为分析待测器件(DUT)的电路分析模块,该DUT包括在扫描链中耦合在一起的多个锁存器。 电路分析模块分析DUT内的子电路的DUT,并识别所识别的子电路的逻辑描述。 不需要的分析模块耦合到电路分析模块,识别与所识别的子电路相关的绝对不需要的锁存器。 子电路异常模块耦合到电路分析模块,并且基于所识别的绝对不需要的锁存器和所识别的子电路的逻辑描述来选择所识别的子电路的加权输入值。 子电路异常模块存储用于子电路的选择的加权输入值,并将所选择的加权输入值与逻辑描述相关联。