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    • 7. 发明授权
    • Semiconductor structure processing using multiple laterally spaced laser beam spots delivering multiple blows
    • 使用多个横向间隔开的激光束点进行多次打击的半导体结构处理
    • US07687740B2
    • 2010-03-30
    • US11051262
    • 2005-02-04
    • Kelly J. BrulandBrian W. BairdHo Wai Lo
    • Kelly J. BrulandBrian W. BairdHo Wai Lo
    • B23K26/00
    • B23K26/067B23K26/0613H01L21/76894
    • Methods and systems process a semiconductor substrate having a plurality of structures to be selectively irradiated with multiple laser beams. The structures are arranged in a plurality of substantially parallel rows extending in a generally lengthwise direction. The method generates a first laser beam that propagates along a first laser beam axis that intersects a first target location on or within the semiconductor substrate. The method also generates a second laser beam that propagates along a second laser beam axis that intersects a second target location on or within the semiconductor substrate. The second target location is offset from the first target location in a direction perpendicular to the lengthwise direction of the rows by some amount such that, when the first target location is a structure on a first row of structures, the second target location is a structure or between two adjacent structures on a second row distinct from the first row. The method moves the semiconductor substrate relative to the first and second laser axes in a direction approximately parallel to the rows of structures, so as to pass the first target location along the first row to irradiate for a first time selected structures in the first row, and so as to simultaneously pass the second target location along the second row to irradiate for a second time structures previously irradiated by the first laser beam during a previous pass of the first target location along the second row.
    • 方法和系统处理具有多个结构的半导体衬底以选择性地照射多个激光束。 这些结构被布置成沿大致长度方向延伸的多个基本上平行的行。 该方法产生沿着与半导体衬底上或半导体衬底内的第一目标位置相交的第一激光束轴传播的第一激光束。 该方法还产生沿着与半导体衬底上或第二靶标位置相交的第二激光束轴传播的第二激光束。 第二目标位置在垂直于行长度方向的方向上偏离第一目标位置一定量,使得当第一目标位置是第一行结构上的结构时,第二目标位置是结构 或在与第一行不同的第二行上的两个相邻结构之间。 所述方法使所述半导体衬底相对于所述第一和第二激光轴在大致平行于所述结构行的方向上移动,以使所述第一目标位置沿着所述第一行通过,以在所述第一行中首次照射所选择的结构, 并且沿着第二行同时通过第二目标位置以照射先前在第一目标位置沿着第二行的先前通过期间由第一激光束照射的第二时间结构。
    • 9. 发明授权
    • Ultraviolet laser ablative patterning of microstructures in semiconductors
    • 半导体微结构的紫外激光烧蚀图案化
    • US07157038B2
    • 2007-01-02
    • US10017497
    • 2001-12-14
    • Brian W. BairdMichael J. WolfeRichard S. HarrisKevin P. FaheyLian-Cheng ZouThomas R. McNeil
    • Brian W. BairdMichael J. WolfeRichard S. HarrisKevin P. FaheyLian-Cheng ZouThomas R. McNeil
    • B23K26/38
    • B23K26/0622B23K26/066B23K26/083B23K26/0869B23K26/364B23K26/40B23K2101/40B23K2103/50
    • Patterns with feature sizes of less than 50 microns are rapidly formed directly in semiconductors, particularly silicon, GaAs, indium phosphide, or single crystalline sapphire, using ultraviolet laser ablation. These patterns include very high aspect ratio cylindrical through-hole openings for integrated circuit connections; singulation of processed die contained on semiconductor wafers; and microtab cutting to separate microcircuit workpieces from a parent semiconductor wafer. Laser output pulses (32) from a diode-pumped, Q-switched frequency-tripled Nd:YAG, Nd:YVO4, or Nd:YLF is directed to the workpiece (12) with high speed precision using a compound beam positioner. The optical system produces a Gaussian spot size, or top hat beam profile, of about 10 microns. The pulse energy used for high-speed ablative processing of semiconductors using this focused spot size is greater than 200 μJ per pulse at pulse repetition frequencies greater than 5 kHz and preferably above 15 kHz. The laser pulsewidth measured at the full width half-maximum points is preferably less than 80 ns.
    • 特征尺寸小于50微米的图案使用紫外激光烧蚀直接在半导体,特别是硅,GaAs,磷化铟或单晶蓝宝石中形成。 这些图案包括用于集成电路连接的非常高的纵横比圆柱形通孔开口; 包含在半导体晶片上的加工芯片的分割; 和微型切割以从母半导体晶片分离微电路工件。 来自二极管泵浦Q开关频率三倍的Nd:YAG,Nd:YVO 4或Nd:YLF的激光输出脉冲(32)以高速精度被引导到工件(12) 使用复合光束定位器。 光学系统产生约10微米的高斯光点尺寸或顶帽光束轮廓。 用于使用这种聚焦光点尺寸的半导体高速烧蚀处理的脉冲能量大于5kHz,优选高于15kHz的脉冲重复频率时,每脉冲大于200μJ。 在全宽度半最大点处测量的激光脉冲宽度优选小于80ns。