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    • 3. 发明授权
    • Method for improving self-assembled polymer features
    • 改进自组装聚合物特征的方法
    • US09233840B2
    • 2016-01-12
    • US12913835
    • 2010-10-28
    • Joy ChengHayato NamaiDaniel P. Sanders
    • Joy ChengHayato NamaiDaniel P. Sanders
    • B44C1/22C03C15/00C03C25/68C23F1/00B81C1/00H01L21/033H01L21/027
    • B81C1/00031B81C2201/0149H01L21/0271H01L21/0337H01L21/0338
    • A method for processing a structure. The structure is formed and includes a substrate, a substructure having a sidewall and disposed on the substrate, a first polymer structure disposed on the substrate, and a second polymer structure disposed on the substrate such that the first polymer structure is disposed between the sidewall and the second polymer structure. An aspect ratio of the first polymer structure, the second polymer structure, or both is reduced in a reducing step. One polymer structure (i.e., the first polymer structure or the second polymer structure) is selectively removed from the structure such that a remaining polymer structure (i.e., the second polymer structure or the first polymer structure) remains disposed on the external surface of the substrate after the one polymer structure has been selectively removed, wherein the aspect ratio of the remaining polymer structure was reduced in the reducing step.
    • 一种处理结构的方法。 该结构被形成并且包括衬底,具有侧壁并设置在衬底上的子结构,设置在衬底上的第一聚合物结构和设置在衬底上的第二聚合物结构,使得第一聚合物结构设置在侧壁和 第二聚合物结构。 在还原步骤中,第一聚合物结构,第二聚合物结构或两者的纵横比减小。 从结构中选择性地除去一种聚合物结构(即,第一聚合物结构或第二聚合物结构),使得剩余的聚合物结构(即,第二聚合物结构或第一聚合物结构)保留在基材的外表面上 在选择性去除一种聚合物结构之后,在还原步骤中其余聚合物结构的纵横比降低。
    • 8. 发明申请
    • Aligning polymer films
    • 对准聚合物膜
    • US20090212016A1
    • 2009-08-27
    • US12036091
    • 2008-02-22
    • Joy ChengDaniel P. SandersRatnam Sooriyakumaran
    • Joy ChengDaniel P. SandersRatnam Sooriyakumaran
    • B44C1/22
    • H01L21/0337B81B2207/056B81C1/00031Y10T428/24322Y10T428/24612Y10T428/24802
    • A Method. The method includes forming a substructure, on a substrate, including a feature having a sidewall of a first material and a bottom surface of a second material. Applying a solution including two immiscible polymers and third material to the substructure. The immiscible polymers include a first and second polymer. A selective chemical affinity of the first polymer for the material is greater than a selective chemical affinity of the second polymer for the material. The first polymer is segregated from the second polymer. The first polymer selectively migrates to the at least one sidewall, resulting in the first polymer being disposed between the at least one sidewall and the second polymer. The first polymer is selectively removed. The second polymer remains, resulting in forming structures including the substructure, the third material, and the second polymer. The substructure has a pattern. The pattern is transferred to the substrate.
    • 一个方法。 该方法包括在基底上形成子结构,其包括具有第一材料的侧壁和第二材料的底表面的特征。 将包括两种不混溶的聚合物和第三种材料的溶液应用于底层结构。 不混溶的聚合物包括第一和第二聚合物。 第一聚合物对材料的选择性化学亲和力大于第二聚合物对材料的选择性化学亲和力。 第一聚合物与第二聚合物分离。 第一聚合物选择性地迁移到至少一个侧壁,导致第一聚合物设置在至少一个侧壁和第二聚合物之间。 选择性地除去第一种聚合物。 残留第二聚合物,导致形成包括亚结构,第三材料和第二聚合物的结构。 子结构具有图案。 将图案转移到基底。