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    • 1. 发明授权
    • On chip dynamic read for non-volatile storage
    • 用于非易失性存储的片上动态读取
    • US08406053B1
    • 2013-03-26
    • US13239194
    • 2011-09-21
    • Deepanshu DuttaDana LeeJeffrey Lutze
    • Deepanshu DuttaDana LeeJeffrey Lutze
    • G11C11/34G11C16/04G11C16/06
    • G11C16/04G11C11/5642G11C16/26G11C16/3418G11C16/3495G11C2211/5644
    • Dynamically determining read levels on chip (e.g., memory die) is disclosed herein. One method comprises reading a group of non-volatile storage elements on a memory die at a first set of read levels. Results of the two most recent of the read levels are stored on the memory die. A count of how many of the non-volatile storage elements in the group showed a different result between the reads for the two most recent read levels is determined. The determining is performed on the memory die using the results stored on the memory die. A dynamic read level is determined for distinguishing between a first pair of adjacent data states of the plurality of data states based on the read level when the count reaches a pre-determined criterion. Note that the read level may be dynamically determined on the memory die.
    • 本文公开了动态地确定芯片上的读取电平(例如,存储器管芯)。 一种方法包括以第一组读取级别在存储器管芯上读取一组非易失性存储元件。 两个最新的读取电平的结果存储在存储器管芯上。 确定组中有多少非易失性存储元件在两个最新读取级别的读取之间显示不同的结果。 使用存储在存储器管芯上的结果在存储器管芯上进行确定。 当计数达到预定标准时,基于读取级别来确定动态读取级别以区分多个数据状态的第一对相邻数据状态。 注意,读取电平可以在存储器管芯上动态地确定。
    • 2. 发明申请
    • ON CHIP DYNAMIC READ FOR NON-VOLATILE STORAGE
    • 在芯片动态阅读非易失性存储
    • US20130070524A1
    • 2013-03-21
    • US13239194
    • 2011-09-21
    • Deepanshu DuttaDana LeeJeffrey Lutze
    • Deepanshu DuttaDana LeeJeffrey Lutze
    • G11C16/10
    • G11C16/04G11C11/5642G11C16/26G11C16/3418G11C16/3495G11C2211/5644
    • Dynamically determining read levels on chip (e.g., memory die) is disclosed herein. One method comprises reading a group of non-volatile storage elements on a memory die at a first set of read levels. Results of the two most recent of the read levels are stored on the memory die. A count of how many of the non-volatile storage elements in the group showed a different result between the reads for the two most recent read levels is determined. The determining is performed on the memory die using the results stored on the memory die. A dynamic read level is determined for distinguishing between a first pair of adjacent data states of the plurality of data states based on the read level when the count reaches a pre-determined criterion. Note that the read level may be dynamically determined on the memory die.
    • 本文公开了动态地确定芯片上的读取电平(例如,存储器管芯)。 一种方法包括以第一组读取级别在存储器管芯上读取一组非易失性存储元件。 两个最新的读取电平的结果存储在存储器管芯上。 确定组中有多少非易失性存储元件在两个最新读取级别的读取之间显示不同的结果。 使用存储在存储器管芯上的结果在存储器管芯上进行确定。 当计数达到预定标准时,基于读取级别来确定动态读取级别以区分多个数据状态的第一对相邻数据状态。 注意,读取电平可以在存储器管芯上动态地确定。
    • 3. 发明授权
    • Programming algorithm to reduce disturb with minimal extra time penalty
    • 编程算法以最小的额外时间损失来减少干扰
    • US07800956B2
    • 2010-09-21
    • US12163073
    • 2008-06-27
    • Dana LeeDeepanshu DuttaYingda Dong
    • Dana LeeDeepanshu DuttaYingda Dong
    • G11C11/34
    • G11C11/5628G11C2211/5621
    • Programming time is reduced in a non-volatile memory in a multi-pass programming process. In a first programming pass, high state cells are programmed by a sequence of program pulses to identify fast and slow high state cells, while lower state cells are locked out from programming. Once identified, the fast high state cells are temporarily locked out from programming while the slow high state cells continue being programmed to their final intended state. Further, the program pulses are sharply stepped up to program the slow high state cells. In a second programming pass, the fast high state cells are programmed along with the other, lower state cells, until they all reach their respective intended states. A time savings is realized compared to approaches in which all high state cells are programmed in the first programming pass.
    • 在多遍编程过程中,非易失性存储器中的编程时间会减少。 在第一编程通道中,高状态单元通过一系列编程脉冲进行编程,以识别快速和慢速的高状态单元,而较低状态单元被从编程中锁定。 一旦识别,快速高状态单元暂时被禁止编程,而缓慢的高状态单元继续被编程到其最终预期状态。 此外,编程脉冲急剧地升高以对慢速高状态单元进行编程。 在第二个编程过程中,快速高状态单元与其他较低状态单元一起编程,直到它们都达到各自的预期状态。 与在第一编程通路中编程所有高状态单元的方法相比,实现了时间节省。
    • 4. 发明申请
    • PROGRAMMING ALGORITHM TO REDUCE DISTURB WITH MINIMAL EXTRA TIME PENALTY
    • 使用最小额外罚款减少差距的编程算法
    • US20090323429A1
    • 2009-12-31
    • US12163073
    • 2008-06-27
    • Dana LeeDeepanshu DuttaYingda Dong
    • Dana LeeDeepanshu DuttaYingda Dong
    • G11C16/06
    • G11C11/5628G11C2211/5621
    • Programming time is reduced in a non-volatile memory in a multi-pass programming process. In a first programming pass, high state cells are programmed by a sequence of program pulses to identify fast and slow high state cells, while lower state cells are locked out from programming. Once identified, the fast high state cells are temporarily locked out from programming while the slow high state cells continue being programmed to their final intended state. Further, the program pulses are sharply stepped up to program the slow high state cells. In a second programming pass, the fast high state cells are programmed along with the other, lower state cells, until they all reach their respective intended states. A time savings is realized compared to approaches in which all high state cells are programmed in the first programming pass.
    • 在多遍编程过程中,非易失性存储器中的编程时间会减少。 在第一编程通道中,高状态单元通过一系列编程脉冲进行编程,以识别快速和慢速的高状态单元,而较低状态单元被从编程中锁定。 一旦识别,快速高状态单元暂时被禁止编程,而缓慢的高状态单元继续被编程到其最终预期状态。 此外,编程脉冲急剧地升高以对慢速高状态单元进行编程。 在第二个编程过程中,快速高状态单元与其他较低状态单元一起编程,直到它们都达到各自的预期状态。 与在第一编程通路中编程所有高状态单元的方法相比,实现了时间节省。