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    • 2. 发明授权
    • Cross-track interference testing of a hard disk drive
    • 硬盘驱动器的跨轨干扰测试
    • US09025268B1
    • 2015-05-05
    • US14074361
    • 2013-11-07
    • HGST Netherlands B.V.
    • Alexander Taratorin
    • G11B5/09G11B20/18
    • G11B20/182
    • Described herein is a method for testing an electronic information storage device having a read and write head includes writing a plurality of pattern periods along a single track of a magnetic recording medium of the electronic information storage device using the write head. The method also includes mapping read head signals for each pattern period across the single track and surrounding regions of the magnetic recording medium. Additionally, the method includes determining a condition of the electronic information storage device based on an average of the read head signals. The condition can include adjacent track degradation of the magnetic recording medium.
    • 本文描述了一种用于测试具有读写头的电子信息存储装置的方法,包括使用写入头沿着电子信息存储装置的磁记录介质的单个轨道写入多个模式周期。 该方法还包括在磁记录介质的单个磁道和周围区域上映射每个图案周期的读取头信号。 另外,该方法包括基于所读取的头信号的平均值来确定电子信息存储装置的状态。 该条件可以包括磁记录介质的相邻磁道劣化。
    • 5. 发明授权
    • System and method for ATI/FTI detection in magnetic media
    • 磁性介质中ATI / FTI检测的系统和方法
    • US08885275B1
    • 2014-11-11
    • US14133075
    • 2013-12-18
    • HGST Netherlands B.V.
    • Jing LouAlexander Taratorin
    • G11B27/36G11B5/09
    • G11B5/4555G11B5/09G11B20/10305
    • A system detects adjacent track interference (ATI)/far track interference (FTI) in a data storage system. The system includes a micro-transition generator that introduces micro-transitions into data write patterns written to a magnetic media. A spectrum analyzer analyzes in the frequency domain read-back signals generated in response to the data write patterns. In particular, the spectrum analyzer calculates first and second signal-to-noise ratios (SNRs) based on read-back signals generated before and after a center track stress test. Adjacent track interference/far track interference effects are determined based on the first and second SNR values.
    • 系统检测数据存储系统中的相邻轨道干扰(ATI)/远距离干扰(FTI)。 该系统包括微转换发生器,其将微转换引入写入磁介质的数据写入模式。 频谱分析仪分析响应于数据写入模式产生的频域读回信号。 特别地,频谱分析仪基于在中心轨道应力测试之前和之后产生的回读信号来计算第一和第二信噪比(SNR)。 基于第一和第二SNR值来确定相邻轨道干扰/远距离干扰效应。
    • 6. 发明申请
    • CROSS-TRACK INTERFERENCE TESTING OF A HARD DISK DRIVE
    • 硬盘驱动器的跨轨道干扰测试
    • US20150124346A1
    • 2015-05-07
    • US14074361
    • 2013-11-07
    • HGST Netherlands B.V.
    • Alexander Taratorin
    • G11B20/18
    • G11B20/182
    • Described herein is a method for testing an electronic information storage device having a read and write head includes writing a plurality of pattern periods along a single track of a magnetic recording medium of the electronic information storage device using the write head. The method also includes mapping read head signals for each pattern period across the single track and surrounding regions of the magnetic recording medium. Additionally, the method includes determining a condition of the electronic information storage device based on an average of the read head signals. The condition can include adjacent track degradation of the magnetic recording medium.
    • 本文描述了一种用于测试具有读写头的电子信息存储装置的方法,包括使用写入头沿着电子信息存储装置的磁记录介质的单个轨道写入多个模式周期。 该方法还包括在磁记录介质的单个磁道和周围区域上映射每个图案周期的读取头信号。 另外,该方法包括基于所读取的头信号的平均值来确定电子信息存储装置的状态。 该条件可以包括磁记录介质的相邻磁道劣化。