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1. 发明申请

US20060243036A1 Atomic force microscope with probe with improved tip movement 有权
标题翻译：带有探头的原子力显微镜，具有改进的尖端运动
公开(公告)号：US20060243036A1
公开(公告)日：2006-11-02
申请号：US11455353
申请日：2006-06-19
申请人： Hak-Joo Lee , Jae-Hyun Kim , Chung-Seog Oh , Seung-Woo Han , Shin Hur , Soon-Gyu Ko , Byung-Ik Choi
发明人： Hak-Joo Lee , Jae-Hyun Kim , Chung-Seog Oh , Seung-Woo Han , Shin Hur , Soon-Gyu Ko , Byung-Ik Choi
IPC分类号： G01B5/28
CPC分类号： G01Q60/366 , G01N3/42 , G01N2203/0286
摘要： An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
摘要翻译：原子力显微镜探针在沿着轴的方向上提供压痕测试功能。探针具有保持尖端的尖端和臂结构。臂结构具有安装在固定台上的一端，另一端连接到AFM顶端，以及具有相对于包括其两端位于其上的轴线的平面对称的形状的中空框架。

2. 发明授权

US07246517B2 Atomic force microscope with probe with improved tip movement 有权
标题翻译：带有探头的原子力显微镜，具有改进的尖端运动
公开(公告)号：US07246517B2
公开(公告)日：2007-07-24
申请号：US11455353
申请日：2006-06-19
申请人： Hak-Joo Lee , Jae-Hyun Kim , Chung-Seog Oh , Seung-Woo Han , Shin Hur , Soon-Gyu Ko , Byung-Ik Choi
发明人： Hak-Joo Lee , Jae-Hyun Kim , Chung-Seog Oh , Seung-Woo Han , Shin Hur , Soon-Gyu Ko , Byung-Ik Choi
IPC分类号： G01B5/28
CPC分类号： G01Q60/366 , G01N3/42 , G01N2203/0286
摘要： An atomic force microscope probe provides an indentation testing function in a direction along an axis. The probe has a tip and an arm structure holding the tip. The arm structure has one end mounted on a fixed stage, the other end coupled to the AFM tip, and a hollow frame having a shape symmetric with respect to a plane including an axis on which the two ends are positioned.
摘要翻译：原子力显微镜探针在沿着轴的方向上提供压痕测试功能。探针具有保持尖端的尖端和臂结构。臂结构具有安装在固定台上的一端，另一端连接到AFM顶端，以及具有相对于包括其两端位于其上的轴线的平面对称的形状的中空框架。

3. 发明授权

US07886571B2 Apparatus for measuring adhesive and frictional properties of polymer 有权
标题翻译：用于测量聚合物的粘合剂和摩擦性能的装置
公开(公告)号：US07886571B2
公开(公告)日：2011-02-15
申请号：US11132508
申请日：2005-05-19
申请人： Hak-joo Lee , Shin Hur , Jae-hyun Kim , Seung-woo Han , Jung-yup Kim , Ki-ho Cho
发明人： Hak-joo Lee , Shin Hur , Jae-hyun Kim , Seung-woo Han , Jung-yup Kim , Ki-ho Cho
IPC分类号： G06K9/00 , G01D18/00
CPC分类号： G01N19/02 , G01N3/42 , G01N19/04
摘要： Disclosed herein is an apparatus for measuring adhesive and frictional properties of a polymer hemisphere relative to a contact plate provided in the apparatus. The apparatus comprise a body having a movable table installed to move along an X-axis and Y-axis and a vertical column positioned at a rear side of the movable table, a sample mount provided on the movable table and having a mirror to reflect surface images of a horizontal contact plate, a head assembly located at a front side of the column and having a polymer hemisphere used to press a surface of the contact plate to implement an adhesive force test, a camera device located at a front side of the mirror to capture the surface images of the contact plate during the adhesive force test, and a control device for analyzing various data inputted thereto during the adhesive force test.
摘要翻译：本文公开了一种用于测量聚合物半球相对于设备中提供的接触板的粘合剂和摩擦性能的装置。该装置包括：主体，其具有安装成沿着X轴和Y轴移动的可移动台和位于可移动台的后侧的垂直柱;设置在可移动台上的具有反射表面的反射镜水平接触板的图像，位于柱的前侧的头部组件，并且具有用于按压接触板的表面以实现粘合力测试的聚合物半球，位于镜的前侧的相机装置以在粘合力测试期间捕获接触板的表面图像，以及用于在粘合力测试期间分析输入到其中的各种数据的控制装置。

4. 发明申请

US20060171579A1 Apparatus for measuring adhesive and frictional properties of polymer 有权
标题翻译：用于测量聚合物的粘合剂和摩擦性能的装置
公开(公告)号：US20060171579A1
公开(公告)日：2006-08-03
申请号：US11132508
申请日：2005-05-19
申请人： Hak-joo Lee , Shin Hur , Jae-hyun Kim , Seung-woo Han , Jung-yup Kim , Ki-ho Cho
发明人： Hak-joo Lee , Shin Hur , Jae-hyun Kim , Seung-woo Han , Jung-yup Kim , Ki-ho Cho
IPC分类号： G06K9/00 , G01N19/04
CPC分类号： G01N19/02 , G01N3/42 , G01N19/04
摘要： Disclosed herein is an apparatus for measuring adhesive and frictional properties of a polymer hemisphere relative to a contact plate provided in the apparatus. The apparatus comprise a body having a movable table installed to move along an X-axis and Y-axis and a vertical column positioned at a rear side of the movable table, a sample mount provided on the movable table and having a mirror to reflect surface images of a horizontal contact plate, a head assembly located at a front side of the column and having a polymer hemisphere used to press a surface of the contact plate to implement an adhesive force test, a camera device located at a front side of the mirror to capture the surface images of the contact plate during the adhesive force test, and a control device for analyzing various data inputted thereto during the adhesive force test.
摘要翻译：本文公开了一种用于测量聚合物半球相对于设备中提供的接触板的粘合剂和摩擦性能的装置。该装置包括：主体，其具有安装成沿着X轴和Y轴移动的可移动台和位于可移动台的后侧的垂直柱;设置在可移动台上的具有反射表面的反射镜水平接触板的图像，位于柱的前侧的头部组件，并且具有用于按压接触板的表面以实现粘合力测试的聚合物半球，位于镜的前侧的相机装置以在粘合力测试期间捕获接触板的表面图像，以及用于在粘合力测试期间分析输入到其中的各种数据的控制装置。

5. 发明授权

US08165688B2 Frequency analyzer for MEMS based cochlear implant with self power supply 有权
标题翻译：用于具有自供电的基于MEMS的人工耳蜗植入物的频率分析仪
公开(公告)号：US08165688B2
公开(公告)日：2012-04-24
申请号：US12257089
申请日：2008-10-23
申请人： Shin Hur , Wan-Doo Kim
发明人： Shin Hur , Wan-Doo Kim
IPC分类号： A61N1/00 , A61B5/04
CPC分类号： B82Y15/00 , A61N1/0541 , A61N1/36036 , H04R25/70
摘要： Disclosed is a frequency analyzer for a MEMS based cochlear implant with self power supply. The frequency analyzer for a MEMS based cochlear implant includes: an upper structure including a first substrate, and a nano wire contact portion formed under the first substrate and coated with a high conductivity metal; and a lower structure including a second substrate having a space filled with a fluid and an upper portion of which is opened, a membrane formed on the fluid filled in the space of the second substrate, a first electrode formed on the membrane, and a nano wire formed on the first electrode and having the piezoelectric characteristics related to an arbitrary direction in which the nano wire is grown.
摘要翻译：公开了一种用于具有自电源的基于MEMS的人工耳蜗植入物的频率分析仪。用于基于MEMS的人工耳蜗植入物的频率分析器包括：上部结构，包括第一基底和形成在第一基底下并涂覆有高导电性金属的纳米线接触部分; 以及下部结构，其包括具有填充有流体并且其上部打开的空间的第二基板，形成在填充在第二基板的空间中的流体上的膜，形成在膜上的第一电极和纳米线形成在第一电极上并且具有与其中生长纳米线的任意方向相关的压电特性。

6. 发明申请

US20090112288A1 FREQUENCY ANALYZER FOR MEMS BASED COCHLEAR IMPLANT WITH SELF POWER SUPPLY 有权
标题翻译：用于具有自供电的基于MEMS的COCHLEAR植入物的频率分析器
公开(公告)号：US20090112288A1
公开(公告)日：2009-04-30
申请号：US12257089
申请日：2008-10-23
申请人： Shin Hur , Wan-Doo Kim
发明人： Shin Hur , Wan-Doo Kim
IPC分类号： A61F11/04 , A61N1/36
CPC分类号： B82Y15/00 , A61N1/0541 , A61N1/36036 , H04R25/70
摘要： Disclosed is a frequency analyzer for a MEMS based cochlear implant with self power supply. The frequency analyzer for a MEMS based cochlear implant includes: an upper structure including a first substrate, and a nano wire contact portion formed under the first substrate and coated with a high conductivity metal; and a lower structure including a second substrate having a space filled with a fluid and an upper portion of which is opened, a membrane formed on the fluid filled in the space of the second substrate, a first electrode formed on the membrane, and a nano wire formed on the first electrode and having the piezoelectric characteristics related to an arbitrary direction in which the nano wire is grown.
摘要翻译：公开了一种用于具有自电源的基于MEMS的人工耳蜗植入物的频率分析仪。用于基于MEMS的人工耳蜗植入物的频率分析器包括：上部结构，包括第一基底和形成在第一基底下并涂覆有高导电性金属的纳米线接触部分; 以及下部结构，其包括具有填充有流体并且其上部打开的空间的第二基板，形成在填充在第二基板的空间中的流体上的膜，形成在膜上的第一电极和纳米线形成在第一电极上并且具有与其中生长纳米线的任意方向相关的压电特性。

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