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    • 3. 发明授权
    • Surface region selection for heat sink placement
    • 散热片放置的表面区域选择
    • US09558311B2
    • 2017-01-31
    • US14525292
    • 2014-10-28
    • International Business Machines Corporation
    • Keiji Matsumoto
    • G06F17/50
    • G06F17/5077G06F17/5068G06F2217/78G06F2217/80H01L2224/16145H01L2224/16225H01L2924/15311
    • A method for determining an area of a region for receiving a heat sink on a surface of a chip-supporting substrate is disclosed. The method can include determining, in response to a specified voltage drop associated with substrate wiring, a first set of wiring cross-sectional areas and corresponding lengths that satisfy the specified voltage drop. The method can also include determining, by selecting, in response to a specified thermal resistance associated with substrate wiring and insulating layers, from the first set, a second set of wiring cross-sectional areas and corresponding lengths that satisfy the specified thermal resistance. The method can also include selecting, from a set of placement areas corresponding to the second set of wiring cross-sectional areas and corresponding lengths, a heat sink placement area that is greater than a lower size for a placement area and less than an upper size for a placement area.
    • 公开了一种用于确定用于在芯片支撑衬底的表面上接收散热器的区域的面积的方法。 该方法可以包括响应于与衬底布线相关联的指定电压降,确定满足特定电压降的第一组布线横截面积和对应的长度。 该方法还可以包括通过响应于与衬底布线和绝缘层相关联的指定热阻从第一组中选择满足特定热阻的第二组布线横截面区域和对应的长度来确定。 该方法还可以包括从对应于第二组布线横截面区域和相应长度的一组放置区域中选择大于放置区域的较小尺寸并小于上部尺寸的散热器放置区域 用于放置区域。
    • 4. 发明申请
    • REDUCTION OF WARPAGE OF MULTILAYERED SUBSTRATE OR PACKAGE
    • 减少多层基板或包装的保修
    • US20160217247A1
    • 2016-07-28
    • US15086984
    • 2016-03-31
    • International Business Machines Corporation
    • Sayuri HadaKeiji Matsumoto
    • G06F17/50
    • G06F17/5081G06F17/5018G06F17/5068G06F17/5077G06F17/5086G06F2217/12Y02P90/265
    • A method that minimizes adjustment of a wiring layer in reducing a warpage of a multilayered substrate and enables location of a part of a wiring layer that needs correction in order to reduce the warpage. The difference in average coefficient of thermal expansion, Δα, varies in a substrate. The method focuses in on the difference in Δα with a great length scale (low frequency) having a relatively significant effect on the warpage compared to the difference in Δα with a smaller length scale (high frequency) and corrects only the difference in Δα with a greater length scale. The distribution of the difference in Δα in a plane of substrate is determined. Then digital filtering is performed to extract only the difference in Δα with a low frequency and the difference in Δα between before and after correction, thereby revealing a part that requires correction.
    • 一种减少布线层的调整以减少多层基板的翘曲的方法,并且能够定位需要校正的布线层的一部分以减少翘曲。 平均热膨胀系数Δα的差在基板中变化。 该方法集中在与具有较小长度尺度(高频)的Δα的差异相比,具有与翘曲相对显着影响的较大长度尺度(低频)的Δα的差异,并且仅校正Δα的差异 更长的刻度。 确定基板平面中Δα差异的分布。 然后执行数字滤波以仅提取Δα与低频之间的差异以及校正之前和之后Δα的差异,从而显示需要校正的部分。