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    • 5. 发明申请
    • Electrical Detection of Plasmon Resonances
    • 等离子体共振的电气检测
    • US20080285040A1
    • 2008-11-20
    • US11816252
    • 2006-02-27
    • John T. FourkasDaniel LimChristopher LafrattaMichael J. Naughton
    • John T. FourkasDaniel LimChristopher LafrattaMichael J. Naughton
    • G01N21/62G01R27/02
    • G01N21/554
    • A method includes detecting a plasmon resonance in a material based on a change in at least one electrical property of the material. For example, the material can be a sensor portion of an electrical circuit, wherein the method can further include: exposing the sensor portion to a test material; optically illuminating the sensor portion when the test material is present, and monitoring the change in the at least one electrical property of the sensor portion in response to the optical illumination. The monitored changed in the at least one electrical property of the sensor portion can provide information about the test material, such as the presence or absence of selected analytes and/or their binding affinities. In another example, the material is a part of a receiver for a plasmonic circuit. An apparatus for carrying out the method is also disclosed.
    • 一种方法包括基于材料的至少一种电性质的变化来检测材料中的等离子体共振。 例如,该材料可以是电路的传感器部分,其中该方法还可以包括:将传感器部分暴露于测试材料; 当存在测试材料时光学照射传感器部分,并响应于光学照明监测传感器部分的至少一个电特性的变化。 在传感器部分的至少一个电性能中监测的监测变化可以提供关于测试材料的信息,例如选择的分析物的存在或不存在和/或其结合亲和力。 在另一示例中,材料是等离子体激元电路的接收器的一部分。 还公开了一种用于执行该方法的装置。