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    • 2. 发明申请
    • METHOD AND APPARATUS FOR ON-CHIP TEMPERATURE
    • 芯片温度的方法和装置
    • US20130166885A1
    • 2013-06-27
    • US13531013
    • 2012-06-22
    • Karthik RamaniStephen PresantJohn Brothers
    • Karthik RamaniStephen PresantJohn Brothers
    • G01K3/00G06F9/30
    • G06F9/4893G01K7/427G06F1/20Y02D10/24
    • When an instruction is executed on an integrated circuit (IC), an activity level and temperature are measured. A relationship between the activity level and temperature is determined, to estimate the temperature from the activity level. The activity level is monitored and is input to a scheduler, which estimates the IC temperature based on the activity level. The scheduler distributes work taking into account the temperature of various IC regions and may include distributing work to the IC region that has a lowest estimated temperature or relatively lower estimated temperature (e.g., lower than the average IC or IC region temperature). When the utilization level of one or more IC regions is high, the scheduler is configured to reduce the clock speed or the voltage of the one or more IC regions, or flag the regions as being unavailable for additional workload.
    • 当在集成电路(IC)上执行指令时,测量活动电平和温度。 确定活动水平和温度之间的关系,从活动水平估算温度。 监视活动级别,并将其输入到调度程序中,该调度程序将根据活动级别估算IC温度。 调度器考虑各种IC区域的温度来分配工作,并且可以包括将工作分配到具有最低估计温度或相对较低估计温度(例如低于平均IC或IC区域温度)的IC区域。 当一个或多个IC区域的使用级别高时,调度器被配置为降低一个或多个IC区域的时钟速度或电压,或将该区域标记为不可用于额外的工作负载。