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1. 发明授权

US10670626B2 Test fixture for observing current flow through a set of resistors 审中-公开
公开(公告)号：US10670626B2
公开(公告)日：2020-06-02
申请号：US15843723
申请日：2017-12-15
申请人： Keysight Technologies, Inc.
发明人： Edward Vernon Brush, IV , Neil Martin Forcier , Fei Fred Wang , Zheyu Zhang , Wen Zhang
IPC分类号： G01R1/04 , G01R31/50
摘要： The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

2. 发明申请

US20150002136A1 MEASUREMENT PROBE PROVIDING DIFFERENT LEVELS OF AMPLIFICATION FOR SIGNALS OF DIFFERENT MAGNITUDE 有权
标题翻译：测量不同级别信号放大级别的测量探头
公开(公告)号：US20150002136A1
公开(公告)日：2015-01-01
申请号：US13930179
申请日：2013-06-28
申请人： Keysight Technologies, Inc.
发明人： Michael T. McTigue , Kenneth W. Johnson , Edward Vernon Brush, IV
IPC分类号： G01R1/30 , G01R19/00
CPC分类号： G01R1/06788 , G01R1/06766 , G01R19/0023
摘要： A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.
摘要翻译：测量探头包括被配置为接收相对于被测器件（DUT）生成的输入信号的至少一个输入端口，以及放大单元，被配置为以输入信号具有第一幅度的第一增益放大输入信号，并且还被配置为以比所述第一增益低的第二增益放大所述输入信号，其中所述输入信号具有大于所述第一幅度的第二幅度。

3. 发明申请

US20200256890A1 TEST FIXTURE FOR OBSERVING CURRENT FLOW THROUGH A SET OF RESISTORS 审中-公开
公开(公告)号：US20200256890A1
公开(公告)日：2020-08-13
申请号：US16864344
申请日：2020-05-01
申请人： Keysight Technologies, Inc.
发明人： Edward Vernon Brush, IV , Neil Martin Forcier , Fei Fred Wang , Zheyu Zhang , Wen Zhang
IPC分类号： G01R1/04 , G01R31/50
摘要： The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

4. 发明申请

US20160139178A1 DUAL OUTPUT HIGH VOLTAGE ACTIVE PROBE WITH OUTPUT CLAMPING AND ASSOCIATED METHODS 有权
标题翻译：具有输出钳位和相关方法的双输出高电压有源探头
公开(公告)号：US20160139178A1
公开(公告)日：2016-05-19
申请号：US15001173
申请日：2016-01-19
申请人： Keysight Technologies, Inc.
发明人： Kenneth W. Johnson , Edward Vernon Brush, IV
IPC分类号： G01R1/067 , G01R1/30
CPC分类号： G01R1/067 , G01R1/06766 , G01R1/06788 , G01R1/20 , G01R1/30 , H01L2924/00 , H01L2924/0002
摘要： A high-voltage active measurement probe is for a measurement instrument such as an oscilloscope. The high voltage active measurement probe includes an input terminal configured to receive an input signal from a device under test (DUT), a first output terminal configured to transmit a first output signal to the measurement instrument for measurement and display of peak voltages, and a second output terminal configured to transmit a second output signal to the measurement instrument for high sensitivity measurement and display of low level voltages. A first probe signal path is between the input terminal and the first output terminal, and a second probe signal path between the input terminal and the second output terminal. A first amplifier is in the first probe signal path between the input terminal and the first output terminal, and a second amplifier is in the second probe signal path between the input terminal and the second output terminal. A first attenuator is in the first probe signal path between the input terminal and the first amplifier, and a second attenuator in the second probe signal path between the input terminal and the second amplifier. A clamping circuit is in the second signal path between the second amplifier and the second output terminal and configured to clamp an internal probe signal, e.g. between an upper clamping threshold and a lower clamping threshold, to produce the second output signal.
摘要翻译：高电压有源测量探头用于示波器等测量仪器。高电压有源测量探头包括被配置为从被测器件（DUT）接收输入信号的输入端子，被配置为向测量仪器发送第一输出信号以用于测量和显示峰值电压的第一输出端子，以及第二输出端子被配置为向测量仪器发送第二输出信号以进行高灵敏度测量和低电平电压的显示。第一探测信号路径位于输入端和第一输出端之间，第二探测信号路径位于输入端和第二输出端之间。第一放大器处于输入端和第一输出端之间的第一探测信号路径中，第二放大器位于输入端和第二输出端之间的第二探测信号路径中。第一衰减器处于输入端和第一放大器之间的第一探测信号路径中，以及位于输入端和第二放大器之间的第二探测信号路径中的第二衰减器。钳位电路处于第二放大器和第二输出端之间的第二信号路径中，并被配置为钳位内部探针信号，例如，在上钳位阈值和下钳位阈值之间，产生第二输出信号。

5. 发明授权

US09459290B2 Oscilloscope system and method for simultaneously displaying zoomed-in and zoomed-out waveforms 有权
标题翻译：同时显示放大和缩小波形的示波器系统和方法
公开(公告)号：US09459290B2
公开(公告)日：2016-10-04
申请号：US13873955
申请日：2013-04-30
申请人： Keysight Technologies, Inc.
发明人： Kenneth W. Johnson , Edward Vernon Brush, IV , Michael T. McTigue
IPC分类号： G01R13/00 , G01R31/36 , G01R13/02 , G01R19/25
CPC分类号： G01R13/0236 , G01R19/25
摘要： An oscilloscope system includes a current probe, a processing unit and a display unit. The current probe includes a high and low gain signal paths for receiving simultaneously a signal of interest from a device under test (DUT), and to output amplified small and large current portions of the signal of interest, respectively. The processing unit receives first and second digitized data corresponding to the amplified small and large current portions output by the high and low gain signal paths, respectively, and processes the first and second digitized data for display as zoomed-in and zoomed-out waveform data, respectively. The display unit displays simultaneously a zoomed-in waveform in a first display window, based on the zoomed-in waveform data, and a zoomed-out waveform in a second display window, based on the zoomed-out waveform data, using the same time scale. The small current portion is less than a predetermined threshold.
摘要翻译：示波器系统包括电流探头，处理单元和显示单元。电流探头包括高和低增益信号路径，用于同时从被测器件（DUT）接收感兴趣的信号，并分别输出感兴趣的信号的放大的小和大电流部分。处理单元分别接收与由高和低增益信号路径输出的放大的小电流和大电流部分相对应的第一和第二数字化数据，并处理第一和第二数字化数据作为放大和缩小波形数据，分别。显示单元使用相同的时间，基于缩小的波形数据同时在第一显示窗口中基于放大波形数据和第二显示窗口中的缩小波形同时显示放大波形规模。小电流部分小于预定阈值。

6. 发明授权

US09188606B2 Oscilloscope current probe with interchangeable range and sensitivity setting modules 有权
标题翻译：示波器电流探头具有可互换的范围和灵敏度设置模块
公开(公告)号：US09188606B2
公开(公告)日：2015-11-17
申请号：US13872606
申请日：2013-04-29
申请人： Keysight Technologies, Inc.
发明人： Kenneth W. Johnson , Edward Vernon Brush, IV
IPC分类号： G01R27/08 , G01R1/067
CPC分类号： G01R1/06788 , G01R1/06766
摘要： An oscilloscope current probe system includes a probe amplifier unit, a probe head identifier, and first and second probe heads interchangeably connectable to the probe amplifier unit. Each probe head has a respective electrically-readable type identifier, a respective current input to receive a current to be measured, a respective internal sensing resistor in connected series with the current input, and a respective output at which a measurement voltage across the sensing resistor is output. The first and second probe heads differ in the resistance of their sensing resistors and the way their type identifiers read. The probe amplifier unit includes a differential amplifier to amplify the measurement voltage output by the probe head connected thereto. The probe head identifier is to read the type identifier of the probe head connected to the probe amplifier unit.
摘要翻译：示波器电流探针系统包括探针放大器单元，探针头标识符以及可互换地连接到探针放大器单元的第一和第二探针头。每个探头具有相应的电可读类型标识符，用于接收待测电流的相应电流输入端，与电流输入端连接的相应内部感测电阻器，以及相应的输出端，其中检测电阻器两端的测量电压被输出。第一和第二探头的感测电阻的电阻和其类型标识符的读取方式不同。探针放大器单元包括差分放大器，用于放大与其连接的探头的输出的测量电压。探头头标识符是读取连接到探头放大器单元的探头的类型标识符。

7. 发明授权

US10884023B2 Test fixture for observing current flow through a set of resistors 有权
公开(公告)号：US10884023B2
公开(公告)日：2021-01-05
申请号：US16864344
申请日：2020-05-01
申请人： Keysight Technologies, Inc.
发明人： Edward Vernon Brush, IV , Neil Martin Forcier , Fei Fred Wang , Zheyu Zhang , Wen Zhang
IPC分类号： G01R1/04 , G01R31/50
摘要： The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

8. 发明授权

US10359450B1 Current sensing probe incorporating a current-to-voltage conversion circuit 有权
公开(公告)号：US10359450B1
公开(公告)日：2019-07-23
申请号：US15402324
申请日：2017-01-10
申请人： Keysight Technologies, Inc.
发明人： Alexander Oliva , Edward Vernon Brush, IV
IPC分类号： G01R15/18 , G01R19/00 , G01R1/30 , G01R19/25
摘要： Generally, in accordance with the various illustrative embodiments disclosed herein, a current sensing probe includes a current-to-voltage conversion circuit that not only presents a desirable impedance into an inductive current sensing element of the current sensing probe, but also remains operationally stable over a wide range of frequencies when measuring a current flowing through a device-under-test. The wide frequency range can extend down to some low frequencies that can prove challenging to conventional current sensing probe circuits.

9. 发明授权

US09316669B2 Measurement probe providing different levels of amplification for signals of different magnitude 有权
标题翻译：测量探头为不同幅度的信号提供不同的放大级别
公开(公告)号：US09316669B2
公开(公告)日：2016-04-19
申请号：US13930179
申请日：2013-06-28
申请人： Keysight Technologies, Inc.
发明人： Michael T. McTigue , Kenneth W. Johnson , Edward Vernon Brush, IV
IPC分类号： G01R19/00 , G01R1/067
CPC分类号： G01R1/06788 , G01R1/06766 , G01R19/0023
摘要： A measurement probe comprises at least one input port configured to receive an input signal generated in relation to a device under test (DUT), and an amplification unit configured to amplify the input signal with a first gain where the input signal has a first amplitude, and further configured to amplify the input signal with a second gain lower than the first gain where the input signal has a second amplitude greater than the first amplitude.
摘要翻译：测量探头包括被配置为接收相对于被测器件（DUT）生成的输入信号的至少一个输入端口，以及放大单元，被配置为以输入信号具有第一幅度的第一增益放大输入信号，并且还被配置为以比所述第一增益低的第二增益放大所述输入信号，其中所述输入信号具有大于所述第一幅度的第二幅度。

10. 发明申请

US20190187175A1 TEST FIXTURE FOR OBSERVING CURRENT FLOW THROUGH A SET OF RESISTORS 审中-公开
公开(公告)号：US20190187175A1
公开(公告)日：2019-06-20
申请号：US15843723
申请日：2017-12-15
申请人： Keysight Technologies, Inc.
发明人： Edward Vernon Brush, IV , Neil Martin Forcier , Fei Fred Wang , Zheyu Zhang , Wen Zhang
IPC分类号： G01R1/04 , G01R31/02
摘要： The illustrative embodiments pertain to a test fixture having low insertion inductance for large bandwidth monitoring of current signals. In one exemplary embodiment, the test fixture includes a baseplate with each resistor of a set of resistors embedded inside a respective non-plated through slot in the baseplate. A first terminal of each resistor is soldered to a top metallic zone of the baseplate and a second terminal soldered to a first of two bottom metallic zones of the baseplate. The top metallic zone is connected by plated-through holes to a second of the two bottom metallic zones. When mounted upon a PCB, the test fixture allows current flow from the first bottom metallic zone, upwards through the set of resistors to the top metallic zone, and downwards to the second bottom metallic zone. An observation instrument may be coupled to a coaxial connector that is mounted on the baseplate.

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