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    • 6. 发明申请
    • MEMORY CIRCUIT HAVING NON-VOLATILE MEMORY CELL AND METHODS OF USING
    • 具有非易失性存储单元的存储器电路及其使用方法
    • US20160111168A1
    • 2016-04-21
    • US14887174
    • 2015-10-19
    • Lattice Semiconductor Corporation
    • Ronald L. ClineStewart Logie
    • G11C17/18G11C11/412G11C17/16
    • G11C17/18G11C17/16
    • One aspect relates to a memory circuit that has a programmable non-volatile memory (NVM) cell configured to generate an NVM output signal indicative of a program state of the NVM cell and to configure a volatile output based on the program state of the NVM cell. The NVM cell comprises a first anti-fuse device, a first select device connected in series with the first anti-fuse device at a first node, and a first pass device. The memory circuit also may have a programmable (independently of the NVM cell) volatile memory (VM) cell configured to receive the NVM output signal at a VM input node and to generate a VM output signal indicative of the program state of the VM cell. The NVM cell may have two NV elements that are separately programmable and are separately selectable via separate access transistors to drive the VM input node.
    • 一个方面涉及具有可编程非易失性存储器(NVM)单元的存储器电路,其被配置为产生指示NVM单元的编程状态的NVM输出信号,并且基于NVM单元的编程状态来配置易失性输出 。 NVM单元包括第一反熔丝器件,在第一节点处与第一反熔丝器件串联连接的第一选择器件和第一通路器件。 存储器电路还可以具有可编程(独立于NVM单元)易失性存储器(VM)单元,其被配置为在VM输入节点处接收NVM输出信号,并且生成指示VM单元的程序状态的VM输出信号。 NVM单元可以具有可单独编程的两个NV元件,并且可以通过单独的存取晶体管单独选择以驱动VM输入节点。