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1. 发明授权

US10636646B2 Ion mirror and ion-optical lens for imaging 有权
公开(公告)号：US10636646B2
公开(公告)日：2020-04-28
申请号：US15778341
申请日：2016-11-21
申请人： Micromass UK Limited , LECO CORPORATION
发明人： John Brian Hoyes , Anatoly Verenchikov , Mikhail Yavor , Keith Richardson
IPC分类号： H01J49/00 , H01J49/40 , H01J49/06 , H01J49/08
CPC分类号： H01J49/406 , H01J49/063 , H01J49/067 , H01J49/068 , H01J49/08
摘要： An ion mirror is disclosed comprising an ion entrance electrode section (62) at the ion entrance to the ion mirror, an energy focussing electrode section (66) for reflecting ions back along a longitudinal axis towards said ion entrance, and a spatial focussing electrode section (64) arranged between the ion entrance electrode section (62) and the energy focussing electrode section (66) for spatially focussing the ions. One or more DC voltage supply is provided to apply a DC potential to the ion entrance electrode section (62) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the energy focussing electrode section (66). The ion mirror further comprises: (i) at least one first transition electrode (68) arranged between said ion entrance electrode section (62) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one first transition electrode that is intermediate the DC potential applied to the ion entrance electrode section (62) and the DC potential applied to the spatial focussing electrode section (64); and (ii) at least one second transition electrode (69) arranged between said energy focussing electrode section (66) and said spatial focussing electrode section (64), wherein said one or more DC voltage supply is configured to apply a DC potential to said at least one second transition electrode (69) that is intermediate the DC potential applied to the spatial focussing electrode section (64) and the DC potential applied to the ion entrance electrode section (62).

2. 发明授权

US11705320B2 Multi-pass mass spectrometer 有权
公开(公告)号：US11705320B2
公开(公告)日：2023-07-18
申请号：US17539599
申请日：2021-12-01
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov
IPC分类号： H01J49/40 , H01J49/42
CPC分类号： H01J49/406 , H01J49/403 , H01J49/4225
摘要： Improved multi-pass time-of-flight mass spectrometers MPTOF, either multi-reflecting (MR) or multi-turn (MT) TOF are proposed with elongated pulsed converters—either orthogonal accelerator or radially ejecting ion trap. The converter 35 is displaced from the MPTOF s-surface of isochronous ion motion in the orthogonal Y-direction. Long ion packets 38 are pulsed deflected in the transverse Y-direction and brought onto said isochronous trajectory s-surface, this way bypassing said converter. Ion packets are isochronously focused in the drift Z-direction within or immediately after the accelerator, either by isochronous trans-axial lens/wedge 68 or Fresnel lens. The accelerator is improved by the ion beam confinement within an RF quadrupolar field or within spatially alternated DC quadrupolar field. The accelerator improves the duty cycle and/or space charge capacity of MPTOF by an order of magnitude.

3. 发明授权

US11309175B2 Multi-reflecting time-of-flight mass spectrometers 有权
公开(公告)号：US11309175B2
公开(公告)日：2022-04-19
申请号：US16611145
申请日：2018-05-04
申请人： Micromass UK Limited , Leco Corporation
发明人： John Brian Hoyes , Anatoly Verenchikov
IPC分类号： H01J49/40
摘要： A multi-reflecting time of flight mass analyser is disclosed in which the ion flight path is maintained relatively small and the duty cycle is made relatively high. Spatial focusing of the ions in the dimension (z-dimension) in which the mirrors (36) are elongated can be eliminated whilst maintaining a reasonably high sensitivity and resolution.

4. 发明授权

US10950425B2 Mass analyser having extended flight path 有权
公开(公告)号：US10950425B2
公开(公告)日：2021-03-16
申请号：US16325965
申请日：2017-08-11
申请人： Micromass UK Limited , LECO CORPORATION
发明人： Anatoly Verenchikov , Mikhail Yavor
IPC分类号： H01J49/40 , H01J49/06 , H01J49/42 , H01J49/00
摘要： A time-of-flight or electrostatic trap mass analyzer is disclosed comprising: an ion flight region comprising a plurality of ion-optical elements (30-35) for guiding ions through the flight region in a deflection (x-y) plane. The ion-optical elements are arranged so as to define a plurality of identical ion-optical cells, wherein the ion-optical elements in each ion-optical cell are arranged and configured so as to generate electric fields for either focusing ions travelling in parallel at an ion entrance location of the cell to a point at an ion exit location of the cell, or for focusing ions diverging from a point at the ion entrance location to travel parallel at the ion exit location. Each ion-optical cell comprises a plurality of electrostatic sectors having different deflection radii for bending the flight path of the ions in the deflection (x-y) plane. The ion-optical elements in each cell are configured to generate electric fields that either (i) have mirror symmetry in the deflection plane about a line in the deflection plane that is perpendicular to a mean ion path through the cell at a point half way along the mean ion path through the cell, or (ii) have point symmetry in the deflection plane about a point in the deflection plane that is half way along the mean ion path through the cell. The ion-optical elements are arranged and configured such that, in the frame of reference of the ions, the ions are guided through the deflection plane in the ion-optical cells along mean flight paths that are of the same shape and length in each ion-optical cell.

5. 发明申请

US20200373144A1 ION INJECTION INTO MULTI-PASS MASS SPECTROMETERS 审中-公开
公开(公告)号：US20200373144A1
公开(公告)日：2020-11-26
申请号：US16636873
申请日：2018-07-26
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov
IPC分类号： H01J49/40 , H01J49/06 , H01J49/00 , H01J49/02 , H01J49/42
摘要： An improved multi-pass time-of-flight or electrostatic trap mass spectrometer (70) with an orthogonal accelerator, applicable to mirror based multi-reflecting (MR) or multi-turn (MT) analyzers. The orthogonal accelerator (64) is tilted and after first ion reflection or turn the ion packets are back deflected with a compensated deflector (40) by the same angle α to compensate for the time-front steering and for the chromatic angular spreads. The focal distance of deflector (40) is control by Matsuda plates or other means for producing quadrupolar field in the deflector. Interference with the detector rim is improved with dual deflector (68). The proposed improvements allow substantial extension of flight path and number of ion turns or reflections. The problems of analyzer angular misalignments by tilting of ion mirror (71) is compensated by electrical adjustments of ion beam (63) energy and deflection angles in deflectors (40) and (68).

6. 发明申请

US20200373143A1 ION MIRROR FOR MULTI-REFLECTING MASS SPECTROMETERS 审中-公开
公开(公告)号：US20200373143A1
公开(公告)日：2020-11-26
申请号：US16636865
申请日：2018-07-26
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov , Mikhail Yavor
IPC分类号： H01J49/40
摘要： Improved ion mirrors (30) (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure (35) at the ion retarding region was found to produce major tilt of ion packets time fronts (39). Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.

7. 发明申请

US20200168448A1 FIELDS FOR MULTI-REFLECTING TOF MS 审中-公开
公开(公告)号：US20200168448A1
公开(公告)日：2020-05-28
申请号：US16636957
申请日：2018-07-26
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov , Mikhail Yavor
IPC分类号： H01J49/40 , H01J49/22 , H01J49/00 , H01J49/06
摘要： A multi-reflecting time-of-flight mass spectrometer MR TOF with an orthogonal accelerator (40) is improved with at least one deflector (30) and/or (30R) in combination with at least one wedge field (46) for denser folding of ion rays (73). Systematic mechanical misalignments (72) of ion mirrors (71) may be compensated by electrical tuning of the instrument, as shown by resolution improvements between simulated peaks for non compensated case (74) and compensated one (75), and/or by an electronically controlled global electrostatic wedge/arc field within ion mirror (71).

8. 发明申请

US20200168447A1 ION GUIDE WITHIN PULSED CONVERTERS 审中-公开
公开(公告)号：US20200168447A1
公开(公告)日：2020-05-28
申请号：US16636948
申请日：2018-07-26
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov
IPC分类号： H01J49/40 , H01J49/42 , H01J49/06 , H01J49/02 , H01J49/00 , H01J49/28
摘要： Elongation of orthogonal accelerators is assisted by ion spatial transverse confinement within novel confinement means, formed by spatial alternation of electrostatic quadrupolar field (22). Contrary to prior art RF confinement means, the static means provide mass independent confinement and may be readily switched. Spatial confinement defines ion beam (29) position, prevents surfaces charging, assists forming wedge and bend fields, and allows axial fields in the region of pulsed ion extraction, this way improving the ion beam admission at higher energies and the spatial focusing of ion packets in multi- reflecting, multi-turn and singly reflecting TOF MS or electrostatic traps.

9. 发明申请

US20180366313A1 IMAGING MASS SPECTROMETER 审中-公开
公开(公告)号：US20180366313A1
公开(公告)日：2018-12-20
申请号：US15776704
申请日：2016-11-16
申请人： Micromass UK Limited , LECO CORPORATION
发明人： John Brian Hoyes , Anatoly Verenchikov , Mikhail Yavor , Keith Richardson , Jason Wildgoose
IPC分类号： H01J49/40 , H01J49/06
CPC分类号： H01J49/406 , H01J49/0004 , H01J49/061 , H01J49/062 , H01J49/40 , H01J49/401
摘要： A time-of-flight mass spectrometer is disclosed comprising: an ion deflector (305) configured to deflect ions to different positions in a first array of positions at different times; a position sensitive ion detector (187); and ion optics (180) arranged and configured to guide ions from the first array of positions to the position sensitive detector (187) so as to map ions from the first array of positions to a second array of positions on the position sensitive detector (187); wherein the ion optics includes at least one ion mirror for reflecting the ions.

10. 发明授权

US11756782B2 Ion mirror for multi-reflecting mass spectrometers 有权
公开(公告)号：US11756782B2
公开(公告)日：2023-09-12
申请号：US17586421
申请日：2022-01-27
申请人： Micromass UK Limited
发明人： Anatoly Verenchikov , Mikhail Yavor
IPC分类号： H01J49/40
CPC分类号： H01J49/406 , H01J49/405
摘要： Improved ion mirrors 30 (FIG. 3) are proposed for multi-reflecting TOF MS and electrostatic traps. Minor and controlled variation by means of arranging a localized wedge field structure 35 at the ion retarding region was found to produce major tilt of ion packets time fronts 39. Combining wedge reflecting fields with compensated deflectors is proposed for electrically controlled compensation of local and global misalignments, for improved ion injection and for reversing ion motion in the drift direction. Fine ion optical properties of methods and embodiments are verified in ion optical simulations.

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