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1. 发明申请

US20180364102A1 Colorimetric Device And Printing Apparatus 审中-公开
公开(公告)号：US20180364102A1
公开(公告)日：2018-12-20
申请号：US15535871
申请日：2015-11-24
申请人： KONICA MINOLTA, INC.
发明人： Yoshiyuki NAGASHIMA , Yuzuru YAMAMOTO
IPC分类号： G01J3/52 , G01J3/02 , G01J3/46 , H04N1/00
CPC分类号： G01J3/524 , B41F33/0036 , G01J3/02 , G01J3/0202 , G01J3/46 , G01J3/465 , G01J3/52 , G01N21/86 , G01N2021/8654 , G01N2021/8663 , H04N1/00087 , H04N1/00602
摘要： A backing member (50a) is pressed in a perpendicular direction (D3) by a predetermined sheet conveyed to a colorimetric position (P), and is disposed behind the predetermined sheet at the colorimetric position (P) when viewed from a colorimetric unit (40). A supporter (90) supports the backing member (50a) in a manner that the backing member (50a) can move in the perpendicular direction (D3). Holders (23a, 23b, 23c) hold a color tile member (80a) disposed on the backing member (50a) in a state that the amount of movement of the backing member (50a) in the perpendicular direction (D3) by the color tile member (80a) being thicker than the predetermined sheet and disposed on the backing member (50a) is larger than the amount of movement of the backing member (50a) in the perpendicular direction (D3) by the predetermined sheet.

2. 发明授权

US10054484B2 Measuring arrangement for reflection measurement 有权
公开(公告)号：US10054484B2
公开(公告)日：2018-08-21
申请号：US15328523
申请日：2015-06-22
申请人： Carl Zeiss Spectroscopy GmgH
发明人： Jörg Margraf , Jens Mondry
IPC分类号： G01N21/55 , G01J3/02 , G01N21/47 , G01N21/27 , G01N21/86 , G01J3/50
CPC分类号： G01J3/0251 , G01J3/0208 , G01J3/021 , G01J3/0218 , G01J3/0237 , G01J3/0291 , G01J3/08 , G01J3/10 , G01J3/50 , G01J2001/0481 , G01N21/27 , G01N21/4738 , G01N21/474 , G01N21/86 , G01N2021/4754 , G01N2021/8618 , G01N2201/065
摘要： The invention relates to a measuring arrangement for detecting an absolute reflection spectrum of a sample in a process for producing the sample. It comprises a light source for generating measurement light, a homogenizer for generating a uniform spatial illuminance distribution of the measurement light; a movable reflector and a receiver for collecting the measurement light reflected from the sample and/or the reflector. According to the invention, the reflector both for a reference measurement and for a sample measurement is positioned in an observation beam path and arranged on the same side of the sample as the light source in order to feed the reflected measurement light to the receiver.

3. 发明授权

US10011129B2 Conveyance detection apparatus, conveying apparatus, and recording apparatus 有权
公开(公告)号：US10011129B2
公开(公告)日：2018-07-03
申请号：US15618411
申请日：2017-06-09
申请人： CANON COMPONENTS, INC.
发明人： Masashi Ishimaru , Yoshihisa Negishi , Kenichi Matsumoto , Yoshihiro Hattori
IPC分类号： B41J13/00 , B65H7/14 , B65H5/06 , G03G15/00 , B41J11/00 , G01N21/86
CPC分类号： B41J13/0009 , B41J11/0095 , B65H5/062 , B65H7/14 , G01N21/86 , G03G15/5025 , G03G15/6529 , G03G15/6555
摘要： Provided is a control unit of a conveying apparatus, the conveying apparatus including: a conveying unit that conveys recording paper along a conveyance path; an imaging unit that images the recording paper; and a light emitting unit arranged on an opposite side of the imaging unit across the conveyance path, wherein the control unit detects conveyance information of the recording paper based on image information of the recording paper imaged by the imaging unit in a state in which light from the light emitting unit is transmitted through the recording paper. The control unit detects the conveyance information of the recording paper based on a plurality of images of the recording paper imaged at different timings by the imaging unit.

4. 发明授权

US09733193B2 Measurement of industrial products manufactured by extrusion techniques 有权
公开(公告)号：US09733193B2
公开(公告)日：2017-08-15
申请号：US14656106
申请日：2015-03-12
申请人： Proton Products International Limited
发明人： John Kyriakis
IPC分类号： G01B11/10 , G01N21/86 , G01B11/04 , G01B11/06 , G01B11/24 , G01N21/3581 , G01N21/952
CPC分类号： G01N21/86 , G01B11/046 , G01B11/0616 , G01B11/0691 , G01B11/10 , G01B11/2433 , G01N21/3581 , G01N21/952
摘要： The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.

5. 发明申请

US20170211975A1 MEASURING ARRANGEMENT FOR REFLECTION MEASUREMENT 审中-公开
公开(公告)号：US20170211975A1
公开(公告)日：2017-07-27
申请号：US15328523
申请日：2015-06-22
申请人： CARL ZEISS SPECTROSCOPY GMBH
发明人： Jörg MARGRAF , Jens MONDRY
IPC分类号： G01J3/02 , G01J3/50 , G01N21/86 , G01N21/47 , G01N21/27
CPC分类号： G01J3/0251 , G01J3/0208 , G01J3/021 , G01J3/0218 , G01J3/0237 , G01J3/0291 , G01J3/08 , G01J3/10 , G01J3/50 , G01J2001/0481 , G01N21/27 , G01N21/4738 , G01N21/474 , G01N21/86 , G01N2021/4754 , G01N2021/8618 , G01N2201/065
摘要： The invention relates to a measuring arrangement for detecting an absolute reflection spectrum of a sample in a process for producing the sample. It comprises a light source for generating measurement light, a homogenizer for generating a uniform spatial illuminance distribution of the measurement light; a movable reflector and a receiver for collecting the measurement light reflected from the sample and/or the reflector. According to the invention, the reflector both for a reference measurement and for a sample measurement is positioned in an observation beam path and arranged on the same side of the sample as the light source in order to feed the reflected measurement light to the receiver.

6. 发明申请

US20170023469A1 SYSTEM FOR DETERMINING AT LEAST ONE PROPERTY OF A SHEET DIELECTRIC SAMPLE USING TERAHERTZ RADIATION 审中-公开
标题翻译：使用TERAHERTZ辐射确定片材电介质样品的至少一个性质的系统
公开(公告)号：US20170023469A1
公开(公告)日：2017-01-26
申请号：US15154040
申请日：2014-11-14
申请人： Picometrix, LLC
发明人： David Zimdars , Jeffrey S. White , Steven Williamson , Irl Duling
IPC分类号： G01N21/3586 , G01N21/86 , G01N21/21 , G01B11/06 , G01N21/41
CPC分类号： G01N21/3586 , G01B11/06 , G01N21/21 , G01N21/3559 , G01N21/3581 , G01N21/41 , G01N21/86 , G01N2021/8663 , G01N2201/06113 , G01N2201/0697 , G01N2201/08
摘要： A system for determining at least one property of a sheet dielectric sample using terahertz radiation includes at least one terahertz transmitter configured to output a pulse of terahertz radiation, a terahertz receiver configured to receive at least a portion of the pulse of terahertz radiation, wherein the terahertz receiver is configured to output a measured waveform based on the tera-hertz radiation received by the terahertz receiver, and a control unit in communication with the terahertz receiver. Wherein the control unit is configured to choose at least one region of interest of the measured waveform, compare the at least one region of interest of the measured waveform to a model waveform, vary at least one parameter of a model waveform to minimize the difference between the model waveform and the measured waveform.
摘要翻译：用于使用太赫兹辐射来确定片状电介质样品的至少一个性质的系统包括被配置为输出太赫兹辐射的脉冲的至少一个太赫兹发射器，被配置为接收太赫兹辐射的脉冲的至少一部分的太赫兹接收器，其中，太赫兹接收器被配置为基于由太赫兹接收器接收的天线辐射输出测量波形，以及与太赫兹接收器通信的控制单元。其中，所述控制单元被配置为选择所述测量波形的至少一个感兴趣区域，将所述测量波形的所述至少一个感兴趣区域与模型波形进行比较，改变模型波形的至少一个参数以最小化模型波形和测量波形。

7. 发明申请

US20160299085A1 A METHOD OF MEASURING A PARAMETER OF A COMPOSITE MOULDING MATERIAL 有权
标题翻译：测量复合材料成型材料参数的方法
公开(公告)号：US20160299085A1
公开(公告)日：2016-10-13
申请号：US15035962
申请日：2014-11-20
申请人： HEXCEL COMPOSITES LIMITED
发明人： Emilie Fisset , John Ellis , Stuart Munday
IPC分类号： G01N21/86 , B29C65/00 , B29C70/16 , G01N29/11 , G01N23/16
CPC分类号： G01N21/86 , B29C66/45 , B29C70/16 , B29K2101/12 , B29K2105/0872 , B29K2307/04 , G01N23/16 , G01N29/11 , G01N2223/615 , G01N2291/0231
摘要： A method of controlling a process for the manufacture of a multicomponent sheet material having a desired pre-determined parameter comprising applying electromagnetic energy to interact with the sheet material whereby the interaction modifies the applied energy, detecting the modified energy, comparing the modified energy or data derived from it with data relating to the pre-determined parameter and modifying at least one step of the process whereby the data relating to the modified energy is modified towards the data relating to the predetermined parameter.
摘要翻译：一种控制用于制造具有期望的预定参数的多组分片材的方法的方法，包括施加电磁能以与片材相互作用，由此相互作用改变施加的能量，检测修改的能量，比较修改的能量或数据从其中导出与预定参数相关的数据并修改该过程的至少一个步骤，由此将与修改的能量相关的数据修改为与预定参数有关的数据。

8. 发明申请

US20160265901A1 MEASUREMENT OF INDUSTRIAL PRODUCTS MANUFACTURED BY EXTRUSION TECHNIQUES 有权
标题翻译：通过挤出技术制造的工业产品的测量
公开(公告)号：US20160265901A1
公开(公告)日：2016-09-15
申请号：US14656106
申请日：2015-03-12
申请人： Proton Products International Limited
发明人： John Kyriakis
IPC分类号： G01B11/00 , G01J1/04
CPC分类号： G01N21/86 , G01B11/046 , G01B11/0616 , G01B11/0691 , G01B11/10 , G01B11/2433 , G01N21/3581 , G01N21/952
摘要： The invention relates to apparatus for monitoring an extruded product moving in an inline extrusion process so as to effect quality control of the process by continuously measuring dimensional parameters and determining the existence of contaminants in the extrusion. The apparatus makes use of Terahertz radiation which is adapted to provide a curtain of parallel rays of the radiation which is scanned across the product as the product passes therethrough in a linear manner. The composition of the emitted radiation received after the scanning process is subject to an imaging analysis to determine the dimensional parameters of the moving products. The imaging analysis involves applying correction values to the measured transit times of the rays crossing the products which depends on its position within the curtain of rays thereby to remove inaccuracies in the final measurement results.
摘要翻译：本发明涉及用于监测在直列挤压工艺中移动的挤出产品的装置，以便通过连续地测量尺寸参数并确定挤压中的污染物的存在来实现该过程的质量控制。该装置利用太赫兹辐射，该太赫兹辐射适于提供当产品以线性方式穿过其时跨过产品扫描的辐射的平行射线的帘幕。在扫描过程之后接收的发射辐射的组成进行成像分析以确定移动产品的尺寸参数。成像分析包括将校正值应用于穿过产品的射线的测量的传播时间，这取决于其在光幕内的位置，从而消除最终测量结果中的不准确。

9. 发明授权

US09423791B2 Sensor system and method for determining paper sheet quality parameters 有权
标题翻译：用于确定纸张质量参数的传感器系统和方法
公开(公告)号：US09423791B2
公开(公告)日：2016-08-23
申请号：US14218603
申请日：2014-03-01
申请人： ABB RESEARCH LTD
发明人： Jacobus Lodevicus Martinus Van Mechelen , Hannes Merbold
IPC分类号： G06F19/00 , G06F7/66 , G05B19/418 , G01N21/86 , G01B11/06 , G01N33/34 , G01N21/3581 , G01N21/3559
CPC分类号： G05B19/41875 , F03D7/045 , F03D7/046 , F03D7/048 , G01B11/06 , G01B11/0625 , G01N21/3559 , G01N21/3581 , G01N21/86 , G01N33/346 , G05B13/04 , G05B13/041 , G05B2219/2619 , Y02B10/30
摘要： A non-contact sensor system and method are disclosed for determining paper sheet quality parameters such as caliper, basis weight and sheet moisture based on THz radiation. The method can include emitting, by an emitter system, a THz radiation signal towards paper sheet material such that the THz radiation interacts with the paper sheet material; detecting, by a detector system, a time and/or frequency dependent response of the THz radiation signal having interacted with the paper sheet material; determining model parameters of a physical model by optimizing the model parameters such that a predicted response of the physical model is fitted to the detected response, the model parameters being indicative of transmission and/or reflection coefficients at interfaces of the paper sheet material with surrounding media; and determining, from the determined model parameters, at least some of the paper sheet quality parameters.
摘要翻译：公开了一种非接触传感器系统和方法，用于基于太赫兹辐射来确定纸张质量参数，例如卡尺，基重和片材湿度。该方法可以包括通过发射器系统向纸张材料发射THz辐射信号，使得THz辐射与纸张材料相互作用; 通过检测器系统检测已经与纸张材料相互作用的THz辐射信号的时间和/或频率相关响应; 通过优化模型参数来确定物理模型的模型参数，使得物理模型的预测响应适应于检测到的响应，模型参数表示纸张材料与周围介质的界面处的透射和/或反射系数 ; 以及从所确定的模型参数确定所述纸张质量参数的至少一些。

10. 发明申请

US20160122946A1 MEASUREMENT OF WEB 有权
标题翻译： WEB测量
公开(公告)号：US20160122946A1
公开(公告)日：2016-05-05
申请号：US14894463
申请日：2014-05-28
申请人： VALMET AUTOMATION OY
发明人： Markku MÄNTYLÄ
IPC分类号： D21F7/00 , G01B11/06 , B05C11/10 , D21F7/06 , D21G9/00 , B65H7/02 , G01G17/02
CPC分类号： D21F7/003 , B05C11/1015 , B65H7/02 , D21F7/06 , D21G9/0009 , G01B7/06 , G01B11/06 , G01B11/0691 , G01G17/02 , G01N21/86 , G01N33/34
摘要： An apparatus including a caliper measuring sensor arrangement, a mass measuring sensor arrangement, and a stabilizing arrangement. The caliper measuring sensor arrangement measures caliper of the web. The mass measuring sensor arrangement measures at least one of the following: a basis weight of the web, a moisture content, a water weight, dry weight of the web. The stabilizing arrangement stabilizes the web. The stabilizing arrangement including at least a part of the mass measuring sensor arrangement.
摘要翻译：一种包括卡尺测量传感器装置，质量测量传感器装置和稳定装置的装置。卡尺测量传感器装置测量网的卡尺。质量测量传感器装置测量以下至少一个：幅材的基重，水分含量，水重量，幅材的干重。稳定装置稳定网。所述稳定装置包括所述质量测量传感器装置的至少一部分。

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