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1. 发明申请

US20070173043A1 Ion implantation system having variable screen aperture and ion implantation method using the same 审中-公开
标题翻译：具有可变屏幕孔径的离子注入系统和使用其的离子注入方法
公开(公告)号：US20070173043A1
公开(公告)日：2007-07-26
申请号：US11655114
申请日：2007-01-19
申请人： Seung-hee Lee , Young-soo Yang , Seung-chul Kim , Chan-seung Choi , Won-bae Jang , Min-suk Kim
发明人： Seung-hee Lee , Young-soo Yang , Seung-chul Kim , Chan-seung Choi , Won-bae Jang , Min-suk Kim
IPC分类号： H01L21/425
CPC分类号： H01J37/3171 , H01J2237/31703 , H01L21/265 , H01L21/68764
摘要： An ion implantation system includes a source portion, a beam line portion, a target chamber having a platen, and a Faraday portion having a dose cup and a first variable screen aperture, wherein the platen is capable of moving in a second direction and supporting a semiconductor substrate, and the first variable screen aperture includes a first opening having a first adjustable width along a first direction.
摘要翻译：离子注入系统包括源部分，束线部分，具有压板的靶室和具有剂量杯和第一可变筛孔的法拉第部分，其中压板能够沿第二方向移动并支撑半导体衬底，并且第一可变屏幕孔包括沿着第一方向具有第一可调节宽度的第一开口。

2. 发明申请

US20100279442A1 SEMICONDUCTOR PROCESS EVALUATION METHODS INCLUDING VARIABLE ION IMPLANTING CONDITIONS 有权
标题翻译：半导体过程评估方法，包括可变离子植入条件
公开(公告)号：US20100279442A1
公开(公告)日：2010-11-04
申请号：US12834201
申请日：2010-07-12
申请人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
发明人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
IPC分类号： H01L21/66
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Semiconductor process evaluation methods perform multiple scans of a test semiconductor substrate (e.g., test wafer) using ion beams under different ion implanting conditions. Parameters of the test semiconductor substrate that was scanned using the ion beams under different ion implanting conditions are then measured to conduct the semiconductor process evaluation.
摘要翻译：半导体工艺评估方法在不同离子注入条件下使用离子束进行测试半导体衬底（例如，测试晶片）的多次扫描。然后测量在不同离子注入条件下使用离子束扫描的测试半导体衬底的参数，以进行半导体工艺评估。

3. 发明授权

US07781234B2 Semiconductor process evaluation methods including variable ion implanting conditions 有权
标题翻译：包括可变离子注入条件的半导体工艺评估方法
公开(公告)号：US07781234B2
公开(公告)日：2010-08-24
申请号：US11563756
申请日：2006-11-28
申请人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
发明人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
IPC分类号： H01L21/00
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Semiconductor process evaluation methods perform multiple scans of a test semiconductor substrate (e.g., test wafer) using ion beams under different ion implanting conditions. Parameters of the test semiconductor substrate that was scanned using the ion beams under different ion implanting conditions are then measured to conduct the semiconductor process evaluation.
摘要翻译：半导体工艺评估方法在不同离子注入条件下使用离子束进行测试半导体衬底（例如，测试晶片）的多次扫描。然后测量在不同离子注入条件下使用离子束扫描的测试半导体衬底的参数，以进行半导体工艺评估。

4. 发明授权

US07972874B2 Semiconductor process evaluation methods including variable ion implanting conditions 有权
标题翻译：包括可变离子注入条件的半导体工艺评估方法
公开(公告)号：US07972874B2
公开(公告)日：2011-07-05
申请号：US12834201
申请日：2010-07-12
申请人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
发明人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
IPC分类号： G01R31/26 , H01L21/66
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Semiconductor process evaluation methods perform multiple scans of a test semiconductor substrate (e.g., test wafer) using ion beams under different ion implanting conditions. Parameters of the test semiconductor substrate that was scanned using the ion beams under different ion implanting conditions are then measured to conduct the semiconductor process evaluation.
摘要翻译：半导体工艺评估方法在不同离子注入条件下使用离子束进行测试半导体衬底（例如，测试晶片）的多次扫描。然后测量在不同离子注入条件下使用离子束扫描的测试半导体衬底的参数，以进行半导体工艺评估。

5. 发明申请

US20070155028A1 Semiconductor Process Evaluation Methods Including Variable Ion Implanting Conditions 有权
标题翻译：包括可变离子注入条件的半导体工艺评估方法
公开(公告)号：US20070155028A1
公开(公告)日：2007-07-05
申请号：US11563756
申请日：2006-11-28
申请人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
发明人： Won-bae Jang , Seung-chul Kim , Chan-seung Choi , Min-suk Kim , Chee-wan Kim , Sun-yong Lee , Sang-rok Hah
IPC分类号： H01L21/66
CPC分类号： H01L22/14 , H01L2924/0002 , H01L2924/00
摘要： Semiconductor process evaluation methods perform multiple scans of a test semiconductor substrate (e.g., test wafer) using ion beams under different ion implanting conditions. Parameters of the test semiconductor substrate that was scanned using the ion beams under different ion implanting conditions are then measured to conduct the semiconductor process evaluation.
摘要翻译：半导体工艺评估方法在不同离子注入条件下使用离子束进行测试半导体衬底（例如，测试晶片）的多次扫描。然后测量在不同离子注入条件下使用离子束扫描的测试半导体衬底的参数，以进行半导体工艺评估。

6. 发明授权

US07377119B2 Air conditioning system and control method thereof 有权
标题翻译：空调系统及其控制方法
公开(公告)号：US07377119B2
公开(公告)日：2008-05-27
申请号：US11165240
申请日：2005-06-24
申请人： Seung-chul Kim , Hyeong-joon Seo , Jun-pyo Lee , Jae-hyo Jeong , Jung-chul Choi
发明人： Seung-chul Kim , Hyeong-joon Seo , Jun-pyo Lee , Jae-hyo Jeong , Jung-chul Choi
IPC分类号： F25B13/00 , F25B41/00
CPC分类号： F25B27/02 , F24F2110/12 , F25B13/00 , F25B2313/0213 , F25B2313/02523 , F25B2313/02741 , F25B2500/31 , F25B2700/1931 , F25B2700/1933 , F25B2700/2104 , F25B2700/2106 , Y02A30/274
摘要： An air conditioning system includes an indoor heat exchanging unit, an outdoor heat exchanging unit, a compressor forming a closed loop together with the indoor and outdoor heat exchanging units to compress refrigerant, and a compressor driver to drive the compressor. The air conditioning system also includes an outdoor temperature sensor to sense outdoor temperature, a high pressure sensor to sense a pressure of the refrigerant discharged from the compressor, a low pressure sensor to sense the pressure of the refrigerant introduced into the compressor, a bypass pipe to connect a refrigerant pipe disposed between the indoor heat and outdoor heat exchanging units with a refrigerant pipe disposed in an influx part of the compressor, a bypass valve to open and close the bypass pipe, and a controller to open the bypass valve when the pressure sensed by the low pressure sensor is a predetermined target low pressure or is below the predetermined target low pressure, and to close the bypass valve when the pressure sensed by the high pressure sensor is over a predetermined target high pressure, under a condition in which the outdoor temperature sensed by the outdoor temperature sensor is a predetermined reference temperature or is below the predetermined reference temperature during a heating operation. Thus, the air conditioning system and a control method thereof, is improved in heating effect while performing a heating operation under a condition in which the outdoor temperature is low.
摘要翻译：空调系统包括室内热交换单元，室外热交换单元，与室内和室外热交换单元一起形成闭环的压缩机以压缩制冷剂;以及压缩机驱动器来驱动压缩机。空调系统还包括感测室外温度的室外温度传感器，用于感测从压缩机排出的制冷剂的压力的高压传感器，用于感测引入压缩机的制冷剂的压力的低压传感器，旁通管将布置在室内热交换单元和室外热交换单元之间的制冷剂管道与设置在压缩机的流入部分的制冷剂管连接，旁通阀打开和关闭旁通管;以及控制器，当压力由低压传感器检测到的是预定的目标低压或低于预定目标低压，并且当高压传感器感测到的压力超过预定目标高压时关闭旁通阀，由室外温度传感器感测到的室外温度是预定的基准温度或低于预定的温度在加热操作期间的温度。因此，在室外温度低的条件下进行制热运转时，空气调节系统及其控制方法得到改善。

7. 发明授权

US08542564B2 Method for designating disk recording capacity and apparatus therefor 失效
标题翻译：指定磁盘记录容量的方法及其设备
公开(公告)号：US08542564B2
公开(公告)日：2013-09-24
申请号：US10942770
申请日：2004-09-17
申请人： Sang-hyun Jo , Seung-chul Kim
发明人： Sang-hyun Jo , Seung-chul Kim
IPC分类号： G11B5/09
CPC分类号： G11B27/36 , G11B7/0045 , G11B7/0953 , G11B7/0956 , G11B19/12
摘要： A method of designating a disk recording capacity and an optical disk recording apparatus using the method, where a maximum recording capacity is designated by measuring an external disturbance for disk regions. The method of designating a disk recording capacity includes: partitioning a disk into a plurality of disk regions, and measuring external disturbance at the disk regions; setting a disk speed based on the measured external disturbance, and designating disk regions excluding the disk regions where the external disturbance is measured as recordable disk regions; and calculating a maximum disk recording capacity based on the designated recordable disk regions.
摘要翻译：一种指定盘记录容量的方法和使用该方法的光盘记录装置，其中通过测量盘区的外部干扰来指定最大记录容量。指定盘记录容量的方法包括：将盘划分成多个盘区，测量盘区的外部干扰; 基于所测量的外部干扰设置磁盘速度，并且将除了测量外部干扰的磁盘区域之外的磁盘区域指定为可记录磁盘区域; 以及基于指定的可记录盘区域计算最大盘记录容量。

8. 发明授权

US07593295B2 Apparatus and method for compensating for defect of optical disc 失效
标题翻译：补偿光盘缺陷的装置和方法
公开(公告)号：US07593295B2
公开(公告)日：2009-09-22
申请号：US10940846
申请日：2004-09-15
申请人： Seung-chul Kim , Kwan-ho Chun
发明人： Seung-chul Kim , Kwan-ho Chun
IPC分类号： G11B7/00
CPC分类号： G11B7/0948 , G11B20/18
摘要： An apparatus for and a method of compensating for a defect of an optical disc. The method includes: detecting a disc defect zone according to an RF sum signal level read from the optical disc; inverting a phase of a tracking error signal generated during a first specified time from the start of the defect zone; and holding a tracking servo control by adding components of the inverted tracking error signal to a tracking drive signal for a second specified time.
摘要翻译：一种用于补偿光盘缺陷的装置和方法。该方法包括：根据从光盘读取的RF和信号电平检测光盘缺陷区; 反转在从缺陷区的开始起的第一指定时间期间产生的跟踪误差信号的相位; 以及通过将反转跟踪误差信号的分量加到跟踪驱动信号中来持续第二指定时间的跟踪伺服控制。

9. 发明申请

US20060032254A1 Air conditioning system and control method thereof 有权
标题翻译：空调系统及其控制方法
公开(公告)号：US20060032254A1
公开(公告)日：2006-02-16
申请号：US11165240
申请日：2005-06-24
申请人： Seung-chul Kim , Hyeong-joon Seo , Jun-pyo Lee , Jae-hyo Jeong , Jung-chul Choi
发明人： Seung-chul Kim , Hyeong-joon Seo , Jun-pyo Lee , Jae-hyo Jeong , Jung-chul Choi
IPC分类号： F25B41/00 , F25B49/00
CPC分类号： F25B27/02 , F24F2110/12 , F25B13/00 , F25B2313/0213 , F25B2313/02523 , F25B2313/02741 , F25B2500/31 , F25B2700/1931 , F25B2700/1933 , F25B2700/2104 , F25B2700/2106 , Y02A30/274
摘要： An air conditioning system includes an indoor heat exchanging unit, an outdoor heat exchanging unit, a compressor forming a closed loop together with the indoor and outdoor heat exchanging units to compress refrigerant, and a compressor driver to drive the compressor. The air conditioning system also includes an outdoor temperature sensor to sense outdoor temperature, a high pressure sensor to sense a pressure of the refrigerant discharged from the compressor, a low pressure sensor to sense the pressure of the refrigerant introduced into the compressor, a bypass pipe to connect a refrigerant pipe disposed between the indoor heat and outdoor heat exchanging units with a refrigerant pipe disposed in an influx part of the compressor, a bypass valve to open and close the bypass pipe, and a controller to open the bypass valve when the pressure sensed by the low pressure sensor is a predetermined target low pressure or is below the predetermined target low pressure, and to close the bypass valve when the pressure sensed by the high pressure sensor is over a predetermined target high pressure, under a condition in which the outdoor temperature sensed by the outdoor temperature sensor is a predetermined reference temperature or is below the predetermined reference temperature during a heating operation. Thus, the air conditioning system and a control method thereof, is improved in heating effect while performing a heating operation under a condition in which the outdoor temperature is low.
摘要翻译：空调系统包括室内热交换单元，室外热交换单元，与室内和室外热交换单元一起形成闭环的压缩机以压缩制冷剂;以及压缩机驱动器来驱动压缩机。空调系统还包括感测室外温度的室外温度传感器，用于感测从压缩机排出的制冷剂的压力的高压传感器，用于感测引入压缩机的制冷剂的压力的低压传感器，旁通管将布置在室内热交换单元和室外热交换单元之间的制冷剂管道与设置在压缩机的流入部分的制冷剂管连接，旁通阀打开和关闭旁通管;以及控制器，当压力由低压传感器检测到的是预定的目标低压或低于预定目标低压，并且当高压传感器感测到的压力超过预定目标高压时关闭旁通阀，由室外温度传感器感测到的室外温度是预定的基准温度或低于预定的温度在加热操作期间的温度。因此，在室外温度低的条件下进行制热运转时，空气调节系统及其控制方法得到改善。

10. 发明申请

US20050207300A1 Method for designating disk recording capacity and apparatus therefor 失效
标题翻译：用于指定磁盘记录容量的方法及其装置
公开(公告)号：US20050207300A1
公开(公告)日：2005-09-22
申请号：US10942770
申请日：2004-09-17
申请人： Sang-hyun Jo , Seung-chul Kim
发明人： Sang-hyun Jo , Seung-chul Kim
IPC分类号： G11B5/09 , G11B7/00 , G11B7/004 , G11B7/0045 , G11B7/095 , G11B19/12 , G11B20/18 , G11B27/36
CPC分类号： G11B27/36 , G11B7/0045 , G11B7/0953 , G11B7/0956 , G11B19/12
摘要： A method of designating a disk recording capacity and an optical disk recording apparatus using the method, where a maximum recording capacity is designated by measuring an external disturbance for disk regions. The method of designating a disk recording capacity includes: partitioning a disk into a plurality of disk regions, and measuring external disturbance at the disk regions; setting a disk speed based on the measured external disturbance, and designating disk regions excluding the disk regions where the external disturbance is measured as recordable disk regions; and calculating a maximum disk recording capacity based on the designated recordable disk regions.
摘要翻译：一种指定盘记录容量的方法和使用该方法的光盘记录装置，其中通过测量盘区的外部干扰来指定最大记录容量。指定盘记录容量的方法包括：将盘划分成多个盘区，测量盘区的外部干扰; 基于所测量的外部干扰设置磁盘速度，并且将除了测量外部干扰的磁盘区域之外的磁盘区域指定为可记录磁盘区域; 以及基于所述指定的可记录盘区域计算最大盘记录容量。

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