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1. 发明授权

US4816897A Chrominance to luminance delay and gain measurement display 失效
标题翻译：色度到亮度延迟和增益测量显示
公开(公告)号：US4816897A
公开(公告)日：1989-03-28
申请号：US142093
申请日：1988-01-11
申请人： Tomoo Konishi
发明人： Tomoo Konishi
IPC分类号： H04N17/02 , H04N17/00
CPC分类号： H04N17/02
摘要： A chrominance to luminance gain and delay measurement display shows gain and delay inequalities due to differences between luminance and chrominance chanels of a video device as a point within a rectangular coordinate display system with respect to established tolerance limits. An appropriate test signal having bar and modulated pulse waveforms is selected from digitized video data stored in a field store acquisition memory. Luminance and chrominance arrays are derived from the modulated pulse waveform. The center points for each array are identified and displayed as a time difference between the center points along one axis of the display and as an amplitude ratio (chrominance/luminance) between the center points along an orthogonal axis of the display. The display includes a tolerance window so that an operator can readily observe whether the chrominance to luminance gain and delay is within established tolerances.
摘要翻译：对于亮度增益和延迟测量显示的色度显示出由于视频设备的亮度和色度通道之间的差异，作为直角坐标显示系统内相对于建立的公差极限的点的差异的增益和延迟不等式。从存储在现场存储获取存储器中的数字化视频数据中选择具有条形和调制脉冲波形的合适的测试信号。亮度和色度阵列源自调制脉冲波形。每个阵列的中心点被识别并显示为沿着显示器的一个轴的中心点之间的时间差，并且沿着显示器的正交轴线的中心点之间的振幅比（色度/亮度）显示。显示器包括公差窗口，使得操作者可以容易地观察到色度对亮度增益和延迟是否在建立的公差内。

2. 发明授权

US4800571A Timing jitter measurement display 失效
标题翻译：定时抖动测量显示
公开(公告)号：US4800571A
公开(公告)日：1989-01-24
申请号：US142092
申请日：1988-01-11
申请人： Tomoo Konishi
发明人： Tomoo Konishi
IPC分类号： G01R29/02 , H04N5/95 , H04N17/06 , H04B3/46
CPC分类号： H04N5/95 , H04N17/06
摘要： A timing pulse jitter measurement display suitable for observing large jitter deviations, such as those caused by head changes between fields of video data in a video tape or cassette recorder (VTR or VCR), selects a range of data samples about each timing pulse for processing. The data samples are acquired using a stable, jitter free, precision clock. Residual signals, such as residual subcarrier in a video signal, are removed from the selected data samples and a precise timing point is determined for each timing interval with respect to a stable reference point. The deviations of the timing points from a baseline, derived from the precision clock and representing the stable reference points occurring at a nominal timing interval, are displayed, and means provided for determining peak to peak jitter along any portion of the acquired set of displayed data samples. Averaging also is provided between acquisition sets of data samples to reduce noise and highlight phase errors due to some repetitive influence.
摘要翻译：适用于观察大的抖动偏差的定时脉冲抖动测量显示，例如由录像带或录像机（VTR或VCR）中的视频数据的场之间的磁头变化引起的抖动偏差，选择关于每个定时脉冲的数据采样范围，以进行处理。使用稳定，无抖动的精密时钟采集数据样本。诸如视频信号中的残余子载波的残余信号从所选择的数据样本中被去除，并且针对稳定的参考点确定每个定时间隔的精确定时点。显示从准确时钟导出的表示以标称定时间隔发生的稳定参考点的基线的定时点的偏差，以及用于根据所获取的显示数据组的任何部分确定峰 - 峰抖动的装置样品。在采集数据样本集之间提供平均，以减少噪声，并突出显示由于一些重复影响的相位误差。

3. 发明授权

US11624781B2 Noise-compensated jitter measurement instrument and methods 有权
公开(公告)号：US11624781B2
公开(公告)日：2023-04-11
申请号：US17695633
申请日：2022-03-15
申请人： Tektronix, Inc.
发明人： Mark L. Guenther
IPC分类号： G01R31/28 , G01R31/317 , G01R31/3183 , G01R31/319
摘要： A test and measurement device includes an input for receiving a test waveform from a Device Under Test (DUT), where the test waveform has a plurality of input level transitions, a selector structured to respectively and individually extract only those portions of the test waveform that match two or more predefined patterns of input level transitions of the test waveform, a noise compensator structured to individually determine and remove, for each of the extracted portions of the waveform, a component of a jitter measurement caused by random noise of the test and measurement device receiving the test waveform, a summer structured to produce a composite distribution of timing measurements with removed noise components from the extracted portions of the test waveform, and a jitter processor structured to determine a first noise-compensated jitter measurement of the DUT from the composite distribution. Methods of determining noise-compensated jitter measurements are also disclosed.

4. 发明申请

US20230086626A1 SYSTEM AND METHOD FOR DETECTION OF ANOMALIES IN TEST AND MEASUREMENT RESULTS OF A DEVICE UNDER TEST (DUT) 有权
公开(公告)号：US20230086626A1
公开(公告)日：2023-03-23
申请号：US17949158
申请日：2022-09-20
申请人： Tektronix, Inc.
发明人： Siby Charley Pulikottil , Sriram Mandyam Krishnakumar , Mahesha Guttahalli Lakshmipathy
IPC分类号： G01R31/28
摘要： A test and measurement device has an interface, one or more connectors, each connector to allow the test and measurement device to connect to a test and measurement instrument, and one or more processors, the one or more processors configured to execute code to cause the one or more processors to: receive one or more user inputs through the interface identifying one or more tests to perform on a device under test (DUT); form a connection through one of the one or more connectors to the DUT to perform the one or more tests and receive test result data; apply one or more machine learning models to the test result data to identify potentially anomalous test results; and generate and present a representation of the test result data and the potentially anomalous test results. A method of analyzing test data includes receiving one or more user inputs through an interface identifying one or more test to perform on a device under test (DUT), forming a connection to at least one test and measurement instrument, directing the test and measurement instrument to perform one or more tests on the DUT and receive test result data, applying one or more machine learning models to the test result data to identify potentially anomalous test results, and generating and presenting a representation of the test result data and the potentially anomalous test results.

5. 发明申请

US20230055303A1 PARALLEL TRIGGER PATHS IN A TEST AND MEASUREMENT INSTRUMENT 有权
公开(公告)号：US20230055303A1
公开(公告)日：2023-02-23
申请号：US17891901
申请日：2022-08-19
申请人： Tektronix, Inc.
发明人： Joshua J. O'Brien , Jed H. Andrews
IPC分类号： G01R13/02
摘要： A test and measurement instrument includes an auxiliary trigger input port for receiving an auxiliary trigger signal, a digital trigger processor for generating a digital trigger signal from the auxiliary trigger signal, an analog trigger processor for generating an analog trigger signal from the auxiliary trigger signal, a user-configurable selector coupled to the digital trigger processor and to the analog trigger processor, the user-configurable selector configured to output either the digital trigger signal or the analog trigger signal as a selected trigger output signal of the instrument. Methods of creating parallel triggers are also described.

6. 发明授权

US11552620B2 Event activity trigger 有权
公开(公告)号：US11552620B2
公开(公告)日：2023-01-10
申请号：US16894778
申请日：2020-06-06
申请人： Tektronix, Inc.
发明人： Patrick A. Smith , Daniel G. Knierim
IPC分类号： G01R13/02 , H03K3/037 , H03K19/20
摘要： Methods of triggering a test and measurement instrument having a plurality of inputs include the step of generating a trigger signal in response to every occurrence of any one of a plurality of specified trigger events. A first specified trigger event occurs in at least a first one of the inputs and a second specified trigger event occurs in at least a second one of the plurality of inputs. A specified trigger event may include at least one selected input from the plurality of inputs and a selected activity type. Some methods include configuring each of a plurality of event activity detectors to produce a pulse in a logic signal in response to every occurrence of one of the specified trigger events. The plurality of logic signals are combined in a logical OR circuit to generate the trigger signal. Trigger circuits configured according to these methods are also disclosed.

7. 发明申请

US20220393914A1 EXPLICIT SOLUTION FOR DFE OPTIMIZATION WITH CONSTRAINTS 有权
公开(公告)号：US20220393914A1
公开(公告)日：2022-12-08
申请号：US17825981
申请日：2022-05-26
申请人： Tektronix, Inc.
发明人： Kan Tan
IPC分类号： H04L25/03
摘要： A method of equalizing a communication link includes setting a number of coefficients equal to a required number of coefficients, determining a number of pulse responses for a waveform, the number of pulse responses being greater than the number of coefficients, setting all values in a set of values to zero, the set of values having a number of values equal to the number of coefficients, repeating, until all values in the set of values have been assigned, determining a current lowest parameter in a set of given parameters, using a position of the current lowest parameter in the set of given parameters as an index, determining a minimum value between a first term in the set of given parameters multiplied by a main pulse response minus a summation of each parameter in the set of parameters multiplied by each value in the set of values, divided by the current lowest parameter, and a corresponding pulse response, and assigning the minimum value to the value in the set of values having a position equal to position of the current lowest parameter, and determining a value of each coefficient in a set of coefficients by multiplying each value in the set of values with the sign of a corresponding pulse response in the number of pulse responses; defining an equalizer having a number of taps equal to the number of coefficients, each tap having a value based on the corresponding coefficient; and applying the equalizer to a waveform received through the communication link to produce an equalized waveform. A test and measurement device is also disclosed.

8. 发明申请

US20220317225A1 CALIBRATION OF MAGNETIC FIELD SENSOR FOR CURRENT PROBE 有权
公开(公告)号：US20220317225A1
公开(公告)日：2022-10-06
申请号：US17220857
申请日：2021-04-01
申请人： Tektronix, Inc.
发明人： Daniel G. Knierim
IPC分类号： G01R35/00 , G01R15/20
摘要： A test and measurement instrument for measuring a current in a device under test, comprising an input configured to receive signals from a magnetic field probe; and one or more processors configured to measure, from a signal from the magnetic field probe, a magnetic field generated by a current-carrying conductor of the device under test based on a known current, determine a calibration factor based on the known current and the magnetic field, and generate a calibrated measurement of an unknown current in the current-carrying conductor using a magnetic field generated by the current-carrying conductor based on the unknown current and the calibration factor.

9. 发明授权

US11449697B2 Combined higher order statistics and artificial intelligence signal analysis 有权
公开(公告)号：US11449697B2
公开(公告)日：2022-09-20
申请号：US17018198
申请日：2020-09-11
申请人： Tektronix, Inc.
发明人： John J. Pickerd
IPC分类号： G06K7/14 , G06K9/62 , H03M1/66 , G06N3/02
摘要： A test and measurement instrument for analyzing signals using machine learning. The test and measurement instrument can determine a recovered clock signal based on the digital signal, set window positions for a fast Fourier transform of the digital signal, window the digital signal into a series of windowed waveform data based on the window positions, transform each of the windowed waveform data into a frequency-domain windowed waveform data using a fast Fourier transform, and determine high-order spectrum data of each of the frequency-domain windowed waveform data. The test and measurement instrument includes a neural network configured to receive the high-order spectrum data of the frequency-domain windowed transform data and classify each windowed waveform data based on the high-order spectrum data.

10. 发明授权

US11442105B2 Disaggregated distributed measurement analysis system using dynamic application builder 有权
公开(公告)号：US11442105B2
公开(公告)日：2022-09-13
申请号：US16740112
申请日：2020-01-10
申请人： Tektronix, Inc.
发明人： Sriram Mandyam Krishnakumar , Mahesha Guttahalli Lakshmipathy , Satish Kumar Makanahalli Ramaiah , Vishnu Vardhan Kandan , Rovin Jolly Pulikken
IPC分类号： G01R31/3183 , G01R31/28
摘要： Disaggregated distributed measurement analysis systems provide a test and measurement automation platform that uses solution workflow metadata to create automation test suites as solutions to be deployed in an automation engine of a test and measurement automation platform. The automation platform provides tools and techniques to develop measurements and deploy solutions in an automation engine without requiring the system to restart. The system enables, by the test and measurement automation platform, a user to develop measurements for the solutions and deploy and execute each of the solutions in the automation engine of the test and measurement automation platform without requiring the solution to compile.

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