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    • 10. 发明申请
    • METHOD OF PRODUCING SILICON SINGLE CRYSTAL
    • 生产硅单晶的方法
    • US20160068992A1
    • 2016-03-10
    • US14787368
    • 2014-05-08
    • SHIN-ETSU HANDOTAI CO., LTD.
    • Masahiro SAKURADAJunya TOKUERyoji HOSHIIzumi FUSEGAWA
    • C30B15/04C30B30/04C30B29/06
    • C30B15/04C30B15/305C30B29/06C30B30/04
    • A method of producing a phosphorus-doped silicon single crystal, including pulling the phosphorus-doped silicon single crystal from a silicon melt doped with phosphorus by Magnetic field applied Czochralski (MCZ) method, wherein the phosphorus is doped such that a phosphorus concentration of the phosphorus-doped silicon single crystal is 2×1016 atoms/cm3 or more, and a horizontal magnetic field is applied to the silicon melt with a central magnetic field strength of 2,000 gauss or more such that the phosphorus-doped silicon single crystal to be produced has an oxygen concentration of 1.6×1018 atoms/cm3 (ASTM'79) or more. A method of producing a silicon single crystal that is heavily doped with phosphorus and has an oxygen concentration of 1.6×1018 atoms/cm3 (ASTM'79) or more.
    • 一种磷掺杂硅单晶的制造方法,其特征在于,包括通过磁场施加切克劳斯基(MCZ)法从掺杂有磷的硅熔融物中提取磷掺杂的硅单晶,其中磷被掺杂,使得磷 磷掺杂硅单晶为2×1016原子/ cm3以上,并且以2000高斯或更高的中心磁场强度将水平磁场施加到硅熔体,使得将产生的磷掺杂硅单晶 氧浓度为1.6×1018原子/ cm3(ASTM'79)以上。 一种重掺杂磷,氧浓度为1.6×1018原子/ cm3(ASTM'79)以上的硅单晶的制造方法。