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1. 发明授权

US08829437B2 Method for quantifying amorphous content in bulk metallic glass parts using thermal emissivity 有权
标题翻译：使用热发射率量化块状金属玻璃部件中的无定形含量的方法
公开(公告)号：US08829437B2
公开(公告)日：2014-09-09
申请号：US13541709
申请日：2012-07-04
申请人： Christopher D. Prest , Matthew S. Scott , Dermot J. Stratton , Joseph C. Poole , Theodore A. Waniuk
发明人： Christopher D. Prest , Matthew S. Scott , Dermot J. Stratton , Joseph C. Poole , Theodore A. Waniuk
IPC分类号： G02F1/01 , G01F23/22
CPC分类号： G01F23/22 , G01J5/0003 , G01J5/0896 , G01J2005/0074 , G01J2005/0077 , H01L27/14649
摘要： Disclosed are methods and apparatus for determining an unknown degree of amorphicity in a bulk-solidifying amorphous alloy. A specimen can be prepared from the alloy, irradiated with passive radiation, imaged to provide a thermal image, and the image analyzed to assess the differences in emissivities in the image. The degree of amorphicity can be determined based on the differences in thermal emissivities.
摘要翻译：公开了用于确定体固固化非晶合金中未知程度的不规则性的方法和装置。可以从合金制备样品，用被动辐射照射，成像以提供热图像，并分析图像以评估图像中的发射率差异。可以根据热发射率的差异来确定非晶态度。

2. 发明申请

US20100256945A1 Method And Apparatus For Determining The Emissivity, Area And Temperature Of An Object 有权
标题翻译：用于确定物体的发射率，面积和温度的方法和装置
公开(公告)号：US20100256945A1
公开(公告)日：2010-10-07
申请号：US11951698
申请日：2007-12-06
申请人： Ronald N. Murata
发明人： Ronald N. Murata
IPC分类号： G06F15/00 , G01J5/00 , G06F17/18
CPC分类号： G01J5/602 , G01J5/0003 , G01J2005/0048 , G01J2005/0051 , G01J2005/0074 , G01J2005/0081 , G01J2005/0092
摘要： Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.
摘要翻译：提供方法和装置来确定物体的发射率，温度和面积。方法和装置被设计成使得物体的发射率和面积可以单独地确定为取决于从三个或更多个带状红外测量传感器导出的物体的温度的函数。因此，方法和装置可以仅需要物体的温度的回归分析，而不对物体的发射率和面积进行任何回归分析。

3. 发明申请

US20040008753A1 Emissivity distribution measuring method and apparatus 审中-公开
标题翻译：发射率分布测量方法和装置
公开(公告)号：US20040008753A1
公开(公告)日：2004-01-15
申请号：US10613072
申请日：2003-07-07
申请人： NORITAKE CO., LIMITED , Kuniyuki Kitagawa
发明人： Miyuki Hashimoto , Kenji Yano , Misao Iwata , Kuniyuki Kitagawa
IPC分类号： G01K003/00
CPC分类号： G01J5/602 , G01J5/0003 , G01J2005/0074
摘要： Method and apparatus for measuring a distribution of emissivity on a surface of an object body, on the basis of a light emitted from the surface of the object body, wherein a temperature of the object body at each picture element of its image is calculated on the basis of a radiant intensity ratio at each pair of corresponding picture elements of a first image and a second image which are obtained with respective two radiations of respective first and second wavelengths selected from the light emitted from the surface of the object body, to measure a distribution of the temperature on the surface of the object body, and an emissivity value at each picture element of the image of the object body is calculated on the basis of the measured distribution of the temperature, and according to a predetermined relationship between the temperature and the emissivity value.
摘要翻译：基于从物体的表面发射的光来测量物体表面上的发射率分布的方法和装置，其中在其物体的每个像素处的物体的温度在在从对象体的表面发射的光中选出的各自的第一和第二波长的相应的两个辐射获得的第一图像和第二图像的每对相应图像元素的辐射强度比的基础，以测量基于测量的温度分布来计算物体表面上的温度分布和物体的图像的每个像素的发射率值，并且根据温度和发射率值。

4. 发明授权

US5377126A Non-contact temperature measurement of a film growing on a substrate 失效
标题翻译：在基板上生长的膜的非接触式温度测量
公开(公告)号：US5377126A
公开(公告)日：1994-12-27
申请号：US759427
申请日：1991-09-13
申请人： Markus I. Flik , Alfredo Anderson , Byungin Choi
发明人： Markus I. Flik , Alfredo Anderson , Byungin Choi
IPC分类号： G01J5/00
CPC分类号： G01J5/0003 , G01J5/0007 , G01J5/522 , G01J2005/0051 , G01J2005/0074 , Y10S505/829 , Y10S505/842
摘要： Apparatus and method for non-contact temperature measurement of a film growing on a substrate which accounts for the change in emissivity due to the change in film thickness. The system employs an adaptively calibrated pyrometer wherein the substrate emittance is continuously computed so that the temperature measurement is accurate regardless of the emittance variation. The new system is easily constructed by adding data processing system software and hardware to conventional pyrometers.
摘要翻译：用于在基板上生长的膜的非接触式温度测量的装置和方法，其考虑了由于膜厚度的变化引起的发射率的变化。该系统采用自适应校准的高温计，其中连续地计算衬底发射率，使得温度测量是准确的，而与发射率变化无关。通过将数据处理系统软件和硬件添加到常规高温计中，可以轻松构建新系统。

5. 发明授权

US5282017A Reflectance probe 失效
标题翻译：反射探头
公开(公告)号：US5282017A
公开(公告)日：1994-01-25
申请号：US461285
申请日：1990-01-05
申请人： Ira Kasindorf , Alexander Stein
发明人： Ira Kasindorf , Alexander Stein
IPC分类号： G01J5/00 , G01K11/12 , G01N21/47
CPC分类号： G01J5/08 , G01J5/0815 , G01J5/0821 , G01J5/0878 , G01K11/12 , G01N21/474 , G01J2005/0051 , G01J2005/0074
摘要： Apparatus for measuring the value of the directional spectral hemispherical reflectance of the surface of a target when not engaging but being spaced from the target employs a hollow elongated member having a longitudinal axis and first and second opposite ends. The area of the first end is relatively large relative to that of the second end. The first end is open. The member has an inner chamber extending between the ends and has an inner surface adapted to reflect light falling within a specified wave band. The member when the apparatus is in use is positioned with the first end adjacent but spaced from a selected portion of the surface of the target. The longitudinal axis is oriented essentially normal to a region on the selected surface which would be engaged by a line coincident with the axis and sufficiently extended outwardly from the first end. A beam of light falling within said band is directed within at least a portion of the chamber along the axis and outward through the first end to impinge upon the selected surface portion. A portion of the beam is reflected after said impingement backward through the first end into the chamber. The reflected light which strikes the inner surface of the chamber is directed backwardly within the chamber toward the second end. An electrical signal derived from at least a portion of the backwardly directed light provides a measurement of said reflectance value.
摘要翻译：用于测量目标表面的方向光谱半球反射值在不接合但与目标间隔时的值的装置采用具有纵向轴线的中空细长构件以及第一和第二相对端。第一端的面积相对于第二端的面积相对较大。第一端是开放的该构件具有在端部之间延伸的内室，并且具有适于反射落入指定波段内的光的内表面。当设备使用时的构件定位成第一端与目标的表面的选定部分相邻但间隔开。纵向轴线基本上垂直于所选择的表面上的区域，该区域将被与轴线重合并且从第一端向外充分延伸的线路接合。落在所述带内的光束沿着轴线被引导到腔室的至少一部分内并且穿过第一端向外引导到所选择的表面部分上。所述梁的一部分在所述冲击之后通过所述第一端向后反射进入所述室。撞击室的内表面的反射光在腔室内向后指向第二端。从后向光的至少一部分导出的电信号提供所述反射率值的测量值。

6. 发明授权

US4417822A Laser radiometer 失效
标题翻译：激光辐射计
公开(公告)号：US4417822A
公开(公告)日：1983-11-29
申请号：US319244
申请日：1981-11-09
申请人： Alexander Stein , Paul Rabinowitz , Andrew Kaldor
发明人： Alexander Stein , Paul Rabinowitz , Andrew Kaldor
IPC分类号： B62B13/10 , G01J5/00 , G01J9/04 , G01J5/52 , G01J5/62
CPC分类号： G01J5/522 , B62B13/10 , G01J5/0044 , G01J5/08 , G01J5/0806 , G01J5/0834 , G01J5/0846 , G01J5/0862 , G01J5/0871 , G01J5/0896 , G01J2005/0051 , G01J2005/0074 , G01J2005/583 , G01J9/04
摘要： The present invention teaches a unique laser radiometer capable of accurately measuring the radiation temperature of a radiant surface and independently measuring the surface's emissivity. A narrow-band radiometer is combined with a laser reflectometer to measure concurrently radiance and emissivity of a remote, hot surface. Together, radiance and emissivity yield the true surface temperature of the remote target. A narrow receiver bandwidth is attained by one of two methods; (a) heterodyne detection or (b) optical filtering. A direct measurement of emissivity is used to adjust the value obtained for the thermal radiation signal to substantially enhance the accuracy of the temperature measurement for a given subject surface. The technique provides substantially high detection sensitivity over a very narrow spectral bandwidth.
摘要翻译：本发明教导了一种独特的激光辐射计，能够精确地测量辐射表面的辐射温度并独立地测量表面的发射率。窄带辐射计与激光反射计相结合，以测量远程热表面的辐射和发射率。一起，辐射和发射率产生远程目标的真实表面温度。通过两种方法之一获得窄的接收机带宽; （a）外差检测或（b）光学滤波。使用辐射率的直接测量来调整对于热辐射信号获得的值，以显着提高给定对象表面的温度测量的精度。该技术在非常窄的光谱带宽上提供了显着高的检测灵敏度。

7. 发明申请

US20190137341A1 MULTISPECTRAL PLASMONIC THERMAL IMAGING DEVICE 审中-公开
公开(公告)号：US20190137341A1
公开(公告)日：2019-05-09
申请号：US15802836
申请日：2017-11-03
申请人： International Business Machines Corporation
发明人： Ali Afzali-Ardakani , Abram L. Falk , Damon B. Farmer , Shu-Jen Han , George S. Tulevski
IPC分类号： G01J5/00 , G01J5/02 , G01J5/20
CPC分类号： G01J5/0018 , G01J5/023 , G01J5/046 , G01J5/0862 , G01J5/20 , G01J5/602 , G01J2005/0051 , G01J2005/0074 , G01J2005/0077
摘要： A computer-eimplemented method and thermal imaging device includes a layer of plasmonic material and a processor. The layer of plasmonic material receive electromagnetic radiation from an object and generates radiance measurements of the electromagnetic radiation at a plurality of wavelengths. The processor determines an emissivity and temperature of the object from the radiance measurements and forms a thermal-based electronic image of the object from the determined emissivity and temperature.

8. 发明申请

US20190003897A1 Infrared Contrasting Color Emissivity Measurement System 审中-公开
公开(公告)号：US20190003897A1
公开(公告)日：2019-01-03
申请号：US16105786
申请日：2018-08-20
申请人： Exergen Corporation
发明人： Jason N. Jarboe
IPC分类号： G01K7/00 , G01J5/06 , G01J5/00
CPC分类号： G01K7/003 , G01J5/0003 , G01J5/061 , G01J2005/0051 , G01J2005/0074
摘要： Devices and corresponding methods can be provided to measure temperature and/or emissivity of a target. Emissivity of the target need not be known or assumed, and any temperature difference between a sensor and the target need not be zeroed or minimized. No particular bandpass filter is required. Devices can include one or two sensors viewing the same target as the target views different respective viewed temperatures. The respective viewed temperatures can be sensor temperatures, and a single sensor can be set to each of the respective viewed temperatures at different times. An analyzer can determine the temperature and/or emissivity of the target based on the respective viewed temperatures and on plural net heat fluxes detected by the sensors and corresponding to the respective viewed temperatures.

9. 发明授权

US08050884B2 Method and apparatus for determining the emissivity, area and temperature of an object 有权
标题翻译：用于确定物体的发射率，面积和温度的方法和装置
公开(公告)号：US08050884B2
公开(公告)日：2011-11-01
申请号：US11951698
申请日：2007-12-06
申请人： Ronald N. Murata
发明人： Ronald N. Murata
IPC分类号： G01K11/30 , G01K17/00 , G01J5/48
CPC分类号： G01J5/602 , G01J5/0003 , G01J2005/0048 , G01J2005/0051 , G01J2005/0074 , G01J2005/0081 , G01J2005/0092
摘要： Methods and apparatus are provided to determine the emissivity, temperature and area of an object. The methods and apparatus are designed such that the emissivity and area of the object may be separately determined as functions dependent upon the temperature of the object derived from a three or more band infrared measurement sensor. As such, the methods and apparatus may only require a regression analysis of the temperature of the object without any regression analysis of the emissivity and area of the object.
摘要翻译：提供方法和装置来确定物体的发射率，温度和面积。方法和装置被设计成使得物体的发射率和面积可以单独地确定为取决于从三个或更多个带状红外测量传感器导出的物体的温度的函数。因此，方法和装置可以仅需要物体的温度的回归分析，而不对物体的发射率和面积进行任何回归分析。

10. 发明授权

US5231595A Pyrometer 失效
标题翻译：高温计
公开(公告)号：US5231595A
公开(公告)日：1993-07-27
申请号：US782750
申请日：1991-10-18
申请人： Toshiro Makino , Hiroji Tsujimura , Jiro Arima
发明人： Toshiro Makino , Hiroji Tsujimura , Jiro Arima
IPC分类号： G01J5/00 , G01J5/60
CPC分类号： G01J5/60 , G01J2005/0074
摘要： A pyrometer includes a light source capable of emitting light to at least two wavelengths to a target to be measured. A light measuring member measures the light source and provides output signals representative of those two wavelengths. A second light measuring member measures light reflected by the target and provides second signals corresponding to the two wavelengths. A third light measuring member measures the intensity of the light radiated by the target with respect to those two wavelengths to produce third signals. An emissivity is assumed for the target based on the predetermined wavelengths, and a temperature is calculated on the basis of the minimum value of the difference between the assumed radiation intensity calculated according to the assumed emissivity of the target and the measured radiation intensity in accordance with the third signals.
摘要翻译：高温计包括能够将光发射到至少两个波长的光源到待测量的靶。光测量部件测量光源并提供表示这两个波长的输出信号。第二光测量部件测量由目标反射的光，并提供对应于两个波长的第二信号。第三光测量部件测量目标相对于这两个波长辐射的光的强度，以产生第三信号。基于预定波长对目标进行发射率，并且基于根据目标的假设发射率计算的假定辐射强度与所测量的辐射强度之间的差的最小值来计算温度，第三个信号。

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