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1. 发明授权

US09880117B2 Measuring instrument for detection of electrical properties in a liquid 有权
公开(公告)号：US09880117B2
公开(公告)日：2018-01-30
申请号：US14419094
申请日：2013-02-22
申请人： 2351161 ONTARIO LIMITED
发明人： Derrick P. Fournier , Henry A. Palma , Cameron Smyth
IPC分类号： G01R1/00 , G01N27/00 , G01R1/06 , G01R19/00 , G01R19/28 , G01R1/073 , G01J1/00 , B01J20/00 , G05B1/00
CPC分类号： G01N27/00 , B01J20/00 , G01J1/00 , G01R1/06 , G01R1/073 , G01R19/00 , G01R19/0084 , G01R19/0092 , G01R19/28 , G05B1/00
摘要： A measuring instrument for detection of electrical properties in a liquid includes a main body configured to hold a tester, a first pole extending from the main body, and a second pole extending from the main body that is spaced apart from the first pole. The first pole carries a positive probe for attachment to the tester, and the second pole carries a negative probe for attachment to the tester. When the probes are placed in the liquid, electrical properties in the liquid are detected by the tester.

2. 发明授权

US09460832B2 Sleeve for a power cable 有权
标题翻译：电源线套管
公开(公告)号：US09460832B2
公开(公告)日：2016-10-04
申请号：US14765440
申请日：2014-01-29
申请人： 3M INNOVATIVE PROPERTIES COMPANY
发明人： Mark Gravermann , Gerhard Lohmeier , Michael Stalder , Friedrich Busemann , Jens Weichold , Bernd Schubert
IPC分类号： H01B9/00 , H01R9/05 , H02G15/04 , H02G15/18 , G01R15/16 , H01B7/02 , H01B7/17 , H01B13/06 , H01B13/22 , H05K3/30 , G01R1/06
CPC分类号： H01B9/00 , G01R1/06 , G01R15/16 , H01B7/0216 , H01B7/17 , H01B13/06 , H01B13/22 , H01R9/0515 , H02G15/04 , H02G15/18 , H02G15/1806 , H05K3/30
摘要： Sleeve (1) for a high- or medium-voltage power cable (120) having an inner conductor (130). The sleeve comprises (i) a tubular sleeve body (10) having an electrically conductive or semiconductive first axial electrode section (60), and (ii) a circuit board (30). The sleeve is radially expandable or shrinkable. It can be arranged radially outward of the inner conductor, such hat the first axial electrode section is radially separated from the inner conductor by at least an electrically insulating spacer layer (140). The circuit board is at least partially arranged radially outward of the sleeve body and comprises an electrical contact (100) which is electrically connected with the first axial electrode section.
摘要翻译：一种用于具有内部导体（130）的高压或中压电力电缆（120）的套筒（1）。套筒包括（i）具有导电或半导体的第一轴向电极部分（60）的管状套管主体（10）和（ii）电路板（30）。套管是径向可膨胀或可收缩的。第一轴向电极部分可以沿内部导体的径向外侧布置，至少一个电绝缘的间隔层（140），第一轴向电极部分与内部导体径向分开。电路板至少部分地布置在套筒本体的径向外侧，并且包括与第一轴向电极部分电连接的电接触件（100）。

3. 发明授权

US09435847B2 Method for testing special pattern and probe card defect in wafer testing 有权
标题翻译：在晶圆测试中测试特殊图案和探针卡缺陷的方法
公开(公告)号：US09435847B2
公开(公告)日：2016-09-06
申请号：US14316631
申请日：2014-06-26
申请人： MACRONIX International Co., Ltd.
发明人： Shih-Hsien Chang , Kai-Wen Tu , Yen Lin , Ching-Ren Cheng
IPC分类号： G01R31/01 , G01R31/26 , G01R31/319 , G01R31/28 , G01R31/02 , G01R31/3185 , G01R31/265 , G01R1/04
CPC分类号： G01R31/26 , G01R1/0491 , G01R1/06 , G01R1/06705 , G01R31/265 , G01R31/2831 , G01R31/2834 , G01R31/2856 , G01R31/2874 , G01R31/2875 , G01R31/2877 , G01R31/318511 , G01R31/31924 , G01R35/00
摘要： Methods for testing a special pattern and testing a probe card defect in wafer testing are provided. In the method for testing the special pattern, a wafer is divided into multiple testing partitions, in which each of the testing partitions includes multiple dies. The dies in each testing partition of the wafer are respectively tested by multiple sites of the probe card to obtain a testing map. Then, a number of the dies having defects and a number of the dies without defect within each of the testing partitions in the testing map are accumulated to construct chi-square test and calculate a maximum P-value. Finally, it is determined whether a minimum of the maximum P-values of all of the testing partitions is smaller than a certain predetermined threshold. If the minimum is smaller than the threshold, it is determined that the testing map of the wafer contains the special pattern.
摘要翻译：提供了测试晶圆测试中特殊图案和测试探针卡缺陷的方法。在用于测试特殊图案的方法中，将晶片分成多个测试分区，其中每个测试分区包括多个模具。晶片每个测试分区中的裸片分别通过探针卡的多个部位进行测试，以获得测试图。然后，累积在测试图中的每个测试分区内具有缺陷的多个模具和多个没有缺陷的模具，以构成卡方测试并计算最大P值。最后，确定所有测试分区的最大P值的最小值是否小于一定的预定阈值。如果最小值小于阈值，则确定晶片的测试图包含特殊图案。

4. 发明申请

US20140152335A1 CONTINUOUS BROKEN SENSE LEAD DETECTION SYSTEM 有权
标题翻译：连续检测传感器检测系统
公开(公告)号：US20140152335A1
公开(公告)日：2014-06-05
申请号：US13691738
申请日：2012-12-01
申请人： AGILENT TECHNOLOGIES, INC.
发明人： Marko Vulovic
IPC分类号： G01R1/04
CPC分类号： G01R31/026 , G01R1/06 , G01R27/14 , G01R35/00
摘要： Disclosed is a continuous broken sense lead detection system (“CBSLDS”) for use with a Kelvin-connected device under test (“DUT”), a power source, and detection system stimulus configured to provide a periodic stimulus voltage. The CBSLDS is configured to detect a discontinuity in a first sense lead, second sense lead, or both, that are in signal communication with the DUT. The CBSLDS includes a first transformer, second transformer, first DC-blocker, second DC-blocker, first detection module, and second detection module.
摘要翻译：公开了一种用于与开尔文连接的被测设备（“DUT”）一起使用的连续断线检测系统（“CBSLDS”），电源以及被配置为提供周期性刺激电压的检测系统激励。 CBSLDS被配置为检测与DUT进行信号通信的第一感测引线，第二感测引线或两者中的不连续性。 CBSLDS包括第一变压器，第二变压器，第一直流阻塞器，第二直流阻塞器，第一检测模块和第二检测模块。

5. 发明申请

US20110156737A1 CONTACTOR 失效
标题翻译：联系人
公开(公告)号：US20110156737A1
公开(公告)日：2011-06-30
申请号：US12966010
申请日：2010-12-13
申请人： Kazuiku MIWA
发明人： Kazuiku MIWA
IPC分类号： G01R1/067 , G01R31/00
CPC分类号： G01R1/06 , G01R1/0416
摘要： A contactor 20 includes an FPC 30 on which a contact 31 brought into contact with/separated from an electrode 12 formed on a test target 10 and a board wire 32 having flexibility and conductivity are formed, an elastic member 40 that overlaps with the FPC 30 at the contact 31 and urges the contact 31 in a pressing direction, and a main body member 50 to which the elastic member 40 is fixed at a predetermined fixed position in a state projecting to the outside and to which the FPC 30 is electrically connected from the outside. As mentioned above, by forming the board wires 32 and the elastic member 40 by separate materials, respectively, a combination of an urging force of the contact 31 and conductivity can be made freely more favorable. Also, the board wires 32 and the elastic member 40 do not slide inside the main body member 50, and generation of a noise can be further suppressed.
摘要翻译：接触器20包括：FPC 30，其上形成有与形成在测试对象10上的电极12接触/分离的触点31和形成有柔性和导电性的板线32;弹性部件40，与FPC 30重叠在触点31处沿着按压方向推压接触件31，弹性部件40以向外侧突出的状态固定在规定的固定位置的主体部件50，并且FPC30与电连接外。如上所述，通过分别通过分开的材料形成板线32和弹性构件40，可以使触点31的作用力和导电性的组合更自由地组合。此外，板线32和弹性构件40不会在主体构件50内滑动，能够进一步抑制噪声的产生。

6. 发明申请

US20070190823A1 Electrical connector for semiconductor device test fixture and test assembly 有权
标题翻译：电子连接器用于半导体器件测试夹具和测试组件
公开(公告)号：US20070190823A1
公开(公告)日：2007-08-16
申请号：US10598825
申请日：2005-03-16
申请人： Peter Cuevas
发明人： Peter Cuevas
IPC分类号： H01R4/66
CPC分类号： H01R13/6586 , G01R1/06 , H01R24/562 , H01R2201/20
摘要： An interconnect assembly is for use in connection a semiconductor device under test (DUT) having a plurality of leads to electronic test equipment. The interconnect assembly includes a cable including a plurality of wires with a least one wire for sensing a signal from a DUT, at least one wire for a forcing signal to the DUT, and at least one wire for a guarding signal driven by the same electrical potential as the forcing signal. A male connector includes the plurality of wires, an outer metal coating surrounding the plurality of wires, and an insulating coating around the outer metal coating. A receptacle connector is for receiving the male connector and plurality of wires with corresponding contacts.
摘要翻译：互连组件用于将具有多个引线的被测半导体器件（DUT）连接到电子测试设备。所述互连组件包括电缆，所述电缆包括具有用于感测来自DUT的信号的至少一根导线的至少一根导线，用于向DUT施加强制信号的至少一根导线，以及用于由相同电气驱动的保护信号的至少一根导线作为强制信号的潜力。阳连接器包括多个电线，围绕多个电线的外部金属涂层以及围绕外部金属涂层的绝缘涂层。插座连接器用于接收阳连接器和具有相应触头的多根导线。

7. 发明授权

US06781396B2 Low-current probe card 失效
公开(公告)号：US06781396B2
公开(公告)日：2004-08-24
申请号：US10300349
申请日：2002-11-19
申请人： Randy J. Schwindt
发明人： Randy J. Schwindt
IPC分类号： G01R106
CPC分类号： G01R1/06 , G01R1/07342 , G01R1/18 , G01R31/2822
摘要： A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included thereon terminate below the opening in a pattern suitable for probing a test device. A plurality of cables are attached to the card for respectively connecting each device to a corresponding channel of a test instrument. The on-board portion of each cable is of coaxial type and includes an inner layer between the inner dielectric and outer conductor for suppressing the triboelectric effect. An inner conductive area and a conductive backplane that are respectively located below and on one side of each device are set to guard potential via the outer conductor of the corresponding cable so as to guard the signal path on the other side of the device. The lead-in portion of each cable, which is detachably connected to the corresponding on-board portion through a plug-in type connector, is of triaxial type and includes, besides the inner layer between the inner dielectric and outer conductor, a second inner dielectric and second outer conductor. A conductive cover and an outer conductive area that substantially enclose the components on the card are set to shield potential via the second outer conductor and connector.

8. 发明申请

US20030071644A1 Low-current probe card 失效
公开(公告)号：US20030071644A1
公开(公告)日：2003-04-17
申请号：US10300349
申请日：2002-11-19
发明人： Randy J. Schwindt
IPC分类号： G01R031/02
CPC分类号： G01R1/06 , G01R1/07342 , G01R1/18 , G01R31/2822
摘要： A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included thereon terminate below the opening in a pattern suitable for probing a test device. A plurality of cables are attached to the card for respectively connecting each device to a corresponding channel of a test instrument. The on-board portion of each cable is of coaxial type and includes an inner layer between the inner dielectric and outer conductor for suppressing the triboelectric effect. An inner conductive area and a conductive backplane that are respectively located below and on one side of each device are set to guard potential via the outer conductor of the corresponding cable so as to guard the signal path on the other side of the device. The lead-in portion of each cable, which is detachably connected to the corresponding on-board portion through a plug-in type connector, is of triaxial type and includes, besides the inner layer between the inner dielectric and outer conductor, a second inner dielectric and second outer conductor. A conductive cover and an outer conductive area that substantially enclose the components on the card are set to shield potential via the second outer conductor and connector.

9. 发明授权

US06507208B2 Low-current probe card 失效
标题翻译：低电流探头卡
公开(公告)号：US06507208B2
公开(公告)日：2003-01-14
申请号：US09814278
申请日：2001-03-21
申请人： Randy J. Schwindt
发明人： Randy J. Schwindt
IPC分类号： G01R106
CPC分类号： G01R1/06 , G01R1/07342 , G01R1/18 , G01R31/2822
摘要： A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included thereon terminate below the opening in a pattern suitable for probing a test device. A plurality of cables are attached to the card for respectively connecting each device to a corresponding channel of a test instrument. The on-board portion of each cable is of coaxial type and includes an inner layer between the inner dielectric and outer conductor for suppressing the triboelectric effect. An inner conductive area and a conductive backplane that are respectively located below and on one side of each device are set to guard potential via the outer conductor of the corresponding cable so as to guard the signal path on the other side of the device. The lead-in portion of each cable, which is detachably connected to the corresponding on-board portion through a plug-in type connector, is of triaxial type and includes, besides the inner layer between the inner dielectric and outer conductor, a second inner dielectric and second outer conductor. A conductive cover and an outer conductive area that substantially enclose the components on the card are set to shield potential via the second outer conductor and connector.
摘要翻译：用于测量下降到毫微微区域的电流的低电流探针卡包括形成开口的介电板，例如玻璃环氧树脂材料。诸如陶瓷刀片的多个探测装置围绕开口边缘安装，使得其中包括的探测元件或针以适合于探测测试装置的图案在开口下方终止。多个电缆连接到卡，用于分别将每个设备连接到测试仪器的相应通道。每个电缆的板上部分是同轴型的，并且包括用于抑制摩擦电效应的内部电介质和外部导体之间的内层。分别设置在每个装置的一侧的一侧的内部导电区域和导电背板被设置为通过相应电缆的外部导体来保护电位，以便保护装置另一侧上的信号路径。通过插入型连接器可拆卸地连接到相应的板上部分的每个电缆的引入部分是三轴型的，并且除了内部电介质和外部导体之间的内层之外还包括第二内部电介质和第二外导体。将导电盖和基本上包围卡上的部件的外部导电区域设置成通过第二外导体和连接器来屏蔽电位。

10. 发明授权

US06249133B1 Low-current probe card 失效
标题翻译：低电流探头卡
公开(公告)号：US06249133B1
公开(公告)日：2001-06-19
申请号：US09553085
申请日：2000-04-19
申请人： Randy J. Schwindt
发明人： Randy J. Schwindt
IPC分类号： G01R106
CPC分类号： G01R1/06 , G01R1/07342 , G01R1/18 , G01R31/2822
摘要： A low-current probe card for measuring currents down to the femtoamp region includes a dielectric board, such as of glass-epoxy material, forming an opening. A plurality of probing devices, such as ceramic blades, are edge-mounted about the opening so that the probing elements or needles included thereon terminate below the opening in a pattern suitable for probing a test device. A plurality of cables are attached to the card for respectively connecting each device to a corresponding channel of a test instrument. The on-board portion of each cable is of coaxial type and includes an inner layer between the inner dielectric and outer conductor for suppressing the triboelectric effect. An inner conductive area and a conductive backplane that are respectively located below and on one side of each device are set to guard potential via the outer conductor of the corresponding cable so as to guard the signal path on the other side of the device. The lead-in portion of each cable, which is detachably connected to the corresponding on-board portion through a plug-in type connector, is of triaxial type and includes, besides the inner layer between the inner dielectric and outer conductor, a second inner dielectric and second outer conductor. A conductive cover and an outer conductive area that substantially enclose the components on the card are set to shield potential via the second outer conductor and connector.
摘要翻译：用于测量下降到毫微微区域的电流的低电流探针卡包括形成开口的介电板，例如玻璃环氧树脂材料。诸如陶瓷刀片的多个探测装置围绕开口边缘安装，使得其中包括的探测元件或针以适合于探测测试装置的图案在开口下方终止。多个电缆连接到卡，用于分别将每个设备连接到测试仪器的相应通道。每个电缆的板上部分是同轴型的，并且包括用于抑制摩擦电效应的内部电介质和外部导体之间的内层。分别设置在每个装置的一侧的一侧的内部导电区域和导电背板被设置为通过相应电缆的外部导体来保护电位，以便保护装置另一侧上的信号路径。通过插入型连接器可拆卸地连接到相应的板上部分的每个电缆的引入部分是三轴型的，并且除了内部电介质和外部导体之间的内层之外还包括第二内部电介质和第二外导体。将导电盖和基本上包围卡上的部件的外部导电区域设置成通过第二外导体和连接器来屏蔽电位。

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