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    • 5. 发明授权
    • One-dimensional x-ray detector with curved readout strips
    • 具有弯曲读出条的一维X射线检测器
    • US09024268B2
    • 2015-05-05
    • US13833346
    • 2013-03-15
    • Bruker AXS, Inc.
    • Roger D. DurstPeter LaggnerSergei A. MedvedBruce L. Becker
    • G01T1/24G01T1/16G01N23/201
    • G01T1/1606G01N23/201G01N2223/054G01T1/24H01L31/085Y10T29/4913
    • A detector for a small-angle x-ray diffraction system uses curved readout strips shaped to correspond to the expected intensity distribution of x-rays scattered by the system. This expected intensity distribution may be a series of concentric circles, and each of the strips has a shape that approximates a section of an annulus. The strips may be positioned on a substrate such that a center of curvature of the curved strips is located along an edge of a readout region within which the strips are located or, alternatively, at a geometric center of the readout region. The detector may have a signal readout system that uses a delay line or, alternatively, a multichannel readout system. The detector may make use of electron generation via interaction of the diffracted x-ray beam with a gas in a gas chamber, or through interaction of the diffracted beam with a semiconductor material.
    • 用于小角度X射线衍射系统的检测器使用弯曲的读出条,其形状对应于由系统散射的x射线的预期强度分布。 该预期的强度分布可以是一系列同心圆,并且每个条具有近似于环的一部分的形状。 条带可以定位在基板上,使得弯曲条带的曲率中心沿着条带所在的读出区域的边缘或者替代地位于读出区域的几何中心处。 检测器可以具有使用延迟线或者替代地,多通道读出系统的信号读出系统。 检测器可以通过衍射X射线束与气室中的气体的相互作用或通过衍射光束与半导体材料的相互作用来利用电子产生。
    • 9. 发明授权
    • Superconducting transmission line particle detector
    • 超导传输线粒子检测器
    • US4873482A
    • 1989-10-10
    • US225412
    • 1988-07-28
    • Kenneth E. Gray
    • Kenneth E. Gray
    • G01T1/16
    • G01T1/1606Y10S505/843Y10S505/866
    • A microvertex particle detector for use in a high energy physic collider including a plurality of parallel superconducting thin film strips separated from a superconducting ground plane by an insulating layer to form a plurality of superconducting waveguides. The microvertex particle detector indicates passage of a charged subatomic particle by measuring a voltage pulse measured across a superconducting waveguide caused by the transition of the superconducting thin film strip from a superconducting to a non-superconducting state in response to the passage of a charged particle. A plurality of superconducting thin film strips in two orthogonal planes plus the slow electromagnetic wave propogating in a superconducting transmission line are used to resolve N.sup.2 ambiguity of charged particle events.
    • 一种用于高能物理对撞机的微切割粒子检测器,包括通过绝缘层从超导接地层分离的多个平行超导薄膜条,以形成多个超导波导。 微电子微粒检测器通过测量超导波导上测量的电压脉冲来指示带电子原子粒子的通过,该电压脉冲是由于超导薄膜带由于带电粒子的通过而从超导至非超导状态的过渡引起的。 使用两个正交平面中的多个超导薄膜带加上超导传输线中的慢电磁波传播来解决带电粒子事件的N2模糊度。