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    • 6. 发明申请
    • CORRECTION IN SLIT-SCANNING PHASE CONTRAST IMAGING
    • 在扫描相位对比成像中的校正
    • US20160128665A1
    • 2016-05-12
    • US14896783
    • 2014-06-27
    • KONINKLIJKE PHILIPS N.V.
    • Ewald ROESSLGerhard MARTENS
    • A61B6/00G01N23/20G21K1/10
    • A61B6/582A61B6/484A61B6/5258A61B6/583G01N23/20075G01N2223/303G02B5/1838G21K1/06G21K1/10G21K2207/005
    • The present invention relates to calibration in X-ray phase contrast imaging. In order to remove the disturbance due to individual gain factors, a calibration filter grating (10) for a slit-scanning X-ray phase contrast imaging arrangement is provided that comprises a first plurality of filter segments (11) comprising a filter material (12) and a second plurality of opening segments (13). The filter segments and the opening segments are arranged alternating as a filter pattern (15). The filter material is made from a material with structural elements (14) comprising structural parameters in the micrometer region. The filter grating is movably arranged between an X-ray source grating (54) and an analyzer grating (60) of an interferometer unit in a slit-scanning system of a phase contrast imaging arrangement. The slit-scanning system is provided with a pre-collimator (55) comprising a plurality of bars (57) and slits (59). The filter pattern is aligned with the pre-collimator pattern (61).
    • 本发明涉及X射线相位成像中的校准。 为了消除由于各种增益因素引起的干扰,提供了一种用于狭缝扫描X射线相位成像装置的校准滤光器光栅(10),其包括第一多个过滤器段(11),其包括过滤材料(12 )和第二多个开口段(13)。 过滤器段和开口段作为过滤器图案交替排列(15)。 过滤材料由具有包括微米区域中的结构参数的结构元件(14)的材料制成。 滤光器光栅可移动地布置在相位成像装置的狭缝扫描系统中的干涉仪单元的X射线源光栅(54)和分析器光栅(60)之间。 狭缝扫描系统设置有包括多个杆(57)和狭缝(59)的预准直器(55)。 滤光片图案与预准直图案(61)对准。
    • 8. 发明授权
    • X-ray imaging apparatus
    • X射线成像装置
    • US09046466B2
    • 2015-06-02
    • US13641966
    • 2011-05-20
    • Chidane Ouchi
    • Chidane Ouchi
    • G03H5/00G01N23/20G01B9/021G03H1/10G01N23/04G01J9/02A61B6/00G02B5/18G01J9/00G21K1/06G01B11/25
    • G01N23/04A61B6/4291A61B6/484G01B11/2527G01J9/00G01J9/0215G01N2223/1016G01N2223/32G02B5/18G02B5/1814G02B5/1838G02B5/1842G02B5/1871G02B5/189G21K1/06G21K2201/06G21K2207/005
    • Provided is an X-ray imaging apparatus having simple configuration and obtaining differential phase contrast images in two directions crossing each other without rotating the diffraction grating and the masking grating. The apparatus including: a diffraction grating diffracting X-rays; a masking grating masking portions rays and transmitting portions are two-dimensionally arranged to partially mask bright zones of the interference pattern; a moving device changing the relative position between the interference pattern and the masking grating; a detector detecting the intensity distribution of the X-rays transmitted through the masking grating; and a calculator calculating a differential phase contrast image or a phase contrast image of a subject, the calculator being configured to calculate the differential phase contrast image or the phase contrast image in each of two mutually crossing directions on the basis of results of detection performed a plurality of times by the detector.
    • 本发明提供一种具有简单结构的X射线成像设备,并且在不旋转衍射光栅和掩蔽光栅的情况下彼此交叉的两个方向获得差分相位差图像。 该装置包括衍射光栅衍射X射线; 屏蔽光栅遮蔽部分光线和透射部分被二维布置以部分地掩蔽干涉图案的亮区; 移动装置改变干涉图案和掩蔽光栅之间的相对位置; 检测器,其检测透过所述掩蔽光栅的X射线的强度分布; 以及计算器,其计算对象的差分相位差图像或相位对比图像,所述计算器被配置为基于检测结果a计算两个相互交叉方向中的每一个中的差分相位对比图像或相位对比图像 多次由检测器。