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1. 发明申请

US20220026462A1 OPTICAL OUTPUT SYSTEM, MEASUREMENT SYSTEM, OPTICAL PUMP-PROBE SCANNING TUNNELING MICROSCOPE SYSTEM, COMPUTING DEVICE, PROGRAM, AND COMPUTING METHOD 有权
公开(公告)号：US20220026462A1
公开(公告)日：2022-01-27
申请号：US17312844
申请日：2019-11-29
申请人： Gtheranostics Co., Ltd.
发明人： Hidemi SHIGEKAWA , Osamu TAKEUCHI , Zi-han WANG
IPC分类号： G01Q30/02 , G01Q60/10
摘要： An optical output system includes: a first laser that outputs first light which is a pulse laser in response to input of a first signal; a second laser that outputs second light which is a pulse laser in response to input of a second signal; and an arithmetic unit that inputs the first signal and the second signal to the first laser and the second laser, wherein the arithmetic unit repeatedly inputs the first signal and the second signal with switching a variable delay value, which is a difference between a timing to input the first signal to the first laser and a timing to input the second signal to the second laser, in a plurality of ways.

2. 发明授权

US11215636B2 Scanning tunneling thermometer 有权
公开(公告)号：US11215636B2
公开(公告)日：2022-01-04
申请号：US17092722
申请日：2020-11-09
申请人： Arizona Board of Regents on Behalf of the University of Arizona
发明人： Abhay Shankar Chinivaranahalli Shastry , Charles Allen Stafford
IPC分类号： G01Q60/10 , G01K11/00 , G01Q60/58 , G01Q60/14
摘要： Various examples are provided related to scanning tunneling thermometers and scanning tunneling microscopy (STM) techniques. In one example, a method includes simultaneously measuring conductance and thermopower of a nanostructure by toggling between: applying a time modulated voltage to a nanostructure disposed on an interconnect structure, the time modulated voltage applied at a probe tip positioned over the nanostructure, while measuring a resulting current at a contact of the interconnect structure; and applying a time modulated temperature signal to the nanostructure at the probe tip, while measuring current through a calibrated thermoresistor in series with the probe tip. In another example, a device includes an interconnect structure with connections to a first reservoir and a second reservoir; and a scanning tunneling probe in contact with a probe reservoir. Electrical measurements are simultaneously obtained for temperature and voltage applied to a nanostructure between the reservoirs.

3. 发明授权

US11143671B2 Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software 有权
公开(公告)号：US11143671B2
公开(公告)日：2021-10-12
申请号：US17089214
申请日：2020-11-04
申请人： Board of Regents, The University of Texas System
发明人： Seyed Omid Reza Moheimani , Hamed Alemansour
IPC分类号： G01Q10/06 , H01J37/31 , G01Q60/10 , H01J37/28 , G01Q80/00 , H01J37/317 , H01J37/26
摘要： In the system and method disclosed, an ultrahigh vacuum (UHV) scanning tunneling microscope (STM) tip is used to selectively desorb hydrogen atoms from the Si(100)-2X1:H surface by injecting electrons at a negative sample bias voltage. A new lithography method is disclosed that allows the STM to operate under imaging conditions and simultaneously desorb H atoms as required. A high frequency signal is added to the negative sample bias voltage to deliver the required energy for hydrogen removal. The resulted current at this frequency and its harmonics are filtered to minimize their effect on the operation of the STM's feedback loop. This approach offers a significant potential for controlled and precise removal of hydrogen atoms from a hydrogen-terminated silicon surface and thus may be used for the fabrication of practical silicon-based atomic-scale devices.

4. 发明申请

US20210011052A1 SCANNING PROBE MICROSCOPE 有权
公开(公告)号：US20210011052A1
公开(公告)日：2021-01-14
申请号：US16963040
申请日：2019-01-18
申请人： GTHERANOSTICS CO., LTD.
发明人： Hidemi SHIGEKAWA
IPC分类号： G01Q60/10 , G01Q70/08
摘要： A scanning probe microscope includes: a pump light output unit that emits pump light having a first specified phase to a specimen and performs emission of the pump light a plurality of number of times to excite the specimen; a probe light output unit that emits probe light having a second specified phase to the specimen once while the specimen is excited by one-time emission of the pump light; and a scanning probe that detects, from the specimen, a probe signal corresponding to each one-time emission of the probe light, wherein the pump light output unit or the probe light output unit includes a delay time adjustment unit that adjusts delay time from a start of the emission of the pump light until a start of the emission of the probe light.

5. 发明申请

US20200249256A1 INITIATING AND MONITORING THE EVOLUTION OF SINGLE ELECTRONS WITHIN ATOM-DEFINED STRUCTURES 审中-公开
公开(公告)号：US20200249256A1
公开(公告)日：2020-08-06
申请号：US16651480
申请日：2018-09-28
申请人： Quantum Silicon Inc.
发明人： Robert Wolkow , Mohammad Rashidi , Wyatt Vine , Thomas Dienel , Lucian Livadaru , Taleana Huff , Jacob Retallick , Konrad Walus
IPC分类号： G01Q80/00 , G01Q60/10 , G01Q60/24 , G01Q30/10 , G01Q70/14 , G06N3/08 , G06N3/04
摘要： A method for the patterning and control of single electrons on a surface is provided that includes implementing scanning tunneling microscopy hydrogen lithography with a scanning probe microscope to form charge structures with one or more confined charges; performing a series of field-free atomic force microscopy measurements on the charge structures with different tip heights, where interaction between the tip and the confined charge are elucidated; and adjusting tip heights to controllably position charges within the structures to write a given charge state. The present disclose also provides a Gibb's distribution machine formed with the method for the patterning and control of single electrons on a surface. A multi bit true random number generator and neural network learning hardware formed with the above described method are also provided.

6. 发明授权

US09927461B2 Apparatus and algorithm for carrier profiling in scanning frequency comb microscopy 有权
公开(公告)号：US09927461B2
公开(公告)日：2018-03-27
申请号：US15448151
申请日：2017-03-02
申请人： Mark J. Hagmann
发明人： Mark J. Hagmann
IPC分类号： G01Q60/10 , G01Q10/04
CPC分类号： G01Q10/04 , G01Q60/10 , G01Q60/12
摘要： A semiconductor carrier profiling method utilizes a scanning tunneling microscope and shielded probe with an attached spectrum analyzer to measure power loss of a microwave frequency comb generated in a tunneling junction. From this power loss and by utilizing an equivalent circuit or other model, spreading resistance may be determined and carrier density from the spreading resistance. The methodology is non-destructive of the sample and allows scanning across the surface of the sample. By not being destructive, additional analysis methods, like deconvolution, are available for use.

7. 发明申请

US20170199221A1 Method of Carrier Profiling Utilizing Dielectric Relaxation 审中-公开
公开(公告)号：US20170199221A1
公开(公告)日：2017-07-13
申请号：US15369585
申请日：2016-12-05
申请人： Mark J. Hagmann
发明人： Mark J. Hagmann
IPC分类号： G01Q60/10
CPC分类号： G01Q60/12
摘要： A mode-locked laser injects pulses of minority carriers into a semiconductor sample. A microwave frequency comb is then generated by the currents formed in the movement of majority carriers native to the semiconductor and the injected minority carriers. These carriers move to cause dielectric relaxation in the sample, which can be used to determine carrier density within the sample. Measurements require close proximity of transmitter and receiver contacts with the sample and may profile a semi-conductor with a resolution of approximately 0.2 nm.

8. 发明申请

US20150047079A1 Iridium Tip, Gas Field Ion Source, Focused Ion Beam Apparatus, Electron Source, Electron Microscope, Electron Beam Applied Analysis Apparatus, Ion-Electron Multi-Beam Apparatus, Scanning Probe Microscope, and Mask Repair Apparatus 有权
标题翻译：铱尖，气场离子源，聚焦离子束装置，电子源，电子显微镜，电子束应用分析装置，离子电子多波束装置，扫描探针显微镜和掩模修复装置
公开(公告)号：US20150047079A1
公开(公告)日：2015-02-12
申请号：US14455338
申请日：2014-08-08
申请人： Hitachi High-Tech Science Corporation
发明人： Tomokazu Kozakai , Osamu Matsuda , Yasuhiko Sugiyama , Kazuo Aita , Fumio Aramaki , Anto Yasaka , Hiroshi Oba
IPC分类号： H01J1/304 , G01Q60/24 , H01J37/073 , H01J37/08 , H01J37/21 , G01Q60/10 , H01J37/28
CPC分类号： H01J1/3044 , G01Q60/10 , G01Q60/16 , G01Q60/24 , G01Q70/08 , G01Q70/16 , H01J1/3048 , H01J37/073 , H01J37/08 , H01J37/21 , H01J37/28 , H01J37/3002 , H01J2201/30415 , H01J2201/30496 , H01J2237/002 , H01J2237/006
摘要： There is provided an iridium tip including a pyramid structure having one {100} crystal plane as one of a plurality of pyramid surfaces in a sharpened apex portion of a single crystal with orientation. The iridium tip is applied to a gas field ion source or an electron source. The gas field ion source and/or the electron source is applied to a focused ion beam apparatus, an electron microscope, an electron beam applied analysis apparatus, an ion-electron multi-beam apparatus, a scanning probe microscope or a mask repair apparatus.
摘要翻译：提供了一种铱尖端，其包括在具有<210>取向的单晶的锐化顶点部分中具有一个{100}晶面作为多个棱锥表面之一的金字塔结构。将铱尖端施加到气体场离子源或电子源。将气体离子源和/或电子源施加到聚焦离子束装置，电子显微镜，电子束施加分析装置，离子电子多光束装置，扫描探针显微镜或掩模修复装置。

9. 发明申请

US20140184776A1 MICRO OR NANO SCOPE 审中-公开
标题翻译： MICRO或NANO范围
公开(公告)号：US20140184776A1
公开(公告)日：2014-07-03
申请号：US14063492
申请日：2013-10-25
申请人： ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
发明人： Hyeon-Bong PYO
IPC分类号： G02B21/08 , G01Q60/18 , G01Q60/10 , G02B21/36
CPC分类号： G02B21/362 , G01Q60/22 , G02B21/10
摘要： Provided is a micro or nano scope. The micro or nano scope includes a prism, a optical detection system detecting an image from a sample on the prism, and a light guiding system providing incident light to the prism, the light guiding system changing an incident angle of the incident light incident into the prism.
摘要翻译：提供了一个微或纳米的范围。微型或纳米镜包括棱镜，检测来自棱镜上的样品的图像的光学检测系统以及向棱镜提供入射光的导光系统，该光导系统改变入射到该棱镜的入射光的入射角棱镜

10. 发明申请

US20120244038A1 Scanning Tunneling Microscope Assembly, Reactor, and System 有权
标题翻译：扫描隧道显微镜组件，反应器和系统
公开(公告)号：US20120244038A1
公开(公告)日：2012-09-27
申请号：US13388223
申请日：2010-06-22
申请人： Feng Tao , Miquel Salmeron , Gabor A. Somorjai
发明人： Feng Tao , Miquel Salmeron , Gabor A. Somorjai
IPC分类号： G01N21/00 , G01Q60/10
CPC分类号： G01Q60/16 , B82Y35/00 , G01Q30/12 , G01Q30/16 , Y10S977/86 , Y10S977/861 , Y10S977/869 , Y10S977/871
摘要： An embodiment of a scanning tunneling microscope (STM) reactor includes a pressure vessel, an STM assembly, and three spring coupling objects. The pressure vessel includes a sealable port, an interior, and an exterior. An embodiment of an STM system includes a vacuum chamber, an STM reactor, and three springs. The three springs couple the STM reactor to the vacuum chamber and are operable to suspend the scanning tunneling microscope reactor within the interior of the vacuum chamber during operation of the STM reactor. An embodiment of an STM assembly includes a coarse displacement arrangement, a piezoelectric fine displacement scanning tube coupled to the coarse displacement arrangement, and a receiver. The piezoelectric fine displacement scanning tube is coupled to the coarse displacement arrangement. The receiver is coupled to the piezoelectric scanning tube and is operable to receive a tip holder, and the tip holder is operable to receive a tip.
摘要翻译：扫描隧道显微镜（STM）反应器的一个实施例包括压力容器，STM组件和三个弹簧耦合物体。压力容器包括可密封的端口，内部和外部。 STM系统的实施例包括真空室，STM反应器和三个弹簧。三个弹簧将STM反应器耦合到真空室，并且可操作以在STM反应器的操作期间将扫描隧道显微镜反应器悬挂在真空室内部。 STM组件的实施例包括粗排列布置，耦合到粗位移布置的压电精细位移扫描管和接收器。压电精细位移扫描管耦合到粗排位置。接收器耦合到压电扫描管并且可操作以接收尖端保持器，并且尖端保持器可操作以接收尖端。

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