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    • 5. 发明授权
    • Method for reducing interference and crosstalk in double optical tweezers using a single laser source, and apparatus using the same
    • 使用单个激光源减少双光镊子中的干扰和串扰的方法,以及使用其的装置
    • US09035235B2
    • 2015-05-19
    • US13055130
    • 2009-07-22
    • Ulrich BockelmannPierre Mangeol
    • Ulrich BockelmannPierre Mangeol
    • H01S1/00G21K1/00
    • G21K1/006
    • Experimental studies of single molecule mechanics require high force sensitivity and low drift, which can be achieved with optical tweezers through an optical tweezers apparatus for force measurements. A CW infrared laser beam is split by polarization and focused by a high numerical aperture objective to create two traps. The same laser is used to form both traps and to measure the force by back focal plane interferometry. Although the two beams entering the microscope are designed to exhibit orthogonal polarization, interference and a significant parasitic force signal occur. Comparing the experimental results with a ray optics model, the interference patterns are caused by the rotation of polarization on microscope lens surfaces and slides. Two methods for reducing the crosstalk are directed to polarization rectification by passing through the microscope twice and frequency shifting of one of the split laser beams.
    • 单分子力学的实验研究需要高的力灵敏度和低漂移,这可以通过光学镊子通过用于力测量的光学镊子装置来实现。 CW红外激光束被极化分割,并被高数值孔径物镜聚焦,以产生两个陷阱。 相同的激光器用于形成两个陷阱并通过后焦平面干涉测量来测量力。 虽然进入显微镜的两个光束被设计成表现出正交的极化,但是发生干涉和显着的寄生力信号。 将实验结果与射线光学模型进行比较,干涉图案是由显微镜镜片和幻灯片上的极化旋转引起的。 用于减少串扰的两种方法通过穿过显微镜两次并分离激光束之一的频移来引导偏振整流。
    • 9. 发明授权
    • Quantum computing method and quantum computer
    • 量子计算方法和量子计算机
    • US08223414B2
    • 2012-07-17
    • US13239818
    • 2011-09-22
    • Hayato GotoKouichi Ichimura
    • Hayato GotoKouichi Ichimura
    • G06E3/00G06E1/06H01S1/00
    • B82Y10/00G06N99/002Y10S977/933
    • A quantum bit computation method includes operating a two-quantum-bit gate on quantum bits of a first physical system and a second physical system, second energy states of second physical systems except for the first physical system and the second physical system do not change, three energy states being represented by |0>, |1> and |3>, the two energy states being represented by |2> and |4>, energies of |2> and |4> being higher than energies of |0>, |1> and |3>, a transition frequency between |3> and |2> being equal to the resonance frequency, |0> and |1> representing quantum bits, flipping quantum bits of first physical systems after operating the two-quantum-bit gate, executing no operations by a time equal to a time for operating the two-quantum-bit gate, after flipping the quantum bits, and again flipping the quantum bits of the first physical systems after executing no operations.
    • 量子比特计算方法包括在第一物理系统和第二物理系统的量子比特上操作双量子比特门,除第一物理系统和第二物理系统之外的第二物理系统的第二能量状态不改变, 三个能量状态由| 0>,| 1>和| 3>表示,两个能态由| 2>和| 4>表示,| 2>和| 4>的能量高于| 0> | 1>和| 3>,| 3>和| 2>之间的转换频率等于表示量子比特的谐振频率| 0>和| 1>,在操作两维之后翻转第一物理系统的量子比特, 量子比特门,在翻转量子比特之后不执行等于操作双量子比特门的时间的时间,并且在不执行任何操作之后再次翻转第一物理系统的量子比特。
    • 10. 发明申请
    • Method and Apparatus for Measuring the Optical Forces Acting on a Particle
    • 用于测量作用在颗粒上的光力的方法和装置
    • US20120068059A1
    • 2012-03-22
    • US13320503
    • 2010-05-14
    • Mario Montes UsateguiAmau Farré Flaquer
    • Mario Montes UsateguiAmau Farré Flaquer
    • H01S1/00G02B21/32
    • G02B21/32
    • An apparatus and method for measuring optical forces acting on a trapped particle. In one implementation the apparatus and method are adaptable for use in the optical train of an optical microscope that is configured to trap, with a single light beam, a particle suspended in a suspension medium between an entry cover and an exit cover of a chamber positioned on or within the microscope. The apparatus and method involves the use of a single collection lens system having a numerical aperture designed to be greater than or equal to an index of refraction index of the suspension medium intended to suspend the particle in the chamber which is placeable at or near the exit cover of the chamber of the microscope. A light sensing device is positioned at or near the back focal plane of the collection lens, or at an optical equivalent thereof, which is capable of directly or indirectly producing optical force measurements acting on the particle derived by the x and y coordinates of the centroid of the light distribution imaged onto the light sensing device by the collection lens.
    • 用于测量作用在被捕获的颗粒上的光学力的装置和方法。 在一个实施方案中,该装置和方法适用于光学显微镜的光学系列,该光学显微镜的光学系列被构造成用单个光束将悬浮在悬浮介质中的颗粒捕获在位于所述腔室的入口盖和出口盖之间 在显微镜下或内。 该装置和方法涉及使用具有数值孔径的单个收集透镜系统,该数字孔径被设计为大于或等于用于将颗粒悬浮在室中的悬浮介质的折射率指数,该室可放置在出口处或附近 显微镜室的盖子。 光感测装置位于收集透镜的后焦平面或其光学等效物处或附近,其能够直接或间接产生作用在由质心的x和y坐标导出的颗粒上的光学力测量 通过收集透镜成像到光感测装置上的光分布。