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    • 1. 发明授权
    • Hybrid method of patterning MTJ stack
    • 组合MTJ堆叠的混合方法
    • US09006849B2
    • 2015-04-14
    • US14226814
    • 2014-03-26
    • Yimin Guo
    • Yimin Guo
    • H01L43/12H01L43/02H01L29/82H01L21/00H01L21/8246H01L21/02H01L43/08
    • H01L43/12H01L43/02H01L43/08
    • This invention comprises a method to make small MTJ element using hybrid etching and oxygen plasma immersion ion implantation. The method has no removal of the magnetic free layer (or memory layer) and hence prevents any possible physical damage near the free layer edges. After photolithography patterning, alternative Ta, Ru, Ta etchings are performed before it stops on an MgO intermediate layer above the free layer. Then an oxygen plasma immersion ion implantation is performed to completely oxidize the exposed portion of the free layer, leaving the hard mask covered portion unchanged which define the lateral width of the MTJ element.
    • 本发明包括使用混合蚀刻和氧等离子体浸没离子注入制造小型MTJ元件的方法。 该方法没有去除无磁层(或记忆层),因此防止在自由层边缘附近的任何可能的物理损伤。 在光刻图案化之后,在自由层上方的MgO中间层停止之前进行替代的Ta,Ru,Ta蚀刻。 然后执行氧等离子体浸没离子注入以完全氧化自由层的暴露部分,使硬掩模覆盖部分不变,这限定了MTJ元件的横向宽度。
    • 4. 发明申请
    • MEMORY CELLS, SEMICONDUCTOR DEVICE STRUCTURES, MEMORY SYSTEMS, AND METHODS OF FABRICATION
    • 存储器单元,半导体器件结构,存储器系统和制造方法
    • US20130334630A1
    • 2013-12-19
    • US13527173
    • 2012-06-19
    • Witold KulaGurtej S. SandhuStephen J. Kramer
    • Witold KulaGurtej S. SandhuStephen J. Kramer
    • H01L29/82H01L21/8246
    • H01L43/08G11C11/161H01L27/228H01L43/02H01L43/12
    • Methods of forming magnetic memory cells are disclosed. Magnetic and non-magnetic materials are formed into a primal precursor structure in an initial stress state of essentially no strain, compressive strain, or tensile strain. A stress-compensating material, e.g., a non-sacrificial, conductive material, is formed to be disposed on the primal precursor structure to form a stress-compensated precursor structure in a net beneficial stress state. Thereafter, the stress-compensated precursor structure may be patterned to form a cell core of a memory cell. The net beneficial stress state of the stress-compensated precursor structure lends to formation of one or more magnetic regions, in the cell core, exhibiting a vertical magnetic orientation without deteriorating a magnetic strength of the one or more magnetic regions. Also disclosed are memory cells, memory cell structures, semiconductor device structures, and spin torque transfer magnetic random access memory (STT-MRAM) systems.
    • 公开了形成磁存储器单元的方法。 磁性和非磁性材料在基本上没有应变,压缩应变或拉伸应变的初始应力状态下形成原始前体结构。 形成应力补偿材料,例如非牺牲导电材料,以设置在原始前体结构上以在净有益应力状态下形成应力补偿前体结构。 此后,应力补偿前体结构可以被图案化以形成存储单元的单元芯。 应力补偿前体结构的净有益应力状态有助于在电池芯中形成一个或多个磁性区域,呈现垂直磁性取向而不会使一个或多个磁性区域的磁强度恶化。 还公开了存储器单元,存储单元结构,半导体器件结构和自旋转矩传递磁随机存取存储器(STT-MRAM)系统。
    • 6. 发明申请
    • MAGNETORESISTIVE RANDOM ACCESS MEMORY DEVICE AND METHOD OF MAKING SAME
    • 磁性随机访问存储器件及其制造方法
    • US20130277778A1
    • 2013-10-24
    • US13452230
    • 2012-04-20
    • Chern-Yow HSUShih-Chang LIUChia-Shiung TSAI
    • Chern-Yow HSUShih-Chang LIUChia-Shiung TSAI
    • H01L29/82H01L21/8246
    • This description relates to a method for fabricating a magnetoresistive random access memory (MRAM) device having a plurality of magnetic tunnel junction (MTJ) units. The method includes forming a bottom conductive layer, forming an anti-ferromagnetic layer and forming a tunnel layer over the bottom conductive layer and the anti-ferromagnetic layer. The method further includes forming a free magnetic layer, having a magnetic moment aligned in a direction that is adjustable by applying an electromagnetic field, over the tunnel layer and forming a top conductive layer over the free magnetic layer. The method further includes performing at least one lithographic process to remove portions of the bottom conductive layer, the anti-ferromagnetic layer, the tunnel layer, the free magnetic layer and the top conductive layer that is uncovered by the photoresist layer until the bottom conductive layer is exposed and removing portions of at least one sidewall of the MTJ unit.
    • 该描述涉及一种用于制造具有多个磁性隧道结(MTJ)单元的磁阻随机存取存储器(MRAM)装置的方法。 该方法包括形成底部导电层,形成反铁磁层并在底部导电层和反铁磁层上形成隧道层。 该方法还包括形成自由磁性层,该磁性层在通过施加电磁场的可调整方向上对准磁矩,并在隧道层上形成顶部导电层,并在自由磁性层上形成顶部导电层。 该方法还包括执行至少一个光刻工艺以去除由光致抗蚀剂层未覆盖的底部导电层,反铁磁层,隧道层,自由磁性层和顶部导电层的部分,直到底部导电层 暴露并去除MTJ单元的至少一个侧壁的部分。
    • 8. 发明授权
    • Non-volatile memory cell and logic transistor integration
    • 非易失性存储单元和逻辑晶体管集成
    • US08536007B2
    • 2013-09-17
    • US13402426
    • 2012-02-22
    • Mark D. HallMehul D. Shroff
    • Mark D. HallMehul D. Shroff
    • H01L21/8246
    • H01L29/66833H01L21/28282H01L27/1157H01L27/11573H01L29/42348
    • A first conductive layer and an underlying charge storage layer are patterned to form a control gate in an NVM region. A first dielectric layer is formed over the control gate. A sacrificial layer is formed over the first dielectric layer and planarized. A patterned masking layer is formed over the sacrificial layer which includes a first portion which defines a select gate location laterally adjacent the control gate in the NVM region and a second portion which defines a logic gate in a logic region. Exposed portions of the sacrificial layer are removed such that a first portion remains at the select gate location. A second dielectric layer is formed over the first portion and planarized to expose the first portion. The first portion is removed to result in an opening at the select gate location. A gate dielectric layer and a select gate are formed in the opening.
    • 图案化第一导电层和底层电荷存储层,以在NVM区域中形成控制栅极。 第一介电层形成在控制栅上。 牺牲层形成在第一电介质层上并且被平坦化。 在牺牲层上形成图案化掩模层,该牺牲层包括限定在NVM区域中与控制栅极横向相邻的选择栅极位置的第一部分和在逻辑区域中限定逻辑门的第二部分。 去除牺牲层的暴露部分,使得第一部分保持在选择栅极位置。 在第一部分上形成第二电介质层并将其平坦化以暴露第一部分。 第一部分被去除以导致选择门位置处的打开。 在开口中形成栅介质层和选择栅极。
    • 10. 发明申请
    • MAGNETIC MEMORY
    • 磁记忆
    • US20130075846A1
    • 2013-03-28
    • US13609230
    • 2012-09-10
    • Katsumi SUEMITSUEiji Kariyada
    • Katsumi SUEMITSUEiji Kariyada
    • H01L29/82H01L21/8246
    • H01L43/12G11C11/161G11C11/1655G11C11/1659G11C11/1673G11C11/1675H01L27/226H01L43/08
    • A memory includes an underlying layer of a ferromagnetic body, a first nonmagnetic layer on the underlying layer, a data memorizing layer laid on the first nonmagnetic layer and made of a ferromagnetic body having perpendicular magnetic anisotropy, a reference layer coupled through a second nonmagnetic layer with the data memorizing layer, and first and second magnetization fixed layers laid underneath the underlying layer to come into contact with the underlying layer. The data memorizing layer includes a magnetization liberalized region having reversible magnetization, and overlapping with the reference layer, a first magnetization fixed region coupled with an end of the magnetization liberalized region, and having a magnetization direction fixed to +z direction by the first magnetization fixed layer, and a second magnetization fixed region coupled with a different end of the magnetization liberalized region, and having a magnetization direction fixed to −z direction by the second magnetization fixed layer.
    • 存储器包括铁磁体的下层,下层上的第一非磁性层,位于第一非磁性层上并由具有垂直磁各向异性的铁磁体构成的数据存储层,通过第二非磁性层耦合的参考层 数据存储层,第一和第二磁化固定层铺设在下层之下,与下层相接触。 数据存储层包括具有可逆磁化并与参考层重叠的磁化自由化区域,与磁化自由化区域的端部耦合的第一磁化固定区域,并且具有通过第一磁化固定的磁化方向固定到+ z方向 以及与磁化自由化区域的不同端部耦合的第二磁化固定区域,并且具有由第二磁化固定层固定在-z方向的磁化方向。