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    • 3. 发明申请
    • METASTABILITY GLITCH DETECTION
    • 耐腐蚀性检测
    • US20150214933A1
    • 2015-07-30
    • US14473922
    • 2014-08-29
    • Mentor Graphics Corporation
    • Rajeev SehgalSrinivas MandavilliPradish MathewsAjit SinghHenry Potts
    • H03K3/286H03K19/0175H03K19/096
    • H03K19/017509G01R19/16504G06F11/14H03K3/013H03K3/0375H03K3/2865H03K19/096
    • This application discloses a system to detect meta-stable glitches in a signal, such as an output of latch or other storage element. The system can include a sampling circuit configured to sample an output of a storage element. The system can include a mono-shot circuit configured to monitor the output of the storage element and generate a pulse when the monitored output of the storage element differs from the sampled output. The system can include a drive circuit configured to generate a glitch signal based, at least in part, on the sampled output, and to output the glitch signal in response to the pulse from the mono-shot circuit. The system can include an error detection circuit configured to receive the sampled output from the sampling circuit and the glitch signal from the drive circuit, and to generate an error signal when the sampled output differs from the glitch signal.
    • 本申请公开了一种用于检测诸如锁存器或其他存储元件的输出的信号中的元稳定毛刺的系统。 该系统可以包括被配置为对存储元件的输出进行采样的采样电路。 该系统可以包括被配置为监视存储元件的输出并且当监视的存储元件的输出与采样输出不同时产生脉冲的单触发电路。 该系统可以包括驱动电路,其被配置为至少部分地基于采样输出产生毛刺信号,并且响应于来自单声道电路的脉冲输出毛刺信号。 该系统可以包括错误检测电路,其被配置为从采样电路接收采样的输出和来自驱动电路的毛刺信号,并且当采样输出与毛刺信号不同时产生误差信号。
    • 6. 发明授权
    • Dynamic logic return-to-zero latching mechanism
    • 动态逻辑归零锁定机制
    • US07173456B2
    • 2007-02-06
    • US10730168
    • 2003-12-06
    • James R. Lundberg
    • James R. Lundberg
    • H03K19/096H03K3/286
    • H03K19/0963
    • A dynamic logic return-to-zero (RTZ) latching mechanism including a complementary pair of evaluation devices responsive to a clock signal, a dynamic evaluator, delayed inversion logic, and latching logic. The dynamic evaluator is coupled between the complementary pair of evaluation devices at a pre-charged node and evaluates a logic function based on at least one input data signal. The latching logic asserts the logic state of an output node based on the state of the pre-charged node during an evaluation period between an operative edge of the clock signal and the next edge of an evaluation complete signal, which is a delayed and inverted version of the clock signal. The output node is returned to zero between evaluation periods. A footless latching domino circuit may be added to convert the RTZ output to a registered output signal.
    • 动态逻辑归零(RTZ)锁存机制包括响应于时钟信号的一对互补的评估装置,动态评估器,延迟反转逻辑和锁存逻辑。 动态评估器在预充电节点处耦合在互补的评估装置对之间,并基于至少一个输入数据信号来评估逻辑功能。 锁定逻辑在时钟信号的操作边缘与评估完成信号的下一个边缘之间的评估周期期间基于预充电节点的状态来断言输出节点的逻辑状态,该评估完成信号是延迟和反向版本 的时钟信号。 输出节点在评估周期之间返回到零。 可以添加一个无脚锁定多米诺骨牌电路,以将RTZ输出转换为已注册的输出信号。
    • 8. 发明授权
    • One gate delay output noise insensitive latch
    • 一个门延迟输出噪声不敏感锁存
    • US07164302B1
    • 2007-01-16
    • US10874041
    • 2004-06-21
    • Ilyas Elkin
    • Ilyas Elkin
    • H03K3/356H03K3/286
    • H03K3/012H03K3/013H03K3/0375H03K3/356121
    • A one gate delay output noise insensitive latch includes an input node, an output node, a storage node, a not storage node, and a data clock line. A primary latch element is connected to the input node, the output node, and the data clock line. A mirror primary latch element is connected to the input node in parallel with the primary latch element, to the storage node, and to the data clock line. A weak keeper is connected to the storage node and to the not storage node. A strong enabled tri-state keeper is connected to the not storage node, to the data clock line, and to the output node. The input node is either a dynamic data input node or a static data input node. Optionally, the weak keeper is also clock enabled.
    • 一个门延迟输出噪声不敏感锁存器包括输入节点,输出节点,存储节点,非存储节点和数据时钟线。 主锁存元件连接到输入节点,输出节点和数据时钟线。 镜主主锁存元件与主闩锁元件并联连接到输入节点,连接到存储节点和数据时钟线。 弱守护者连接到存储节点和非存储节点。 强有力的三态保持器连接到非存储节点,数据时钟线和输出节点。 输入节点是动态数据输入节点或静态数据输入节点。 可选地,弱守门员也启用时钟。
    • 9. 发明申请
    • Pulse generator
    • 脉冲发生器
    • US20050237098A1
    • 2005-10-27
    • US10878142
    • 2004-06-28
    • Nak Park
    • Nak Park
    • G11C7/00H03K3/033H03K3/286H03K3/355
    • H03K3/033H03K3/355
    • The disclosure is directed to an internal pulse generator outputting a signal with a constant pulse width nevertheless of a frequency of an input signal, including a first PMOS transistor, a PMOS second transistor and an NMOS transistor which are connected between a power supply voltage and a ground voltage in series, a latch and an inverter which are connected between an output terminal and a first node as a drain of the NMOS transistor, and a Y-time delay circuit connected between the output terminal and a second node that is a common gate of the PMOS and NMOS transistors.
    • 本公开涉及内部脉冲发生器,其输出具有恒定脉冲宽度的信号,该信号具有输入信号的频率,包括第一PMOS晶体管,PMOS第二晶体管和NMOS晶体管,其连接在电源电压和 连接在输出端子和第一节点之间的串联接地电压,锁存器和反相器,作为NMOS晶体管的漏极,以及连接在输出端子和作为公共栅极的第二节点之间的Y延迟电路 的PMOS和NMOS晶体管。