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    • 6. 发明申请
    • Catalytic Atomic Layer Deposition Of Films Comprising SiOC
    • 包含SiOC的膜的催化原子层沉积
    • US20160002782A1
    • 2016-01-07
    • US14769722
    • 2014-02-20
    • David ThompsonJeffrey W. ANTHIS
    • David ThompsonJeffrey W. Anthis
    • C23C16/455C23C16/30
    • C23C16/45534C23C16/30H01L21/02126H01L21/02211H01L21/02277H01L21/0228
    • Provided are methods of for deposition of SiOC. Certain methods involve exposing a substrate surface to a first and second precursor in the presence of a catalyst comprising a neutral two electron donor base. The first precursor has formula (XyH3-ySi)zCH4-z, or (XyH3-ySi)(CH2)n(SiXyH3-y), wherein X is a halogen, y has a value of between 1 and 3, and z has a value of between 1 and 3, and n has a value between 2 and 5. The second precursor comprises water or a compound containing carbon and at least two hydroxyl groups. Certain other methods relate to exposing a substrate surface to a first and second precursor in the presence of a catalyst comprising a neutral two electron donor base, the first precursor comprising SiX4 or X3Si—SiX3, wherein X is a halide, and the second precursor comprising carbon and at least two hydroxyl groups.
    • 提供了沉积SiOC的方法。 某些方法包括在包含中性二电子给体碱的催化剂存在下将基材表面暴露于第一和第二前体。 第一前体具有式(XyH3-ySi)zCH4-z或(XyH3-ySi)(CH2)n(SiXyH3-y),其中X是卤素,y具有1和3之间的值,z具有 值在1和3之间,n具有2和5之间的值。第二前体包含水或含有碳和至少两个羟基的化合物。 某些其它方法涉及在包含中性二电子给体碱的催化剂存在下将基材表面暴露于第一和第二前体,第一前体包含SiX4或X3Si-SiX3,其中X是卤化物,第二前体包含 碳和至少两个羟基。
    • 10. 发明申请
    • Film Deposition Using Tantalum Precursors
    • 使用钽前体膜沉积
    • US20130157475A1
    • 2013-06-20
    • US13713578
    • 2012-12-13
    • David ThompsonJeffrey W. Anthis
    • David ThompsonJeffrey W. Anthis
    • H01L21/02
    • H01L21/02271C23C16/45531C23C16/45536C23C16/45553C23C16/507C23C16/511H01L21/32051
    • Provided are methods of depositing tantalum-containing films via atomic layer deposition and/or chemical vapor deposition. The method comprises exposing a substrate surface to flows of a first precursor comprising TaClxR5-x, TaBrxR5-x or TaIxR5-x, wherein R is a non-halide ligand, and a second precursor comprising an aluminum-containing compound, wherein x has a value in the range of 1 to 4. The R group may be C1-C5 alkyl, and specifically methyl. The resulting films comprise tantalum, aluminum and/or carbon. Certain other methods relate to reacting Ta2Cl10 with a coordinating ligand to provide TaCl5 coordinated to the ligand. A substrate surface may be exposed to flows of a first precursor and second precursor, the first precursor comprising the TaCl5 coordinated to a ligand, the second precursor comprising an aluminum-containing compound.
    • 提供了通过原子层沉积和/或化学气相沉积沉积含钽膜的方法。 该方法包括将衬底表面暴露于包含TaClxR5-x,TaBrxR5-x或TaIxR5-x的第一前体的流动,其中R是非卤化物配体,以及包含含铝化合物的第二前体,其中x具有 值为1〜4的范围.R基可以是C1-C5烷基,特别是甲基。 所得薄膜包括钽,铝和/或碳。 某些其他方法涉及使Ta2Cl10与配位配体反应以提供与配体配位的TaCl 5。 衬底表面可以暴露于第一前体和第二前体的流动,第一前体包含与配体配位的TaCl 5,第二前体包含含铝化合物。